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61. 发明授权

US11012154B2 Systems and methods for measuring a modal delay and a modal bandwidth 有权
公开(公告)号：US11012154B2
公开(公告)日：2021-05-18
申请号：US16905117
申请日：2020-06-18
申请人： CORNING INCORPORATED
发明人： Xin Chen , Kangmei Li , Ming-Jun Li
IPC分类号： H04B10/079 , G01M11/00 , H04B10/25 , H04B10/54
摘要： The present disclosure is directed to systems and methods for calculating a modal time delay and a modal bandwidth. For example, a method may include: transmitting an intensity-modulated light through a mode conditioner to generate a mode-conditioned intensity-modulated light; transmitting the mode-conditioned intensity-modulated light through an optical fiber under test (FUT) to excite a plurality of modes of the optical FUT; converting the mode-conditioned intensity-modulated light transmitted through the optical FUT into an electrical signal; measuring, based on the electrical signal, a transfer function or a complex transfer function of the optical FUT based on at least on one pair of the plurality of modes; calculating a modal delay time of the optical FUT based on the transfer function or the complex transfer function; and calculating a modal bandwidth of the optical FUT based on the modal delay time, the modal bandwidth being calculated for any given launch conditions of the plurality of modes.

62. 发明授权

US11002632B2 Measuring polarization extinction ratio (PER) using a reference master test jumper (MTJ) 有权
公开(公告)号：US11002632B2
公开(公告)日：2021-05-11
申请号：US16457269
申请日：2019-06-28
申请人： VIAVI SOLUTIONS INC.
发明人： Robert Matthew Adams , Joshua Benjamin Julius Philipson
IPC分类号： G01M11/00 , G01J4/04 , G02B6/42
摘要： A system for measuring a polarization extinction ratio (PER) using a reference master test jumper (MTJ) is disclosed. The system may include an optical source to transmit an optical signal via an optical fiber. The system may also include a device under test (DUT) communicatively coupled to the optical source via the optical fiber to receive the optical signal from the optical source. The system may also include an optical measurement component communicatively coupled to the device under test (DUT). In some examples, the optical fiber may be configured or initialized to be a reference master test jumper (MTJ) that minimizes inherent polarization extinction ratio (PER) of the optical fiber when measuring a polarization extinction ratio (PER) during a measurement action.

63. 发明申请

US20210131786A1 INTEGRATED REFLECTOMETER OR ELLIPSOMETER 有权
公开(公告)号：US20210131786A1
公开(公告)日：2021-05-06
申请号：US16672233
申请日：2019-11-01
申请人： Applied Materials, Inc.
发明人： Guoheng Zhao
IPC分类号： G01B9/02 , G01N21/21 , G01M11/00
摘要： A reflectometer or ellipsometer integrated with a processing tool includes a source module configured to generate a input beam, and a first mirror arranged to receive the input beam. The first mirror is configured to collimate the input beam and direct the input beam toward an aperture plate. The aperture plate has at least two apertures. One of the at least two apertures is arranged to define a measurement beam from a portion of the input beam, and one of the at least two apertures is arranged to define a reference beam from a portion of the input beam. An optical element is arranged within an optical path of the reference beam and outside an optical path of the measurement beam. The optical element is configured to direct the reference beam toward a third mirror. A second mirror is arranged to receive the measurement beam and focus the measurement beam through a window and onto a surface of a sample. The window forms part of a chamber of the processing tool and the sample is disposed within the chamber. At least a portion of the measurement beam is reflected from the surface of the sample as a reflected beam. The second mirror is arranged to receive the reflected beam and direct the reflected beam toward the optical element. The optical element is configured to direct the reflected beam toward the third mirror. The third mirror is arranged to receive the reference beam and the reflected beam and focus the reference beam and the reflected beam onto a collection plane.

64. 发明授权

US10996081B2 Integrated optical/electrical probe card for testing optical, electrical, and optoelectronic devices in a semiconductor die 有权
公开(公告)号：US10996081B2
公开(公告)日：2021-05-04
申请号：US16570926
申请日：2019-09-13
申请人： Newport Fab, LLC
发明人： Yasir Qamar , Edward Preisler
IPC分类号： G01N21/00 , G01D5/56 , G01R1/067 , G01R1/073 , G01M11/00 , G01D5/26 , G02B6/42 , G01R1/07
摘要： A test system includes a semiconductor die and an integrated optical/electrical probe card. Electrical, optical, and optoelectronic devices reside in the semiconductor die. Electrical pads in the semiconductor die connect to the electrical and optoelectronic devices. Grating couplers in the semiconductor die connect to the optical device and optoelectronic devices. The electrical pads and grating couplers are interspersed in substantially a single line in the semiconductor die. The integrated optical/electrical probe card interfaces with the electrical pads by electrical needles, and concurrently interfaces with the grating couplers by optical fibers.

65. 发明申请

US20210116367A1 Measurement Technique for Refractive Index Inhomogeneity Between Plates of a Lightguide Optical Element (LOE) 有权
$Measurement Technique for Refractive Index Inhomogeneity Between Plates of a Lightguide Optical Element (LOE)$
公开(公告)号：US20210116367A1
公开(公告)日：2021-04-22
申请号：US17044390
申请日：2019-06-20
申请人： Lumus Ltd.
发明人： Jonathan GELBERG , Yuval RUBIN , Michael ADEL
IPC分类号： G01N21/45 , G01J9/02 , G01M11/00 , G01M11/02
摘要： A system and method for measuring refractive index inhomogeneity between plates of a Lightguide Optical Element (LOE) uses an innovative measuring technique based on a shearing interferometric technique conventionally used to observe interference and test the collimation of light beams. Another feature of the current implementation is an innovative method for analyzing the characteristics of the generated interferogram to characterize discrepancies between adjacent plates in an LOE.

