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71. 发明授权

US06822438B2 Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzer 失效
标题翻译：使用网络分析仪测量电气元件上的I / O引脚的寄生电容和电感的装置
公开(公告)号：US06822438B2
公开(公告)日：2004-11-23
申请号：US10366918
申请日：2003-02-13
申请人： Mark T. Van Horn , Richard N. Hedden , David R. Cuthbert , Aaron M. Schoenfeld
发明人： Mark T. Van Horn , Richard N. Hedden , David R. Cuthbert , Aaron M. Schoenfeld
IPC分类号： G01R3102
CPC分类号： G01R31/04 , G01R1/0408 , G01R1/06772 , G01R27/2617 , G01R31/2896 , H01L24/73 , H01L2224/32013 , H01L2224/32225 , H01L2224/32245 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/48253 , H01L2224/4847 , H01L2224/73265 , H01L2924/01087 , H01L2924/14 , H01L2924/15311 , H01L2924/181 , H01L2924/30107 , H01L2924/3011 , H01L2924/00012 , H01L2924/00 , H01L2924/00014
摘要： Apparatus and methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance and inductance of one or more I/O leads of an integrated circuit package, the measured parasitic capacitances and inductances providing an indication of the susceptibility of the integrated circuit package to mutual coupling between electrical leads of the package or between an electrical lead and other components of the integrated circuit package.
摘要翻译：提供了装置和方法，用于使用网络分析仪结合同轴测试探针来测量任何类型或配置的集成电路封装中的互耦合的可能性。简单，低成本的测试夹具和测试方法可用于测量集成电路封装的一个或多个I / O引线的寄生电容和电感，所测量的寄生电容和电感提供了集成电路的易感性指示电路封装以在封装的电引线之间或电引线和集成电路封装的其它部件之间相互耦合。

72. 发明授权

US06680617B2 Apertured probes for localized measurements of a material's complex permittivity and fabrication method 失效
标题翻译：用于材料的复介电常数和制造方法的局部测量的孔径探针
公开(公告)号：US06680617B2
公开(公告)日：2004-01-20
申请号：US10266611
申请日：2002-10-09
申请人： Robert L. Moreland , Hans M. Christen , Vladimir V. Talanov , Andrew R. Schwartz
发明人： Robert L. Moreland , Hans M. Christen , Vladimir V. Talanov , Andrew R. Schwartz
IPC分类号： G01R2704
CPC分类号： G01Q60/22 , G01R27/2617 , Y10T29/49002 , Y10T29/49007 , Y10T29/49117
摘要： A probe for non-destructive determination of complex permittivity of a material and for near field optical microscopy is based on a balanced multi-conductor transmission line structure created on a dielectric substrate member which confines the probing field within a sharply defined sampling volume in the material under study.
摘要翻译：用于非破坏性测定材料和近场光学显微镜的复介电常数的探针基于在电介质基底构件上产生的平衡的多导体传输线结构，其将探测场限制在材料中明确定义的采样体积内正在研究中

73. 发明申请

US20030128042A1 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer 失效
标题翻译：使用网络分析仪测量电气元件上的I / O引脚的寄生电容和电感的装置
公开(公告)号：US20030128042A1
公开(公告)日：2003-07-10
申请号：US10366918
申请日：2003-02-13
发明人： Mark T. Van Horn , Richard N. Hedden , David R. Cuthbert , Aaron M. Schoenfeld
IPC分类号： G01R031/02
CPC分类号： G01R31/04 , G01R1/0408 , G01R1/06772 , G01R27/2617 , G01R31/2896 , H01L24/73 , H01L2224/32013 , H01L2224/32225 , H01L2224/32245 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/48253 , H01L2224/4847 , H01L2224/73265 , H01L2924/01087 , H01L2924/14 , H01L2924/15311 , H01L2924/181 , H01L2924/30107 , H01L2924/3011 , H01L2924/00012 , H01L2924/00 , H01L2924/00014
摘要： Apparatus and methods for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance and inductance of one or more I/O leads of an integrated circuit package, the measured parasitic capacitances and inductances providing an indication of the susceptibility of the integrated circuit package to mutual coupling between electrical leads of the package or between an electrical lead and other components of the integrated circuit package.
摘要翻译：使用网络分析仪结合同轴测试探针测量任何类型或配置的集成电路封装中的互耦合电位的装置和方法。简单，低成本的测试夹具和测试方法可用于测量集成电路封装的一个或多个I / O引线的寄生电容和电感，所测量的寄生电容和电感提供了集成电路的易感性指示电路封装以在封装的电引线之间或电引线和集成电路封装的其它部件之间相互耦合。

