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    • 67. 发明授权
    • Semiconductor light emitting element and its manufacturing method
    • 半导体发光元件及其制造方法
    • US06399963B2
    • 2002-06-04
    • US09800642
    • 2001-03-06
    • Hideto SugawaraMasayuki Ishikawa
    • Hideto SugawaraMasayuki Ishikawa
    • H01L3300
    • H01L33/007H01L21/02389H01L21/0242H01L21/02458H01L21/02502H01L21/0254H01L21/0262H01S5/32341
    • When a plurality of semiconductor layers including a nitride compound layer containing indium are stacked on a substrate, materials of layers above the indium containing nitride compound layer are limited to specific compounds, or their growth temperatures are limited within a predetermined range, to suppress thermal deterioration of the nitride compound layer containing indium or deterioration of the interface and to thereby grow a high-quality semiconductor light emitting element using nitride compound semiconductors. When manufacturing a nitride compound semiconductor light emitting element having a first layer made of a first nitride compound semiconductor containing indium and a second layer stacked on the first layer, conditions for stacking the second layer are selected those inside a closed region defined by connecting points plotted at x and y coordinates (364, 600), (364, 1010), (550, 1010), (650, 600) and (364, 600) on a graph taking emission wavelengths based on band-to-band transition of the first layer in nanometer on the x axis and taking growth temperatures of the second layer in ° C. on the y axis. Thus, a high-performance light emitting element can be made without inviting thermal deterioration of the first layer.
    • 当包含含有铟的氮化物化合物层的多个半导体层堆叠在基板上时,含铟氮化物层以上的层的材料被限制在特定化合物上,或者它们的生长温度被限制在预定范围内,以抑制热劣化 的含有铟的氮化物化合物层或界面的劣化,从而使用氮化物半导体生长高品质的半导体发光元件。 当制造具有由包含铟的第一氮化物化合物半导体制成的第一层的氮化物半导体发光元件和堆叠在第一层上的第二层时,选择堆叠第二层的条件是在由连接点绘制的闭合区域内的条件 在图形上的x和y坐标(364,600),(364,1010),(550,1010),(650,600)和(364,600)上,取图表示基于波段的带 - 带转换的发射波长 在x轴上以纳米为单位的第一层,并且在y轴上以°C取第二层的生长温度。 因此,可以在不引起第一层的热劣化的情况下制造高性能的发光元件。
    • 68. 发明授权
    • Semiconductor light emitting device
    • 半导体发光器件
    • US06191439B1
    • 2001-02-20
    • US09351897
    • 1999-07-13
    • Hideto Sugawara
    • Hideto Sugawara
    • H01L3300
    • H01L33/32H01L33/14H01L33/38
    • An object of the present invention is to provide a semiconductor light emitting device that an emission efficiency is high and it is possible to emit lights at an ultraviolet wave length. The semiconductor light emitting device according to the present invention is constituted by laminating a buffer layer, an n-GaN contact layer, a clad layer including n-AlGaN, a GaN active layer, a clad layer including p-AlGaN, and a p-GaN contact layer on a sapphire substrate. Each portion of the clad layer including n-AlGaN, the GaN active layer 5, the clad layer including p-AlGaN, and the p-GaN contact layer is eliminated by etching; as a result, the n-GaN contact layer 3 is exposed. Next, An n-side electrode for current injection is formed on the n-GaN contact layer 3. Next, an n-GaN current block layer 9 is formed on a portion of an upper face of the p-GaN contact layer 7. Next, a p-side electrode for current injection is formed on upper faces of the p-GaN contact layer and the n-GaN current block layer. The GaN active layer is set to a thickness equal to or more than 50 nm. An current injection area injected via the electrode for current injection is set equal to or less than 5×10−4 cm2.
    • 本发明的目的是提供一种发射效率高并且可以以紫外线波长发光的半导体发光器件。 根据本发明的半导体发光器件通过层叠缓冲层,n-GaN接触层,包含n-AlGaN的覆盖层,GaN有源层,包括p-AlGaN的覆层和p- 蓝宝石衬底上的GaN接触层。 通过蚀刻来消除包括n-AlGaN,GaN有源层5,包层p-AlGaN和p-GaN接触层的包层的每个部分。 结果,露出n-GaN接触层3。 接下来,在n-GaN接触层3上形成用于电流注入的n侧电极。接下来,在p-GaN接触层7的上表面的一部分上形成n-GaN电流阻挡层9。 在p-GaN接触层和n-GaN电流阻挡层的上表面上形成用于电流注入的p侧电极。 GaN活性层的厚度设定为50nm以上。 通过电极注入的电流注入区域设定为5×10 -4 cm 2以下。
    • 69. 发明授权
    • Nitride compound semiconductor light emitting element and its
manufacturing method
    • 氮化物半导体发光元件及其制造方法
    • US5981977A
    • 1999-11-09
    • US110834
    • 1998-07-06
    • Chisato FurukawaHideto SugawaraMasayuki IshikawaNobuhiro Suzuki
    • Chisato FurukawaHideto SugawaraMasayuki IshikawaNobuhiro Suzuki
    • H01L33/12H01L33/14H01L33/32H01L33/44H01S5/00H01S5/227H01S5/323H01L33/00
    • H01L33/32H01L33/007H01S5/227H01S5/2272H01S5/32341
    • A nitride compound semiconductor light emitting element comprises a substrate, a nitride compound semiconductor n-type layer, a mask layer having a predetermined opening, a nitride compound semiconductor buffer layer epitaxially grown on said n-type layer exclusively at said opening. The buffer layer has a recess on its top face so that a thickness of said buffer layer is thinner above a central portion of the opening and thicker above edge portions of the opening. A nitride compound semiconductor active layer is selectively formed on the recess of the buffer layer to be thicker at the central portion of the recess and thinner at the edges of the recess. A nitride compound semiconductor burying layer overlays the mask layer and the active layer to cover the active layer. By selectively growing the buffer layer and the active layer in the opening of the mask layer formed on the substrate and by growing additional layers to bury the entire structure and to flatten the surface, a planar-type, stripe-buried structure is realized. The active layer has a distribution of refractive index due to the distribution of thickness resulting from the selective growth and can confine light with high efficiency. Additionally, by using an insulation film, highly efficient confinement of current is realized to provide a light emitting element for a shorter wavelength with a high luminous intensity and a low oscillation threshold value.
    • 氮化物半导体发光元件包括衬底,氮化物化合物半导体n型层,具有预定开口的掩模层,仅在所述开口处在所述n型层上外延生长的氮化物化合物半导体缓冲层。 缓冲层在其顶面上具有凹部,使得所述缓冲层的厚度在开口的中心部分上方更薄,并且在开口的边缘部分较厚。 在缓冲层的凹部上选择性地形成氮化物化合物半导体活性层,使其在凹部的中央部较厚,在凹部的边缘处变薄。 氮化物化合物半导体掩埋层覆盖掩模层和有源层以覆盖有源层。 通过在衬底上形成的掩模层的开口中选择性地生长缓冲层和活性层,并且通过生长附加层以埋入整个结构并使表面变平,实现了平面型条纹埋层结构。 活性层由于选择性生长导致的厚度分布而具有折射率分布,并且可以高效地限制光。 此外,通过使用绝缘膜,实现电流的高效限制,以提供具有高发光强度和低振荡阈值的较短波长的发光元件。