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    • 61. 发明授权
    • Fluorescent X-ray analyzing method of solution specimen and specimen
sampler used for the method
    • 用于该方法的溶液样品和样品取样器的荧光X射线分析方法
    • US4788700A
    • 1988-11-29
    • US928657
    • 1986-11-05
    • Shigetoshi KurozumiTadahiro AbeHideo MaruyamaNoriko Yasui
    • Shigetoshi KurozumiTadahiro AbeHideo MaruyamaNoriko Yasui
    • G01N23/22G01N23/223H05G1/00
    • G01N23/2202
    • For analyzing the solution specimen according to the fluorescent X-ray analyzing method, a certain quantity of solution specimen to be analyzed is impregnated into a thin porous sheet, for example by dripping method, and the sheet is dried for evaporating the solvent. Held on an appropriate holder, for example, the sheet is placed in the vacuum atmosphere or the atmosphere of helium gas, so that the primary X-rays are irradiated and the wavelength or the intensity of the fluorescent X-rays generated from the solute remained in the sheet may be detected. The concentration of the solution may be changed by concentration or by dilution, so that an adequate intensity of the fluorescent X-ray may be generated. The specimen sampler is made of porous sheet material, to which the solution specimen to be analyzed is impregnated and dried to remain only the solute of the solution in the sheet. To the circumferential edge of the sheet is attached a circular edge of a support, so that the central portion of the porous sheet is sufficiently spaced from the circumferentially provided support.
    • 为了根据荧光X射线分析法对溶液样品进行分析,将一定量的待分析溶液试样浸渍在例如滴加法的薄多孔片材中,干燥以蒸发溶剂。 例如,在适当的保持器上,将片材放置在真空气氛或氦气气氛中,从而照射初级X射线,并且保留从溶质产生的荧光X射线的波长或强度 可能检测到纸张。 可以通过浓缩或稀释来改变溶液的浓度,从而可以产生足够强度的荧光X射线。 样品取样器由多孔片材制成,待分析的溶液样品被浸渍和干燥,以仅保留片材中溶液的溶质。 在片材的圆周边缘附着有支撑件的圆形边缘,使得多孔片材的中心部分与周向设置的支撑件充分地间隔开。
    • 62. 发明授权
    • Detection of oxygen in thin films
    • 检测薄膜中的氧气
    • US4719120A
    • 1988-01-12
    • US913793
    • 1986-09-29
    • Arold K. GreenRobert H. Hammond
    • Arold K. GreenRobert H. Hammond
    • C23C14/52G01N23/22B05D5/12
    • C23C14/52G01N23/2202
    • A method for determining the presence, during deposition of a first thin m layer, of a substance which escapes when the layer is cooled and transferred from its deposition environment for analysis to determine the presence of the substance. The layer is first covered with a second layer of a material which captures the escaping substance. This second layer is then covered with a cap layer of a substance which seals the second layer against contamination, as from the atmosphere during transfer. The layered structure, with the escaped substance retained in the second layer, is then analyzed, as by sputter depth profiling and Auger electron spectroscopy, to determine the presence in the second layer of the escaped substance and thus determine the presence of this substance during deposition of the first layer.
    • 一种用于确定在沉积第一薄膜层期间存在当该层被冷却并从其沉积环境转移以确定物质的存在时逸出的物质的存在的方法。 该层首先用覆盖逸出物质的第二层材料覆盖。 然后,该第二层被覆盖有物质的盖层,所述物质的密封层与传递期间的大气密封第二层以防污染。 然后通过溅射深度分布和俄歇电子能谱法分析保留在第二层中的逃逸物质的分层结构,以确定在逸出物质的第二层中的存在,从而确定沉积期间该物质的存在 的第一层。