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    • 63. 发明申请
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US20060061395A1
    • 2006-03-23
    • US10542727
    • 2003-01-20
    • Takayuki NotoTomoru SatoHiroyuki Yamauchi
    • Takayuki NotoTomoru SatoHiroyuki Yamauchi
    • H03B1/00
    • H04L25/0278H03K5/086H03K17/08142H03K17/164H03K17/167H03K19/0005H04L25/0292
    • A semiconductor integrated circuit includes an input circuit for taking in signals and an output circuit for outputting signals. The input circuit is so set that the input impedance during input signal transition is lower than the input impedance on other occasions than input signal transition. The output circuit is so set that the driving force during the second half of signal transition is lower than the driving force during the first half of transition. Such setting that the input impedance during input signal transition is lower than the input impedance on other occasions than input signal transition reduces reflected waves during input signal transition. Such setting that the driving force during the second half of signal transition is lower than the driving force during the first half of transition suppresses production of reflected waves during the second half of signal transition. Thus, the necessity for external components, such as damping resistors and terminator resistors, for impedance matching is obviated.
    • 半导体集成电路包括用于接收信号的输入电路和用于输出信号的输出电路。 输入电路设置为输入信号转换期间的输入阻抗低于输入信号转换时的输入阻抗。 输出电路被设定为使得信号转换的后半段的驱动力低于转换前半部分的驱动力。 在输入信号转换期间,输入信号转换期间的输入阻抗比其他情况下的输入阻抗低于输入信号转换的设置会降低输入信号转换期间的反射波。 在信号转换的后半期间的驱动力比转换的前半部分的驱动力低的设定在信号转换的后半期间抑制了反射波的产生。 因此,消除了用于阻抗匹配的诸如阻尼电阻器和终端电阻器的外部组件的必要性。
    • 65. 发明申请
    • Mask ROM
    • 面具ROM
    • US20050254280A1
    • 2005-11-17
    • US11121135
    • 2005-05-04
    • Hiroyuki Yamauchi
    • Hiroyuki Yamauchi
    • G11C17/12G11C17/00H01L21/8246H01L27/112
    • G11C17/12H01L27/112
    • A mask ROM includes bit lines, word lines intersecting with the bit lines and bit cells provided along the word lines, each of the bit lines being formed of a cell transistor having a gate connected to an associated one of the word lines. In the mask ROM, further provided is a source node commonly connected to respective sources of ones of the cell transistors having a gate connected to one of adjacent two word lines. A current flows from a selected bit line to a non-selected bit line via a cell transistor selected in reading out data and the source node.
    • 掩模ROM包括位线,与位线相交的字线和沿着字线提供的位单元,每个位线由具有连接到相关联的字线之一的栅极的单元晶体管形成。 在掩模ROM中,进一步提供了一个源节点,其通常连接到具有连接到相邻两个字线中的一个的栅极的一个单元晶体管的各个源极。 A电流通过在读出数据和源节点中选择的单元晶体管从选定的位线流向未选择的位线。
    • 69. 发明授权
    • Programmed value determining circuit, semiconductor integrated circuit device including the same, and method for determining programmed value
    • 编程值确定电路,包括其的半导体集成电路器件以及用于确定编程值的方法
    • US06728148B2
    • 2004-04-27
    • US10232785
    • 2002-08-28
    • Hiroyuki Yamauchi
    • Hiroyuki Yamauchi
    • G11C700
    • G11C17/143G11C17/14G11C17/18
    • A programmed value determining circuit is provided in which both the area of the programmable element and the leak current are reduced. During the first period after power is turned on, both the PMOS transistor Qp1 and the NMOS transistor Qn1 are turned off, and the storage node is disconnected from the power line VDD and the ground line VSS. During the second period after the first period, at least the NMOS transistor Qn1 is turned on, the storage node is connected to the ground line VSS via the program element 10, and the state of the storage node is detected by the detecting portion 11. During the third period after the second period, the PMOS transistor Qp1 and the NMOS transistor Qn1 are turned off, and the state of the storage node is held by the latch portion 12.
    • 提供了编程值确定电路,其中可编程元件的面积和漏电流均减小。 在电源接通之后的第一时段期间,PMOS晶体管Qp1和NMOS晶体管Qn1都截止,并且存储节点与电源线VDD和接地线VSS断开。 在第一时段之后的第二周期期间,至少NMOS晶体管Qn1导通,存储节点经由编程元件10连接到接地线VSS,并且由检测部分11检测存储节点的状态。 在第二周期之后的第三周期期间,PMOS晶体管Qp1和NMOS晶体管Qn1截止,存储节点的状态由锁存部12保持。
    • 70. 发明授权
    • SRAM device
    • US06373759B1
    • 2002-04-16
    • US09823102
    • 2001-03-30
    • Hiroyuki Yamauchi
    • Hiroyuki Yamauchi
    • G11C700
    • An SRAM device includes: a plurality of normal memory blocks each including N normal memory cells for storing data, wherein N is a natural number; a spare memory block including one or more spare memory cells for storing data; a defective block setting section for storing first defective block information indicating a normal memory block including a defective normal memory cell among the plurality of normal memory blocks; N internal data lines which are respectively coupled to the N normal memory cells included in each of the plurality of normal memory blocks, where the N internal data lines are used for reading data stored in the N normal memory cells included in one of the plurality of normal memory blocks which is designated by access information, wherein the access information is externally input to the SRAM device; one or more spare data lines coupled to the spare memory block for reading data from the one or more spare memory cells included in the spare memory block; N external data lines via which the SRAM device outputs the data; and a coupling circuit for, depending on whether or not the first defective block information matches the access information, either coupling those of the N internal data lines which are not coupled to a defective normal memory cell in the normal memory block indicated by the first defective block information and at least one of the one or more spare data lines to the N external data lines, or coupling the N internal data lines to the N external data lines.