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    • 61. 发明授权
    • Cold rolled steel sheet and method of making
    • 冷轧钢板及其制造方法
    • US6027581A
    • 2000-02-22
    • US935600
    • 1997-09-23
    • Kazunori OsawaMasahiko MoritaOsamu FurukimiTakashi Obara
    • Kazunori OsawaMasahiko MoritaOsamu FurukimiTakashi Obara
    • C21D8/04C21D9/48C22C38/00C22C38/06C22C38/14
    • C21D8/0426C21D9/48C22C38/001C22C38/06C22C38/14
    • Cold rolled steel sheet with excellent deep drawability and excellent anti-aging properties, and manufacturing method. The cold rolled steel sheet comprises about C: above 0.015 to 0.150 wt %, Si: 1.0 wt % or less, Mn: 0.01 to 1.50 wt %, P: 0.10 wt % or less, S: 0.003 to 0.050 wt %, Al: 0.001 to below 0.010 wt %, N: 0.0001 to 0.0050 wt %, Ti: 0.001 wt % or more and Ti(wt %)/[1.5.times.S(wt %)+3.4.times.N(wt %)].ltoreq.about 1.0 and B: about 0.0001 to 0.0050 wt %, during annealing, grain growth is improved; Ti is added to form a nitride and a sulfide to avoid precipitation of fine TiC; B is added to precipitate Boron precipitates (Fe.sub.2 B, Fex(C,B)y) in a cooling the hot rolled steel sheet and in cooling step during annealing after cold rolling; a spherical cementite is precipitated and grown in which the Boron series precipitate is a precipitation site.
    • 具有优异的深冲性和优异的抗老化性能的冷轧钢板及其制造方法。 冷轧钢板的C:大于0.015〜0.150重量%,Si:1.0重量%以下,Mn:0.01〜1.50重量%,P:0.10重量%以下,S:0.003〜0.050重量%,Al: 0.001〜0.010重量%,N:0.0001〜0.0050重​​量%,Ti:0.001重量%以上,Ti(重量%)/ [1.5×S(重量%)+ 3.4×N(重量%)] B:约0.0001〜0.0050重​​量%,退火时晶粒生长提高; 添加Ti以形成氮化物和硫化物以避免细小TiC的沉淀; 加入B以冷却热轧钢板并在冷轧后退火时的冷却步骤中沉淀硼析出物(Fe2B,Fex(C,B)y) 析出并生长球状渗碳体,其中硼系沉淀是沉淀点。
    • 65. 发明授权
    • Semiconductor memory device having diagnostic circuit for comparing
multi-bit read-out test data signal with multi-bit write-in test data
signal stored in serial-input shift register
    • 具有用于将多位读出测试数据信号与存储在串行输入移位寄存器中的多位写入测试数据信号进行比较的诊断电路的半导体存储器件
    • US5406566A
    • 1995-04-11
    • US139717
    • 1993-10-22
    • Takashi Obara
    • Takashi Obara
    • G11C29/00G01R31/28G11C29/32G11C29/34G11C29/38
    • G11C29/32G11C29/38
    • A dynamic random access memory device is subjected to a diagnosis upon completion of fabrication to see whether or not a defective memory cell is incorporated in memory cell sub-arrays, one of the input/output data buffer circuits incorporated therein transfers test bits in serial to a shift register which in turn transfers the test bits in parallel to data line pairs for writing the test bits into the memory cell sub-arrays, and a comparator compares the test bits read out from the memory cell sub-arrays with the test bit stored in the shift register for producing a diagnostic signal indicative of consistence or inconsistence between the test bits read out from the memory cell sub-arrays and the test bits in the shift register, thereby allowing an external diagnostic system with data pins less than the input/output data buffer circuits to carry out the diagnosis.
    • 动态随机存取存储器件在完成制造后进行诊断,以查看存储单元子阵列中是否存在有缺陷的存储单元,其中并入的输入/输出数据缓冲电路之一将测试位串联传送到 移位寄存器又将测试位并行地传送到用于将测试位写入存储单元子阵列的数据线对,并且比较器将从存储单元子阵列读出的测试位与存储的测试位进行比较 在移位寄存器中用于产生指示从存储器单元子阵列读出的测试位与移位寄存器中的测试位之间的一致性或不一致性的诊断信号,从而允许外部诊断系统的数据引脚小于输入/ 输出数据缓冲电路进行诊断。