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61. 发明授权

US09547304B2 Computer-implemented system and method for attribute-based manufacturing quality control 有权
标题翻译：基于属性的制造质量控制的计算机实现系统和方法
公开(公告)号：US09547304B2
公开(公告)日：2017-01-17
申请号：US14923252
申请日：2015-10-26
申请人： Michael H S Dunlop
发明人： Michael H S Dunlop
IPC分类号： G05B19/418
CPC分类号： G05B19/41875 , G01B21/30 , G05B19/418 , G05B2219/32212 , G05B2219/32218 , G05B2219/32368 , Y02P90/02 , Y02P90/04 , Y02P90/18 , Y02P90/22
摘要： A computer-implemented system and method for attribute-based manufacturing quality control is provided. A specification for manufacturing a part feature is maintained in a database, the specification including a nominal. Also maintained in the database are one or more measurements for the feature on a plurality of parts manufactured in accordance with the specification, each of the measurements associated with one or more attributes, each of the attributes identifying at least one of a circumstance relating to how that measurement was made and how the feature was manufactured. A user selection of one or more of the attributes is received. Each of the measurements that is associated with all of the selected attributes is identified. A score indicative of how close the identified measurements are to the nominal is calculated and displayed.
摘要翻译：提供了一种用于基于属性的制造质量控制的计算机实现的系统和方法。用于制造零件特征的规范被保存在数据库中，该规范包括标称值。还保存在数据库中的是对于根据说明书制造的多个部件上的特征的一个或多个测量，每个测量与一个或多个属性相关联，每个属性标识与如何相关的情况中的至少一个进行了测量，以及该功能的制造。接收一个或多个属性的用户选择。识别与所有所选属性相关联的每个测量。计算并显示指示所识别的测量值与标称接近程度的得分。

62. 发明申请

US20170011198A1 Living object investigation and diagnosis 有权
标题翻译：生活对象调查与诊断
公开(公告)号：US20170011198A1
公开(公告)日：2017-01-12
申请号：US15269408
申请日：2016-09-19
申请人： SYNTOUCH, LLC
发明人： Jeremy A. Fishel , Gerald E. Loeb
IPC分类号： G06F19/00 , A61B5/01 , A61B5/00 , G01B21/30 , G06K9/62
CPC分类号： G06F19/3443 , A61B5/0048 , A61B5/0077 , A61B5/01 , A61B5/6897 , G01B21/30 , G06F19/00 , G06K9/6277 , G16H50/70
摘要： An object investigation and classification system may include an object test system, a data storage system, and a data processing system. The object test system may receive a command to perform at least one action with a test object, perform the at least one action with the test object, and return test information indicative of at least one percept resulting from the at least one action. The data storage system may contain an experience database containing data indicative of multiple classifications and, for each classification, at least one action that was performed with at least one previously-observed reference object having this classification, and at least one percept value that is based in whole or in part on the test information resulting from the at least one action.
摘要翻译：对象调查和分类系统可以包括对象测试系统，数据存储系统和数据处理系统。对象测试系统可以接收用于使用测试对象执行至少一个动作的命令，与测试对象执行至少一个动作，以及返回指示至少一个来自至少一个动作的感知的测试信息。数据存储系统可以包含体验数据库，其包含指示多个分类的数据，并且对于每个分类，使用至少一个先前观察到的具有该分类的参考对象执行的至少一个动作，以及基于该分类的至少一个感知值全部或部分地由至少一个动作产生的测试信息。

