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    • 71. 发明申请
    • INTEGRATED CIRCUITS TO CONTROL ACCESS TO MULTIPLE LAYERS OF MEMORY IN A SOLID STATE DRIVE
    • 集成电路控制在固态驱动器中访问多个存储器层
    • US20120265929A1
    • 2012-10-18
    • US13530598
    • 2012-06-22
    • Robert Norman
    • Robert Norman
    • G06F12/02
    • G11C7/24G11C5/02G11C16/22
    • Circuits to control access to memory; for example, third dimension memory are disclosed. An integrated circuit (IC) may be configured to control access to memory cells. For example, the IC may include a memory having memory cells that are vertically disposed in multiple layers of memory. The IC may include a memory access circuit configured to control access to a first subset of the memory cells in response to access control data in a second subset of the memory cells. Each memory cell may include a non-volatile two-terminal memory element that stores data as a plurality of conductivity profiles that can be non-destructively sensed by applying a read voltage across the two terminals of the memory element. New data can be written by applying a write voltage across the two terminals of the memory element. The two-terminal memory elements can be arranged in a two-terminal cross-point array configuration.
    • 控制存储器访问的电路; 例如,公开了第三维存储器。 集成电路(IC)可以被配置为控制对存储器单元的访问。 例如,IC可以包括具有垂直设置在多层存储器中的存储单元的存储器。 IC可以包括存储器访问电路,其被配置为响应于存储器单元的第二子集中的访问控制数据来控制对存储器单元的第一子集的访问。 每个存储器单元可以包括非易失性两端存储元件,其通过在存储元件的两个端子上施加读取电压而将数据存储为可以非破坏性地感测的多个导电率分布。 可以通过在存储元件的两个端子上施加写入电压来写入新的数据。 两端存储器元件可以布置成两端交叉点阵列配置。
    • 72. 发明授权
    • System including vertically stacked embedded non-flash re-writable non-volatile memory
    • 系统包括垂直堆叠的非闪存可重写非易失性存储器
    • US08289803B2
    • 2012-10-16
    • US13303012
    • 2011-11-22
    • Robert Norman
    • Robert Norman
    • G11C8/00
    • G11C5/04G06F12/0638G06F2212/7208G11C5/02G11C11/005Y02D10/13
    • A multiple-type memory is disclosed. The multiple-type memory includes memory blocks in communication with control logic blocks. The memory blocks and the control logic blocks are configured to emulate a plurality of memory types. The memory blocks can be configured into a plurality of memory planes that are vertically stacked upon one another. The vertically stacked memory planes may be used to increase data storage density and/or the number of memory types that can be emulated by the multiple-type memory. Each memory plane can emulate one or more memory types. The control logic blocks can be formed in a substrate (e.g., a silicon substrate including CMOS circuitry) and the memory blocks or the plurality of memory planes can be positioned over the substrate and in communication with the control logic blocks. The multiple-type memory may be non-volatile so that stored data is retained in the absence of power.
    • 公开了一种多式存储器。 多类型存储器包括与控制逻辑块通信的存储器块。 存储器块和控制逻辑块被配置为模拟多个存储器类型。 存储器块可以被配置成彼此垂直堆叠的多个存储器平面。 可以使用垂直堆叠的存储器平面来增加数据存储密度和/或可由多型存储器仿真的存储器类型的数量。 每个存储器平面可以模拟一个或多个存储器类型。 控制逻辑块可以形成在衬底(例如,包括CMOS电路的硅衬底)中,并且存储器块或多个存储器平面可以位于衬底上并与控制逻辑块通信。 多类型存储器可以是非易失性的,使得存储的数据在没有电力的情况下被保留。
    • 73. 发明授权
    • Memory scrubbing in third dimension memory
    • 第三维存储器中的内存擦除
    • US08271855B2
    • 2012-09-18
    • US12653896
    • 2009-12-18
    • Robert Norman
    • Robert Norman
    • G11C29/00
    • G11C13/0064G11C11/56G11C13/004G11C13/0069G11C29/00G11C2013/0054G11C2211/5634G11C2211/5645G11C2213/71
    • A method for memory scrubbing is provided. In this method, a first resistance of a reference memory element is read. A second resistance of a memory element also is read. A difference between the first resistance and the second resistance is sensed and a programming error associated with the second resistance is detected based on the difference. Each memory element is non-volatile and re-writeable, and can be positioned in a two-terminal memory cell that is one of a plurality of memory cells positioned in a two-terminal cross-point memory array. Active circuitry for performing the memory scrubbing can be fabricated FEOL in a logic layer and one or more layers of the two-terminal cross-point memory arrays can be fabricated BEOL over the logic layer. Each memory cell can optionally include non-ohmic device (NOD) electrically in series with the memory element and the two terminals of the memory cell.
