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    • 61. 发明授权
    • Ratio asymmetric inverters, and apparatus including one or more ratio asymmetric inverters
    • 比率非对称逆变器和包括一个或多个比例非对称逆变器的装置
    • US07688114B2
    • 2010-03-30
    • US12121149
    • 2008-05-15
    • Claudio San Roman Denegri
    • Claudio San Roman Denegri
    • H03K19/094
    • H03K19/018514H03K5/1515H03K2005/00136H03M1/0863H03M1/742
    • A ratio asymmetric inverter has a signal input, signal output, first and second power inputs, pullup and pulldown transistors, and at least one delay element. The pullup transistor has a gate terminal, a source terminal coupled to the first power input, and a drain terminal coupled to the signal output. The pulldown transistor has a gate terminal, a drain terminal coupled to the signal output, and a source terminal coupled to the second power input. The signal input is respectively coupled to the gate terminals of the pullup transistor and the pulldown transistor via first and second signal paths. The at least one delay element is included in only one of the first and second signal paths, to impart a longer propagation delay to the one of the first and second signal paths.
    • 比例非对称逆变器具有信号输入,信号输出,第一和第二功率输入,上拉和下拉晶体管以及至少一个延迟元件。 上拉晶体管具有栅极端子,耦合到第一电力输入端的源极端子和耦合到信号输出端的漏极端子。 下拉晶体管具有栅极端子,耦合到信号输出的漏极端子和耦合到第二电力输入端的源极端子。 信号输入分别经由第一和第二信号路径耦合到上拉晶体管和下拉晶体管的栅极端子。 至少一个延迟元件仅包括在第一和第二信号路径中的一个中,以向第一和第二信号路径中的一个施加更长的传播延迟。
    • 65. 发明授权
    • Methods of providing performance compensation for process variations in integrated circuits
    • 为集成电路中的工艺变化提供性能补偿的方法
    • US07362129B1
    • 2008-04-22
    • US11449198
    • 2006-06-08
    • Arifur Rahman
    • Arifur Rahman
    • H03K17/16H03K19/003
    • H03K17/005H03K17/302H03K17/6872H03K19/00384H03K19/1737H03K2005/00123H03K2005/00136
    • Methods of compensating for process variations in an integrated circuit. Multiplexer circuits can be programmed to balance the rising and falling delays through the circuits in the presence of process variations. These multiplexer circuits can be used, for example, as programmable interconnect multiplexers in the interconnect structures of PLDs. During wafer sort or final test, a process corner can be determined for each die. One or more E-fuses can be set to predetermined level(s) to program the process corner information into the die, or the values can be stored in some other type of non-volatile memory. The stored values are utilized by the programmable multiplexer circuits to optionally adjust the rising and/or falling delays through the multiplexer circuits to achieve a balance between the rising and falling delays.
    • 补偿集成电路中工艺变化的方法。 可以对多路复用器电路进行编程,以在存在过程变化的情况下平衡通过电路的上升和下降延迟。 这些多路复用器电路可以例如用作PLD的互连结构中的可编程互连多路复用器。 在晶片分选或最终测试期间,可以确定每个模具的工艺角。 可以将一个或多个电子熔丝设置到预定级别以将过程角信息编程到管芯中,或者可以将值存储在某种其他类型的非易失性存储器中。 所存储的值被可编程多路复用器电路用于可选地调整通过多路复用器电路的上升和/或下降延迟以实现上升和下降延迟之间的平衡。
    • 67. 发明申请
    • Duty detector and duty detection/correction circuit including the same and method thereof
    • 负载检测器和占空比检测/校正电路包括其及其方法
    • US20080088350A1
    • 2008-04-17
    • US11907723
    • 2007-10-17
    • Young-soo Sohn
    • Young-soo Sohn
    • H03K3/017
    • H03K5/1565H03K2005/00136
    • A duty detector may include a first amplifier and/or an integrator. The first amplifier may be configured to receive a first signal and a complementary first signal, differential-amplify the first signal and the complementary first signal, and/or output the differential-amplified first signal to an output terminal and the differential-amplified complementary first signal to a complementary output terminal. The integrator may be connected to the output terminal and the complementary output terminal of the first amplifier, configured to integrate the differential-amplified first signal and the differential-amplified complementary first signal, and/or configured to output a duty detection signal.
    • 占空比检测器可以包括第一放大器和/或积分器。 第一放大器可以被配置为接收第一信号和互补的第一信号,差分放大第一信号和互补的第一信号,和/或将差分放大的第一信号输出到输出端和差分放大的互补的第一信号 信号到互补输出端子。 积分器可以连接到第一放大器的输出端和互补输出端,被配置为积分差分放大的第一信号和差分放大的互补第一信号,和/或被配置为输出占空比检测信号。