专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

61. 发明授权

US4641962A Aberration measuring method 失效
标题翻译：畸变测量方法
公开(公告)号：US4641962A
公开(公告)日：1987-02-10
申请号：US496208
申请日：1983-05-19
申请人： Tetsuo Sueda , Minoru Yoshii
发明人： Tetsuo Sueda , Minoru Yoshii
IPC分类号： G01M11/02 , G01B9/00
CPC分类号： G01M11/0264
摘要： In aberration measurement, a light beam from a light source provided at the image plane position of a lens to be examined is caused to enter the lens to be examined, the light beam passed through the lens to be examined, is separated into a plurality of light rays in a plane perpendicular to a principal ray or in a plane perpendicular to the optical axis of the lens to be examined, and the position of each light beam is detected at a position which is spaced apart from a position optically conjugate with said image plane position with respect to the lens to be examined and at which the plurality of light rays can be separated from one another.
摘要翻译：在像差测量中，使来自设在被检查透镜的像面位置处的来自光源的光束进入待检查的透镜，通过待检查的透镜的光束被分离成多个在垂直于主光线的垂直于待检查透镜的光轴的平面中的光线和每个光束的位置在与与所述图像光学共轭的位置间隔开的位置处被检测相对于待检查的镜片的平面位置，并且多个光线可以彼此分离。

IPRDB