66. 发明授权

US10984519B2 Method for evaluating the optical insertion loss of a mechanical splice joint of two optical fibers 有权
公开(公告)号：US10984519B2
公开(公告)日：2021-04-20
申请号：US15658565
申请日：2017-07-25
申请人： Panduit Corp.
发明人： Jose M. Castro , Richard J. Pimpinella , Yu Huang , Bulent Kose , William Kidd
IPC分类号： G06T7/00 , G02B6/38 , G01M11/00 , G06K9/46 , H04N5/225 , H04N5/33 , H04N5/232 , H04N5/355
摘要： A method for evaluating the optical insertion loss of a mechanical splice joint of two optical fibers with a laser source includes, upon initiation by a user, automatically performing the steps of: checking for ambient light, estimating the level of noise by analyzing an area of a sensor that is not illuminated by external sources and setting a noise threshold, checking self-alignment by taking a foreground image of the joint with the laser source turned on and one with it turned off, subtracting the images to obtain a resultant image, setting all pixels with levels below the noise threshold to zero, selecting a region of interest of the joint, computing a centroid and a width of the resultant image based on the region of interest, estimating a tilt and if the tilt is above a certain threshold, compensating for the tilt, and processing the resultant image.

67. 发明授权

US10962443B1 Multi-fiber connector visual polarity and continuity tester 有权
公开(公告)号：US10962443B1
公开(公告)日：2021-03-30
申请号：US16820800
申请日：2020-03-17
申请人： Piotr Anatolij Levin , Sergej Karpichin
发明人： Piotr Anatolij Levin , Sergej Karpichin
IPC分类号： G01M11/00
摘要： The test device of the present invention is configured to test the continuity and polarity of a plurality of fibers housed by a cable that extends between the multi-fiber connectors on either end of the cable. In its most basic form, the test device of the present invention includes first and second light sources; an optical splitter positioned between the second light source and the connector at the first end of the cable housing the plurality of fibers under test; and a receiver and configured for optical communication with the second end of the cable. The first light source creates a first light pattern, which is distinct from a second light pattern created by the second light source.

68. 发明申请

US20210088408A1 METHODS AND APPARATUSES FOR QUANTITATIVE SENSING USING RAYLEIGH SCATTERING IN OPTICAL FIBER 有权
公开(公告)号：US20210088408A1
公开(公告)日：2021-03-25
申请号：US17027606
申请日：2020-09-21
申请人： The Government of the United States, as represented by the Secretary of the Navy
发明人： Matthew J. Murray , Brandon Redding , Allen Davis , Clay Kirkendall
IPC分类号： G01M11/00 , G02B6/02 , G02B6/028
摘要： Methods and apparatuses for quantitatively measuring strain in an optical fiber. An optical source comprising an optical beam generator and a pulse generator receives instructions from a controller and generates a pulsed optical beam in response to those instructions. The pulsed optical beam is directed into an optical fiber to generate a reflected beam from scattering centers within the optical fiber. A detector records a plurality of frames of data generated by the reflected beam, and the controller tracks an evolution of a speckle pattern carried by the reflected beam from the plurality of frames and calculates a strain induced in a section of the optical fiber from the evolution of the speckle pattern.

69. 发明申请

US20210080349A1 MULTIPLE FRONT-END DEVICE BASED HIGH SPEED OPTICAL TIME DOMAIN REFLECTOMETER ACQUISITION 有权
公开(公告)号：US20210080349A1
公开(公告)日：2021-03-18
申请号：US16717430
申请日：2019-12-17
申请人： Viavi Solutions France SAS
发明人： Andre CHAMPAVERE
IPC分类号： G01M11/00
摘要： In some examples, multiple front-end device based high speed OTDR acquisition may include measuring, in parallel, light transmission with respect to specified optical fibers of a plurality of optical fibers by utilizing a plurality of analog and optic front-end devices. A front-end interface may be operatively connected to the plurality of analog and optic front-end devices. The front-end interface may convert analog signals received from the specified analog and optic front-end devices to digital signals. A measurement controller may be operatively connected to the front-end interface to control operation of the plurality of analog and optic front-end devices, and analyze, based on the digital signals, a property of the specified optical fibers.

70. 发明申请

US20210080295A1 Integrated Optical/Electrical Probe Card for Testing Optical, Electrical, and Optoelectronic Devices in a Semiconductor Die 有权
公开(公告)号：US20210080295A1
公开(公告)日：2021-03-18
申请号：US16570926
申请日：2019-09-13
申请人： Newport Fab, LLC dba Jazz Semiconductor
发明人： Yasir Qamar , Edward Preisier
IPC分类号： G01D5/56 , G01R1/067 , G01R1/073 , G01R1/07 , G01D5/26 , G02B6/42 , G01M11/00
摘要： A test system includes a semiconductor die and an integrated optical/electrical probe card. Electrical, optical, and optoelectronic devices reside in the semiconductor die. Electrical pads in the semiconductor die connect to the electrical and optoelectronic devices. Grating couplers in the semiconductor die connect to the optical device and optoelectronic devices. The electrical pads and grating couplers are interspersed in substantially a single line in the semiconductor die. The integrated optical/electrical probe card interfaces with the electrical pads by electrical needles, and concurrently interfaces with the grating couplers by optical fibers.

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