63. 发明申请

US20170011008A1 Anomaly Detection Method, Program, and System 审中-公开
标题翻译：异常检测方法，程序和系统
公开(公告)号：US20170011008A1
公开(公告)日：2017-01-12
申请号：US15273301
申请日：2016-09-22
申请人： International Business Machines Corporation
发明人： Tsuyoshi Ide , Tetsuro Morimura , Bin Tong
IPC分类号： G06F17/18 , G06K9/62
CPC分类号： G06F17/18 , G01B21/30 , G06K9/00536 , G06K9/6267 , G06K9/6284 , G06K9/6298
摘要： A method providing an analytical technique introducing label information into an anomaly detection model. Effective utilization of label information is based on introducing the degree of similarity between samples. Assuming, for example, there is a degree of similarity between normally labeled samples and no similarity between normally labeled and abnormally labeled samples. Also each sensor value is generated by the linear sum of a latent variable and a coefficient vector specific to each sensor. However, the magnitude of observation noise is formulated to vary according to the label information for the sensor values, and set so that normal label unlabeled anomalously labeled. A graph Laplacian is created based on the degree of similarity between samples, and determines the optimal linear transformation matrix according to a gradient method. A optimal linear transformation matrix is used to calculate an anomaly score for each sensor in the test samples.
摘要翻译：一种提供将标签信息引入异常检测模型的分析技术的方法。标签信息的有效利用是基于引入样本之间的相似度。例如，假设通常标记的样品之间存在一定程度的相似性，并且在正常标记和异常标记的样品之间没有相似性。此外，每个传感器值由潜变量和每个传感器特有的系数矢量的线性和产生。然而，观察噪声的大小被制定为根据传感器值的标签信息而变化，并且使得正常标签未标记为异常标记。基于样本之间的相似度创建图形拉普拉斯算子，并根据梯度法确定最优线性变换矩阵。最优线性变换矩阵用于计算测试样本中每个传感器的异常分数。

64. 发明申请

US20150260614A1 METHOD AND SYSTEM FOR MONITORING ROAD CONDITIONS 审中-公开
标题翻译：监测道路条件的方法和系统
公开(公告)号：US20150260614A1
公开(公告)日：2015-09-17
申请号：US14436592
申请日：2013-10-18
申请人： Lars FORSLOF
发明人： Lars Forslof
IPC分类号： G01M99/00 , G01B21/30
CPC分类号： G01M99/00 , G01B21/30 , G08G1/0112 , G08G1/0133
摘要： A method for monitoring road conditions includes measuring a vehicle movement quantity associated with a present road condition. A respective position at which the measuring was performed is recorded. A road condition class is assigned to each of the positions by comparison with type calibration data. The type calibration data is pre-defined relations between vehicle movement quantities and road condition classes for a specific type of measuring unit and for a specific type of vehicle. The positions and assigned road condition classes are stored in a road condition database. A consolidated road condition class is determined for a target road section, by forming a distribution of stored road condition classes for positions within the target road section and selecting the consolidated road condition class to be representative for the distribution of road condition classes. The consolidated road condition class for the target road section is presented.
摘要翻译：用于监视道路状况的方法包括测量与当前道路状况相关联的车辆移动量。记录进行测量的各个位置。通过与类型校准数据进行比较，将道路状况等级分配给每个位置。类型校准数据是针对特定类型的测量单元和特定类型的车辆的车辆移动量和道路状况等级之间的预定关系。位置和分配的道路状况等级存储在道路状况数据库中。通过对目标道路区域内的位置形成存储的道路状况等级的分布，并选择合并道路状况等级来代表道路状况等级的分布，确定目标路段的综合道路状况等级。介绍目标路段综合路况等级。

65. 发明申请

US20150260514A1 METHOD TO DETERMINE PHYSICAL PROPERTIES OF THE GROUND 有权
标题翻译：确定地面物理性质的方法
公开(公告)号：US20150260514A1
公开(公告)日：2015-09-17
申请号：US14424803
申请日：2013-08-26
申请人： UNIVERSITÉ DU QUÉBEC A CHICOUTIMI
发明人： Bob-Antoine Jerry Ménélas , Martin Jean-Denis Otis
IPC分类号： G01B21/30 , G01P15/02 , G01V9/00 , A61B5/00 , G01N19/02
CPC分类号： G01B21/30 , A43B3/0005 , A61B5/6807 , G01N19/02 , G01P15/02 , G01V9/00
摘要： The method can determine physical properties of the ground stepped upon by a user wearing a footwear incorporating an accelerometer, and includes: receiving a raw signal from the accelerometer during at least one step being taken by the user on the ground; identifying, in the received raw signal, at least one characteristic signature; associating the at least one characteristic signature to physical properties of the ground; and generating a signal indicating the physical properties based on said association. The generated signal can further be used to advise a user of a risk of falling based on at least the physical properties of the ground.
摘要翻译：该方法可以确定穿戴加有加速度计的鞋类的用户踏上的地面的物理属性，并且包括：在使用者在地面上进行至少一个步骤期间从加速度计接收原始信号; 在所接收的原始信号中识别至少一个特征签名; 将所述至少一个特征签名与所述地面的物理属性相关联; 以及基于所述关联生成指示物理特性的信号。所产生的信号还可以用于至少基于地面的物理特性向使用者提供坠落的风险。

