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    • 70. 发明授权
    • Method for self-calibration of a microscope apparatus
    • 显微镜装置的自校准方法
    • US09471984B2
    • 2016-10-18
    • US14132086
    • 2013-12-18
    • Leica Microsystems (Schweiz) AG
    • Reto ZuestMeinrad Berchtel
    • G06T7/00G01B9/04G01B11/02G01B11/14G02B21/36G02B21/02
    • G06T7/0044G01B9/04G01B11/02G01B11/14G02B21/025G02B21/365G06T7/74
    • A method for calibrating a microscope apparatus (1) having a variable optical magnification system (13) and a detector device (12) is disclosed. First, a calibrating mode is performed, wherein an image (50) of an object (10) is captured at a known reference magnification value, two characteristic reference points (32a, 32b) are determined in the image, a reference distance (34) between the two reference points is determined, and a correlation is determined between the reference distance and the reference magnification value. Later, a measuring mode is implemented, in which a current image (51) of the object (10) is captured at a second magnification value, the two characteristic reference points (52a, 52b) are identified therein, a current distance (54) between the current reference points is determined, and the second magnification value is determined from the current distance (54) based on the correlation between the reference distance (34) and the reference magnification value.
    • 公开了一种用于校准具有可变光学放大系统(13)和检测器装置(12)的显微镜装置(1)的方法。 首先,执行校准模式,其中以已知的参考倍率值捕获对象(10)的图像(50),在图像中确定两个特征参考点(32a,32b),参考距离(34) 确定两个参考点之间,并且在参考距离和参考倍率值之间确定相关性。 之后,实现了以第二倍率值捕获对象(10)的当前图像(51)的两个特征参考点(52a,52b)的测量模式,当前距离(54) 确定当前参考点之间,并且基于参考距离(34)和参考倍率值之间的相关性,从当前距离(54)确定第二倍率值。