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    • 66. 发明申请
    • Method of Programming a Memory
    • 存储器编程方法
    • US20110085380A1
    • 2011-04-14
    • US12970222
    • 2010-12-16
    • Wen-Chiao HoChin-Hung ChangKuen-Long ChangChun-Hsiung Hung
    • Wen-Chiao HoChin-Hung ChangKuen-Long ChangChun-Hsiung Hung
    • G11C16/10G11C16/04G11C16/34
    • G11C16/10G11C11/5628G11C16/0483G11C16/3454G11C2211/5621G11C2211/5642
    • A method of programming a memory, wherein the memory includes many memory regions having multiple multi-level cells. Each memory region includes a first bit line, a second bit line, a data buffer and a protecting unit. The protecting unit, coupled to the first and second bit lines, and the data buffer, prevents a programming error from occurring. In an embodiment of the programming method, corresponding data are inputted to the data buffers respectively. The data corresponding to an nth phase are programmed into the targeted multi-level cells. Data corresponding to an (n+1)th phase is modified to make the data corresponding to the (n+1)th phase be the same as the data corresponding to the nth phase if the targeted multi-level cells pass a programming verification process according to an nth programming verification voltage. The above steps are repeated until n is equal to a maximum, n being a positive integer.
    • 一种对存储器进行编程的方法,其中所述存储器包括具有多个多电平单元的许多存储区域。 每个存储器区域包括第一位线,第二位线,数据缓冲器和保护单元。 耦合到第一和第二位线的保护单元和数据缓冲器防止编程错误发生。 在编程方法的实施例中,对应的数据分别输入到数据缓冲器。 对应于第n阶段的数据被编程到目标多级单元中。 修改对应于第(n + 1)个相位的数据,以使对应于第(n + 1)相的数据与对应于第n相的数据相同,如果目标多电平单元通过编程验证处理 根据第n个编程验证电压。 重复上述步骤直到n等于最大值,n为正整数。