66. 发明授权

US09123582B2 Methods of in-situ measurements of wafer bow 有权
标题翻译：晶圆弓原位测量方法
公开(公告)号：US09123582B2
公开(公告)日：2015-09-01
申请号：US13532097
申请日：2012-06-25
申请人： Andrew D. Bailey, III
发明人： Andrew D. Bailey, III
IPC分类号： H01L21/66 , G01B21/08 , G01B21/20 , G01B21/30
CPC分类号： H01L22/12 , G01B21/08 , G01B21/20 , G01B21/30 , H01L22/20
摘要： Various embodiments describe a method of quantifying bow in a wafer. In one embodiment, the method includes measuring a first plurality of distances from a first sensor to a first surface of the wafer to calculate the bow in the wafer. The first sensor is positioned outside of a set of process modules of the plasma processing system. A determination is made whether the calculated bow of the wafer is within a pre-determined range. If the calculated bow of the wafer is within the pre-determined range, the wafer is moved into a process module of the set of process modules for processing and a recipe for processing the wafer is adjusted based on the calculated bow of the wafer. If the calculated bow of the wafer is outside the pre-determined range, the wafer is removed from the plasma processing system. Other methods are described as well.
摘要翻译：各种实施例描述了在晶片中量化弓的方法。在一个实施例中，该方法包括测量从晶片的第一传感器到第一表面的第一多个距离，以计算晶片中的弓形。第一传感器位于等离子体处理系统的一组处理模块之外。确定晶片的计算弓是否在预定范围内。如果所计算出的晶片的弓轴在预定范围内，则将晶片移动到该组处理模块的处理模块中以进行处理，并且基于所计算出的晶片的弓形来调整用于处理晶片的配方。如果计算出的晶片的弓轴在预定范围之外，则从等离子体处理系统中移除晶片。还描述了其他方法。

67. 发明授权

US09074865B2 Contour and surface texture measuring instrument and contour and surface texture measuring method 有权
标题翻译：轮廓和表面纹理测量仪器和轮廓和表面纹理测量方法
公开(公告)号：US09074865B2
公开(公告)日：2015-07-07
申请号：US14363284
申请日：2012-12-10
申请人： Tokyo Seimitsu Co., Ltd.
发明人： Yasuhiro Yamauchi , Takashi Fujita
IPC分类号： G01B5/20 , G01B21/20 , G01B21/30 , G01B5/28
CPC分类号： G01B5/20 , G01B5/28 , G01B21/20 , G01B21/30
摘要： A contour and surface texture measuring instrument for measuring a contour and surface texture of a surface of a work, which generates a displacement signal having a high resolution and high linearity in a wide measurement range is disclosed, the contour and surface texture measuring instrument having a measurement part having a stylus configured to come into contact with the surface of the work and to change its position vertically, a feed mechanism configured to move the work with respect to the stylus, an arm having the measurement part at one end and configured to transfer a displacement of the stylus to rotate with a pivot, and a differential transformer-type measuring mechanism and a scale-type measuring mechanism attached to the arm or to a position interlocked with the arm and configured to detect a displacement of the stylus.
摘要翻译：公开了一种用于测量工件表面的轮廓和表面纹理的轮廓和表面纹理测量仪器，其在宽测量范围内产生具有高分辨率和高线性度的位移信号，该轮廓和表面纹理测量仪器具有测量部件，其具有构造成与工件的表面接触并且垂直地改变其位置的触针;被配置为相对于触针移动工件的进给机构，具有一端的测量部件并被配置为传送的臂触针与枢轴一起移动的位移，和差分变压器型测量机构以及附接到臂上的或与该臂互锁的位置的刻度型测量机构，并配置成检测触针的位移。

