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    • 65. 发明申请
    • On-die real time leakage energy meter
    • 片上实时泄漏电能表
    • US20070001694A1
    • 2007-01-04
    • US11173147
    • 2005-06-30
    • Sanjeev JahagirdarJose AllareyVarghese George
    • Sanjeev JahagirdarJose AllareyVarghese George
    • G01R31/02
    • G01R31/2891G01R21/02
    • A method includes measuring a temperature for a portion of an electronic component, determining the voltage being applied to the portion of the component, and determining a leakage power for the component portion based on a measured temperature and determined voltage for the portion of the component. The method also includes measuring a temperature for another portion of the component, determining the voltage being applied to the other component portion, and determining a leakage power for the other component portion based on the measured temperature and determined voltage for the other portion of the component. The method also includes summing the leakage power for the portion with the leakage power for the other portion of the component.
    • 一种方法包括测量电子部件的一部分的温度,确定施加到部件的该部分的电压,并且基于部件的该部分的测量温度和确定的电压来确定部件部分的泄漏功率。 该方法还包括测量部件的另一部分的温度,确定施加到另一部件部分的电压,以及基于所测量的温度和组件的其它部分的确定电压来确定另一部件部分的泄漏功率 。 该方法还包括对具有部件的其他部分的泄漏功率的部分的泄漏功率求和。