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    • 81. 发明授权
    • Rear-face illuminated solid state image sensors
    • 背面照明固态图像传感器
    • US08624342B2
    • 2014-01-07
    • US12940326
    • 2010-11-05
    • Giles HumpstonMoshe Kriman
    • Giles HumpstonMoshe Kriman
    • H01L31/02
    • H01L27/14636H01L21/76898H01L27/14618H01L27/14632H01L27/14638H01L27/1464H01L27/14687H01L27/14806H01L2224/13024
    • A microelectronic unit includes a semiconductor element having a front surface to which a packaging layer is attached, and a rear surface remote from the front surface. The element includes a light detector including a plurality of light detector element arranged in an array disposed adjacent to the front surface and arranged to receive light through the rear surface. The semiconductor element also includes an electrically conductive contact at the front surface connected to the light detector. The conductive contact includes a thin region and a thicker region which is thicker than the thin region. A conductive interconnect extends through the packaging layer to the thin region of the conductive contact, and a portion of the conductive interconnect is exposed at a surface of the microelectronic unit.
    • 微电子单元包括具有附接有包装层的前表面和远离前表面的后表面的半导体元件。 元件包括光检测器,其包括布置成邻近前表面设置的阵列的多个光检测器元件,并布置成通过后表面接收光。 半导体元件还包括在连接到光检测器的前表面处的导电接触。 导电接触包括薄区域和比薄区域更厚的较厚区域。 导电互连件穿过包装层延伸到导电接触件的薄区域,并且导电互连件的一部分在微电子单元的表面处露出。
    • 85. 发明申请
    • Wafer-Scale Emitter Package Including Thermal Vias
    • 包括散热片的晶圆发射器封装
    • US20120199857A1
    • 2012-08-09
    • US13500889
    • 2010-10-07
    • Giles HumpstonMoshe KrimanMarc Himel
    • Giles HumpstonMoshe KrimanMarc Himel
    • H01L27/15H01L33/64
    • H01L33/642H01L33/486H01L2924/0002H01L2924/00
    • Improved packages for light emitters may be fabricated at the wafer level. The package can be a single device or an array of die. The package includes a thermal via that extends through the thickness of the package substrate. The thermal via may be made of a material possessing a high thermal conductivity. The thermal via may be wider at the package exterior than at the interior to provide heat spreading between the device and its heat sink. The taper angle of the thermal via may be around 45 degrees to match the natural spread of heat in a solid. The thermal via may extend above the package interior, so its height is sufficient to position an emitter placed thereon at one foci of a parabola, where the vertex of the parabola is at the surface of the package substrate from which the thermal via extends.
    • 可以在晶片级制造用于发光体的改进的封装。 该封装可以是单个器件或一个管芯阵列。 该封装包括延伸穿过封装衬底的厚度的热通孔。 热通孔可以由具有高导热性的材料制成。 热通孔在封装外部比在内部可以更宽,以在器件和其散热器之间提供散热。 热通孔的锥角可以是大约45度,以匹配固体中的热量的自然扩散。 热通孔可以在封装内部延伸,因此其高度足以将放置在其上的发射器放置在抛物线的一个焦点处,其中抛物线的顶点位于热通孔延伸的封装衬底的表面处。