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    • 61. 发明授权
    • Bi-directional circuit breaker
    • 双向断路器
    • US08729739B2
    • 2014-05-20
    • US13017227
    • 2011-01-31
    • Vadim LubomirskyDamian Urciuoli
    • Vadim LubomirskyDamian Urciuoli
    • H02B1/24
    • H01L29/8083H01L29/0843H01L29/1602H01L29/1608H01L29/2003H01L29/42316H02M1/32H03K17/08142H03K17/6874H03K17/785Y10T307/414Y10T307/565Y10T307/685Y10T307/74
    • A circuit breaker comprising first and second JFETs, each comprising a gate, drain and source connection, the JFETs sources being operatively connected to each other to form a common-source connection and adapted to be connected to and operating to open an external circuit when the current flowing through the JFETs exceeds a predetermined threshold, the JFETs' gates, and common-source connection being operatively connected to a gate driver circuit which causes the JFETs to turn off when the predetermined threshold is exceeded; whereupon the current flows through the common-source connection into the second gate and into the gate driver circuit which causes the gate driver circuit to turn off the first and second JFETs and open the circuit breaker. Also claimed is a method of sensing an overloaded circuit comprising leading and trailing JFETs in a circuit that open the circuit and prevent current flow when a predetermined threshold is exceeded.
    • 一种断路器,包括第一和第二JFET,每个包括栅极,漏极和源极连接,所述JFET源彼此可操作地连接以形成公共源连接,并且适于连接到和操作以打开外部电路 流过JFET的电流超过预定阈值,JFET栅极和公共源极连接可操作地连接到栅极驱动电路,当栅极驱动电路超过预定阈值时,栅极驱动电路导致JFET截止; 于是电流流过共源电源连接进入第二栅极并进入栅极驱动电路,使栅极驱动电路关闭第一和第二JFET并断开断路器。 还要求保护的是一种感测过载电路的方法,该过载电路包括在超过预定阈值时打开电路并防止电流流动的电路中的前导和后沿JFET。
    • 66. 发明申请
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • US20130313635A1
    • 2013-11-28
    • US13983157
    • 2012-02-01
    • Yuki Nakano
    • Yuki Nakano
    • H01L29/78
    • H01L29/7813H01L21/8213H01L27/088H01L29/0619H01L29/0623H01L29/0696H01L29/086H01L29/1095H01L29/1602H01L29/1608H01L29/2003H01L29/41766H01L29/45H01L29/47H01L29/66045H01L29/66068H01L29/66727H01L29/66734H01L29/7806H01L29/7811H01L29/7827H01L2224/0603
    • A semiconductor device of the present invention is a semiconductor device having a semiconductor layer comprising a wide band gap semiconductor, wherein the semiconductor layer includes: a first conductivity-type source region, a second conductivity-type channel region and a first conductivity-type drain region, which are formed in this order from the surface side of the semiconductor layer; a source trench lying from the surface of the semiconductor layer through the source region and the channel region to the drain region; a gate insulating film formed so as to contact the channel region; a gate electrode facing the channel region with the gate insulating film interposed therebetween; and a first breakdown voltage holding region of a second conductivity type formed selectively on the side face or the bottom face of the source trench, and the semiconductor device includes a barrier formation layer, which is joined with the drain region in the source trench, for forming, by junction with the drain region, a junction barrier lower than a diffusion potential of a body diode formed by p-n junction between the channel region and the drain region.
    • 本发明的半导体器件是具有包括宽带隙半导体的半导体层的半导体器件,其中半导体层包括:第一导电型源极区,第二导电型沟道区和第一导电类型漏极 区域,其从半导体层的表面侧依次形成; 源极沟槽,其从半导体层的表面通过源极区域和沟道区域到达漏极区域; 形成为与沟道区域接触的栅极绝缘膜; 面对沟道区域的栅电极,其间插入有栅极绝缘膜; 以及选择性地形成在源沟槽的侧面或底面上的第二导电类型的第一击穿电压保持区域,并且所述半导体器件包括与源极沟槽中的漏极区域接合的势垒形成层,用于 通过与漏极区域的连接形成低于由沟道区域和漏极区域之间的pn结形成的体二极管的扩散电位的结屏障。