74. 发明授权

US06496018B1 Method and device for measuring dielectric constant 失效
标题翻译：测量介电常数的方法和装置
公开(公告)号：US06496018B1
公开(公告)日：2002-12-17
申请号：US09787410
申请日：2001-06-07
申请人： Shinichi Nagata , Seiichi Miyamoto , Fumiaki Okada
发明人： Shinichi Nagata , Seiichi Miyamoto , Fumiaki Okada
IPC分类号： G01R2704
CPC分类号： G01N22/00 , G01R27/2617
摘要： The sample measuring face of a dielectric resonator (20) is placed near a standard sample having a known dielectric constant at a fixed interval D. While appropriately varying the dielectric constant and thickness of the standard sample under the above condition, the variation of the resonance frequency of the dielectric resonator (20) is measured for each varied dielectric constant and thickness to draw a calibration curve of the varied resonance frequency depending on the dielectric constant and thickness. Under the same condition where calibration curve is drawn, the variation of the resonance frequency of the dielectric resonator (20) for a sample having a known thickness is measured. The dielectric constant of the sample is found from the measurement value and the calibration curve. The dielectric constant of not only a sheetlike sample but also a three-dimensional molded article or a liquid sample can be measured easily.
摘要翻译：将介质谐振器（20）的样品测量面放置在具有固定间隔D的已知介电常数的标准样品附近。在上述条件下适当地改变标准样品的介电常数和厚度，共振的变化测量各介电常数和厚度的介质谐振器（20）的频率，以根据介电常数和厚度绘制变化的谐振频率的校准曲线。在与标准曲线相同的条件下，测量具有已知厚度的样品的介质谐振器（20）的谐振频率的变化。从测量值和校准曲线可以看到样品的介电常数。可以容易地测量不仅片状样品，而且可以测量三维模制品或液体样品的介电常数。

75. 发明申请

US20020093344A1 Precise dielectric constant sensor 有权
标题翻译：精密介电常数传感器
公开(公告)号：US20020093344A1
公开(公告)日：2002-07-18
申请号：US09759865
申请日：2001-01-12
申请人： Kavlico Corporation
发明人： Kyong M. Park , Nhan Nguyen
IPC分类号： G01R027/26
CPC分类号： G01R27/2617
摘要： An assembly for sensing the dielectric constant of liquids, and for detecting contamination, includes a central ceramic chip with a sensing capacitor formed on one end thereof and a signal processing circuit on the other end thereof. The capacitor is formed of two sets of closely spaced conductive lines or pathways with one set being grounded and the other set providing the variable output from the capacitor to the signal processing circuit.
摘要翻译：用于感测液体的介电常数和检测污染的组件包括在其一端形成有感测电容器的中心陶瓷芯片和在其另一端的信号处理电路。电容器由两组紧密隔开的导线或路径形成，其中一组接地，另一组提供从电容器到信号处理电路的可变输出。

76. 发明授权

US12025642B2 Dielectric constant measurement method, dielectric measurement device and dielectric measurement program 有权
公开(公告)号：US12025642B2
公开(公告)日：2024-07-02
申请号：US17786867
申请日：2019-12-20
申请人： Nippon Telegraph and Telephone Corporation
发明人： Teruo Jo , Hiroshi Hamada , Hideyuki Nosaka
IPC分类号： G01V3/10 , G01N21/3581 , G01R27/26
CPC分类号： G01R27/2617 , G01N21/3581
摘要： A permittivity measuring method includes measuring a set of phases at sampling frequencies of at least three points in each of a first-half portion and a second-half portion of a phase characteristic of electromagnetic waves that passed through a measurement target, if the mode of the phase changes of both sets of phases belongs to a phase group in which change of the at least three points in the first half and change of at least three points in the second half are both monotonic change, maximal values, or minimal values, calculating the permittivity using the phase slope of the phases in the first-half portion and the phases in the second-half portion, and if the mode of the phase changes does not belong to the phase group, calculating the permittivity by fitting the phases of either the first half or the second half to a quadratic function.

77. 发明公开

US20230194588A1 Methods for Calculating a Relative Change in Percent Voids using Electromagnetic Wave Reflection Coefficients 审中-公开
公开(公告)号：US20230194588A1
公开(公告)日：2023-06-22
申请号：US18169353
申请日：2023-02-15
申请人： GEOPHYSICAL SURVEY SYSTEMS, INC.
发明人： Roger Roberts
IPC分类号： G01R27/26 , G01N33/38
CPC分类号： G01R27/2617 , G01N33/383
摘要： A method for calculating the change in percent voids between a reference location and a second location in a medium. The method includes obtaining a reference reflection coefficient of an electromagnetic wave reflection at the reference location, and a second reflection coefficient of an electromagnetic wave reflection at the second location. The obtained reflection coefficients are used to calculate a percent change in reflection coefficient. A reflection conversion factor correlating the change in the reflection coefficient to a change in percent voids in the medium is calculated and is used to calculate a change in percent voids between the reference and second locations based on the calculated percent change in reflection coefficients.