    • 提供了一种用于记忆擦洗的方法。 在该方法中,读取参考存储元件的第一电阻。 还读取存储元件的第二电阻。 感测到第一电阻和第二电阻之间的差异,并且基于该差异检测与第二电阻相关联的编程误差。 每个存储器元件是非易失性的和可重写的,并且可以被定位在位于两端交叉点存储器阵列中的多个存储单元之一的两端存储单元中。 可以在逻辑层中制造用于执行存储器擦除的有源电路,并且可以在逻辑层上制造两端的交叉点存储器阵列的一层或多层BEOL。 每个存储器单元可以可选地包括与存储器单元和存储单元的两个端子串联的非欧姆器件(NOD)。
    • 74. 发明授权
    • Integrated circuits to control access to multiple layers of memory in a solid state drive
    • 用于控制在固态驱动器中访问多层存储器的集成电路
    • US08208297B2
    • 2012-06-26
    • US13134701
    • 2011-06-14
    • Robert Norman
    • Robert Norman
    • G11C11/34
    • G11C7/24G11C5/02G11C16/22
    • Circuits to control access to memory; for example, third dimension memory are disclosed. An integrated circuit (IC) may be configured to control access to memory cells. For example, the IC may include a memory having memory cells that are vertically disposed in multiple layers of memory. The IC may include a memory access circuit configured to control access to a first subset of the memory cells in response to access control data in a second subset of the memory cells. Each memory cell may include a non-volatile two-terminal memory element that stores data as a plurality of conductivity profiles that can be non-destructively sensed by applying a read voltage across the two terminals of the memory element. New data can be written by applying a write voltage across the two terminals of the memory element. The two-terminal memory elements can be arranged in a two-terminal cross-point array configuration.
    • 控制存储器访问的电路; 例如,公开了第三维存储器。 集成电路(IC)可以被配置为控制对存储器单元的访问。 例如,IC可以包括具有垂直设置在多层存储器中的存储单元的存储器。 IC可以包括存储器访问电路,其被配置为响应于存储器单元的第二子集中的访问控制数据来控制对存储器单元的第一子集的访问。 每个存储器单元可以包括非易失性两端存储元件,其通过在存储元件的两个端子上施加读取电压而将数据存储为可以非破坏性地感测的多个导电率分布。 可以通过在存储元件的两个端子上施加写入电压来写入新的数据。 两端存储器元件可以布置成两端交叉点阵列配置。
    • 76. 发明授权
    • Scaleable memory systems using third dimension memory
    • 使用第三维存储器的可扩展内存系统
    • US08000138B2
    • 2011-08-16
    • US12454739
    • 2009-05-22
    • Robert Norman
    • Robert Norman
    • G11C11/34G06F12/02
    • G11C16/04G11C2207/104
    • A non-volatile scalable memory circuit is described, including a bus formed on a substrate that includes active circuitry, metallization layers, and a plurality of high density third dimension memory arrays formed over the substrate. Each memory circuit can include an embedded controller for controlling data access to the memory arrays and optionally a control node that allows data access to be controlled by an external memory controller or by the embedded controller. The memory circuits can be chained together to increase memory capacity. The memory arrays can be two-terminal cross-point arrays that may be stacked upon one another.
    • 描述了非易失性可伸缩存储器电路,包括形成在衬底上的总线,其包括有源电路,金属化层以及形成在衬底上的多个高密度第三维存储器阵列。 每个存储器电路可以包括用于控制对存储器阵列的数据访问的嵌入式控制器和可选地允许由外部存储器控制器或嵌入式控制器控制数据访问的控制节点。 存储器电路可以链接在一起以增加存储器容量。 存储器阵列可以是彼此堆叠的两端交叉点阵列。