专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

61. 发明授权

US5973493A Test tray positioning stopper mechanism for automatic handler 失效
标题翻译：测试盘定位止动机构，用于自动处理
公开(公告)号：US5973493A
公开(公告)日：1999-10-26
申请号：US725377
申请日：1996-10-03
申请人： Hiroto Nakamura , Makoto Sagawa , Yoshihito Kobayashi
发明人： Hiroto Nakamura , Makoto Sagawa , Yoshihito Kobayashi
IPC分类号： G01R31/26 , B23Q7/14 , B23Q16/00 , B65G47/88 , G01R31/02 , G01R31/28
CPC分类号： B23Q7/1447 , B23Q16/001 , G01R31/2851 , G01R31/2893
摘要： A mechanism for positioning IC devices to be tested aligned in a test tray of an automatic handler for an IC test system capable of reducing a time for transferring the test tray from a supply area to a test head area which has a plurality of test contactors and from a test head area to a discharge area is disclosed. The mechanism includes a stopper which determines the first stop position of the test tray when said test tray contacts with the outer surface of the test tray and the second stop position of the test tray when said stopper contacts with the end surface of a groove being provided with on its side portion of the test tray to receive and engage with the projection of the stopper. The distance between the adjacent test contactors is adjusted to be equal to two times or integer multiple of the distance between the adjacent IC devices to be tested aligned in the test tray and the distance between the first position and the second position is adjusted to be equal to the distance between the adjacent IC devices to be tested so that minimizing the index time for transferring the test tray becomes possible.
摘要翻译：一种用于将待测试的IC器件定位在用于IC测试系统的自动处理器的测试盘中的机构，其能够减少用于将测试托盘从供应区域传送到具有多个测试接触器的测试头区域的时间，以及从测试头区域到放电区域被公开。所述机构包括：当所述止动件与所述槽的端面接触时，所述止动件确定所述测试托盘与所述测试托盘的外表面和所述测试托盘的第二停止位置接触时所述测试托盘的第一停止位置其在其测试托盘的侧部接收并接合止动器的突起。将相邻的测试接触器之间的距离调整为等于测试托盘中待测试的相邻IC器件之间距离的两倍或整数倍，并将第一位置与第二位置之间的距离调整为相等到待测试的相邻IC器件之间的距离，使得最小化传送测试托盘的索引时间成为可能。

62. 发明授权

US5772387A Device transfer apparatus and device reinspection method for IC handler 失效
标题翻译： IC处理程序的设备传送设备和设备重新检测方法
公开(公告)号：US5772387A
公开(公告)日：1998-06-30
申请号：US497223
申请日：1995-06-30
申请人： Hiroto Nakamura , Yoshihito Kobayashi , Katsuhiko Suzuki
发明人： Hiroto Nakamura , Yoshihito Kobayashi , Katsuhiko Suzuki
IPC分类号： G01R31/01 , G01R31/28 , H01L21/00 , H05K13/08 , B65B21/02
CPC分类号： H01L21/67271 , G01R31/2851 , G01R31/2893 , H05K13/08 , G01R31/01
摘要： An IC transfer system can be used in conjunction with either a tray type magazine or a rod-shaped magazine. A device reinspection method in the IC test handler reinspects the DUT stored in the magazine without human intervention, sorts in accordance with the test results, and stores in the magazine and the customer tray. For this purpose, a tray supply section transfers a user tray (170) to a test tray (180), whereas a magazine supply section (152) and a pick carrier section (112) transfer a rod-shaped magazine (150) to the test tray (180). An inspection setting sets the number of reinspections, the classification of inspection results, and the storage tray/magazine. The DUT (215) is loaded (203) from the magazine to the test tray (180) and is tested (204). After testing (204), a judgement is made whether or not the reinspection mode is effective. If the reinspection mode is effective, the DUT (215) to be reinspected are all stored (206) in the unloader section (223) , and transferred (207) to the loader section (222) using the tray transfer system (227). When the reinspection mode is completed, the DUT (215) is sorted by the category and stored (212) , and the testing is completed (213).
摘要翻译： IC传输系统可以与托盘型杂志或棒状杂志一起使用。 IC测试处理器中的器件重新检查方法重新检查储存在杂志中的DUT，无需人为干预，按照测试结果进行排序，并存储在杂志和客户托盘中。为此目的，托盘供应部分将用户托盘（170）传送到测试托盘（180），而料盒供应部分（152）和拾取托架部分（112）将棒形盒（150）转移到测试盘（180）。检查设置设置回访次数，检查结果分类和存储托盘/杂志。 DUT（215）从盒装载（203）到测试托盘（180）并经过测试（204）。测试（204）后，判断再检测模式是否有效。如果重新检查模式有效，则要重新检查的DUT（215）全部被存储在卸载器部分（223）中，并且使用托盘传送系统（227）传送到加载器部分（222）。当重新检查模式完成时，DUT（215）按类别排序并存储（212），测试完成（213）。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式