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热词
    • 78. 发明授权
    • Test apparatus
    • 测试仪器
    • US09279848B2
    • 2016-03-08
    • US14466719
    • 2014-08-22
    • Sumitomo Electric Device Innovations, Inc.
    • Haruyoshi OnoIsao Baba
    • G01M11/02G01R31/26H01S5/00
    • G01R31/2635G01M11/0207H01S5/0014
    • Disclosed is a test apparatus including: test target sections each having a connector to connect a Device Under the Test (DUT); measuring sections that include measuring devices that have same measuring item respectively; a switch section that switches connection between the test target section and the measuring section under direction of a controller; wherein the controller selects one of the algorithms of connection, 1) searching vacancy of the measuring sections and directs the switch section to make a path between the test target section and the measuring section of vacancy, 2) holding the path that former selected.
    • 公开了一种测试装置,包括:测试目标部分,每个测试目标部分具有用于连接被测设备(DUT)的连接器; 测量部分包括分别具有相同测量项目的测量装置; 开关部,其在控制器的方向上切换所述测试对象部与所述测量部之间的连接; 其中所述控制器选择所述连接算法之一,1)搜索所述测量部分的空位并引导所述切换部分在所述测试目标部分与所述测量部分之间建立空位,2)保持所选择的路径。