68. 发明申请

US20150121980A1 SHAPING METHOD FOR METALLIC MATRIX 有权
标题翻译：金属矩阵的形状方法
公开(公告)号：US20150121980A1
公开(公告)日：2015-05-07
申请号：US14523196
申请日：2014-10-24
申请人： FU DING ELECTRONICAL TECHNOLOGY (JIASHAN) CO.,LTD. , HON HAI PRECISION INDUSTRY CO., LTD.
发明人： WEI-ZHONG DAI , JIE NI , HU WU
IPC分类号： B21C51/00
CPC分类号： B21D1/00 , B21C51/00 , B21D1/06 , B21D3/02 , G01B21/30
摘要： A metallic matrix shaping method is provided. A flatness of a plurality of points of the metallic matrix is measured by a shape test device, and a flatness margin of error H between a reference level and the flatness of the metallic matrix is calibrated using the least square method. A controller determines whether the points of the metallic matrix need to be shaped by comparing the flatness margin of error H and a permissive error range K. The controller calibrates a descending distance P by a mathematical formula of P=M+[(H−K)/D]/N+L. A shaping device shapes the metallic matrix according to the descending distance P and a shaping time. The above steps are repeated until the flatness of the metal is within the permissive error range K.
摘要翻译：提供了一种金属矩阵成形方法。通过形状测试装置测量金属基体的多个点的平坦度，并且使用最小二乘法校准参考水平和金属基体的平坦度之间的误差H的平坦度裕度。控制器通过比较误差H的平坦度边界和容许误差范围K来确定金属矩阵的点是否需要成形。控制器通过数学公式P = M + [（H-K））校准下降距离P， / D] / N + L。成形装置根据下降距离P和成形时间对金属基体进行成形。重复上述步骤直到金属的平坦度在容许误差范围K内。

69. 发明申请

US20150085300A1 APPARATUS FOR INSPECTING WARPAGE OF SHEET-LIKE MEMBER AND METHOD FOR INSPECTING WARPAGE OF SHEET-LIKE MEMBER 有权
标题翻译：用于检查片状部件的翘曲的装置和用于检查片状部件的翘曲的方法
公开(公告)号：US20150085300A1
公开(公告)日：2015-03-26
申请号：US14402462
申请日：2013-07-22
申请人： Nippon Electric Glass Co., Ltd.
发明人： Tadashi Takahashi
IPC分类号： G01B11/24 , G01B21/20
CPC分类号： G01B11/24 , G01B11/306 , G01B21/20 , G01B21/30
摘要： An apparatus for inspecting warpage of a sheet-like member includes a conveyance device for conveying a glass substrate in a substantially horizontal attitude and a non-contact displacement meter for measuring a distance to a surface of the glass substrate. The apparatus is configured to preset an upper limit waveform and a lower limit waveform based on an ideal waveform of surface shape displacement of the glass substrate in a conveyance direction, which is determined based on a characteristic of the conveyance device; and determine whether or not an actual waveform of the surface shape displacement of the glass substrate in the conveyance direction during conveyance, which is obtained based on the distance measured by the non-contact displacement meter, falls within a range between the upper limit waveform and the lower limit waveform.
摘要翻译：用于检查片状构件的翘曲的装置包括用于以基本上水平的姿态输送玻璃基板的输送装置和用于测量到玻璃基板的表面的距离的非接触位移计。该装置被配置为基于基于输送装置的特性确定的输送方向的玻璃基板的表面形状位移的理想波形来预设上限波形和下限波形，并且确定基于由非接触式位移计测量的距离获得的传送期间玻璃基板在输送方向上的表面形状位移的实际波形是否在上限波形和下限波形。

70. 发明授权

US08973280B2 Method for determining a twist structure 有权
标题翻译：确定扭转结构的方法
公开(公告)号：US08973280B2
公开(公告)日：2015-03-10
申请号：US13096375
申请日：2011-04-28
申请人： Jörg Seewig
发明人： Jörg Seewig
IPC分类号： G01B5/20 , G01L25/00 , G01B5/28 , G01B21/30
CPC分类号： G01B5/28 , G01B21/30
摘要： Method for determining a twist structure in the surface roughness of a workpiece which is cylindrical at least in part includes that multiple sampling segments which extend in the axial direction of the workpiece and which are mutually spaced apart in the circumferential direction are carried out in a surface region of interest on the workpiece, and the value of at least one parameter of the twist structure is determined based on the measured values obtained using the sampling segments. An estimated value of at least one parameter of the twist structure is determined based on the measured values associated with a first sampling segment, the estimated value being corrected based on the measured values associated with at least one second sampling segment.
摘要翻译：用于确定工件表面粗糙度中的扭曲结构的方法至少部分地包括在工件的轴向延伸并且在圆周方向上相互间隔开的多个采样段，在表面基于使用采样段获得的测量值来确定扭转结构的至少一个参数的值。基于与第一采样段相关联的测量值来确定扭转结构的至少一个参数的估计值，该估计值基于与至少一个第二采样段相关联的测量值来校正。

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