78. 发明授权

US11644558B2 Measuring device for determining a distance in a conducting structure 有权
公开(公告)号：US11644558B2
公开(公告)日：2023-05-09
申请号：US17590899
申请日：2022-02-02
申请人： Astyx MPS GmbH
发明人： Andre Giere , Sebastian Lüttich
IPC分类号： G01R27/04 , G01R27/08 , G01R27/26 , G01B7/02 , G01B7/14 , G01S13/38 , F15B15/28 , G01S13/88
CPC分类号： G01S13/38 , F15B15/2869 , G01B7/02 , G01R27/2617 , G01S13/88
摘要： The invention relates to a distance-measuring device for determining a distance between a reflection body in a conducting structure and a coupling region for electromagnetic waves, which region is provided on an end section of the conducting structure, said measuring device comprising a transmitting and receiving device, and a conduction junction (1) provided on the coupling region, for coupling the transmitting and receiving device to the conducting structure containing a medium, in order to couple an electromagnetic wave into the conducting structure, and to decouple the electromagnetic wave, reflected on the reflection body, from the conducting structure. Said measuring device also comprises an evaluation device for determining the distance between the coupling region and the reflection body from the complex reflection coefficient between the coupled electromagnetic wave and the decoupled electromagnetic wave. The invention also relates to the corresponding method.

79. 发明申请

US20180301783A1 ELECTRICALLY CONTROLLABLE RADIO-FREQUENCY CIRCUIT ELEMENT HAVING AN ELECTROCHROMIC MATERIAL 审中-公开
公开(公告)号：US20180301783A1
公开(公告)日：2018-10-18
申请号：US16018212
申请日：2018-06-26
申请人： Alcatel Lucent
发明人： Senad Bulja , Rose F. Kopf
IPC分类号： H01P5/02 , G01R27/26 , G01R27/06 , H01P3/00 , G01R27/28
CPC分类号： H01P5/028 , G01R27/06 , G01R27/2617 , G01R27/28 , H01P3/006
摘要： We disclose an electrically controllable RF-circuit element that includes an electrochromic material. In an example embodiment, the electrically controllable RF-circuit element is configured to operate as a phase shifter whose phase-shifting characteristics can be changed using a dc-bias voltage applied to a multilayered structure containing a layer of the electrochromic material.

80. 发明申请

US20180003758A1 Method for measuring quick changes in low surface conductivity of dielectrics under electromagnetic interference of line voltage and equipment to perform this type of measurement 审中-公开
公开(公告)号：US20180003758A1
公开(公告)日：2018-01-04
申请号：US15635427
申请日：2017-06-28
申请人： Palacky University Olomouc
发明人： Petr Frycák
IPC分类号： G01R31/00 , G01R27/02
CPC分类号： G01R31/001 , G01R27/02 , G01R27/025 , G01R27/2617
摘要： The method for measuring of quick changes of low surface conductivity of dielectrics under electromagnetic interference of line voltage is based on a comparison measurement on a voltage divider and synchronisation of measuring pulses with periodic sinusoidal course of interference when voltage with pre-set parameters of square pulse is brought to the tested dielectric surface and potential is sampled in the voltage divider consisting of the measured dielectric surface and a resistor with preselected resistivity in certain time intervals both before application of the measuring pulse and immediately before its end, and then based on a difference between the values measured using a differential amplifier, the value corresponding to that measured without effect of electromagnetic interference 60 Hz is derived and the result is the possibility to measure quick changes of low surface conductivity of dielectric surface.The equipment for measurement of quick changes of low surface conductivity of dielectrics under electromagnetic interference of line voltage contains the sensing element (1) monitoring electromagnetic interference and the block (2) monitoring electromagnetic interference that is connected to the sensing element, and the comparative block (3) for control of generation of time sequences is connected to the first output from the block (2) and the block (4) for generation of pulses is also connected to the first output from the block (2), and the output of the block (4) are square pulses 1 ms/±5 V, and the first output 10 μs/±5 V and the second output 10 μs/±5 V are connected to inputs of the block (6) of logic elements, and another output of the block (2) monitoring electromagnetic interference is connected to the comparative element (5), the output of which is connected to the fourth input of the block (6) of logic elements, and the first output of the bloc (6) of logic elements is connected through the block (7) for modulation of pulses to the with the output as pulse 0 to 300 mV to the tested surface in the block (8) of the voltage divider surface/divider-resistor where output from this block (8) of the voltage divider surface/resistor-divider is connected through the block (11) of the voltage follower to the divider with very high input impedance to signal inputs of the first sample-and-hold amplifier (9) and of the second sample-and-hold amplifier (10), and the second input for control of sampling of the first sample-and-hold amplifier (9) and the second input for control of sampling of the second sample-and-hold amplifier (10) are connected with corresponding outputs for control of sampling of the block (6) of logic elements, and output of the first sample-and-hold amplifier (9) is connected through the block (12) of two inverting amplifiers connected in series to inverting input of the differential amplifier (13), and output from the second sample-and-hold amplifier (10) is connected to its non-inverting input, and the differential amplifier (13) is connected through the block (14) to eliminate accidental jitter of signal and the output block (15) with low impedance to the output from the equipment.

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