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51. 发明申请

US20120134473A1 Time of Flight Backscatter Imaging System 有权
标题翻译：飞行时间反向散射成像系统
公开(公告)号：US20120134473A1
公开(公告)日：2012-05-31
申请号：US12959356
申请日：2010-12-02
申请人： Edward James Morton
发明人： Edward James Morton
IPC分类号： G01N23/201
CPC分类号： G01V5/0025 , G01N23/203 , G01V5/0008 , G01V5/0033 , G21K1/043
摘要： The present application discloses an X-ray imaging apparatus for determining a surface profile of an object under inspection that is positioned at a distance from the apparatus. The X-ray imaging system has an X-ray source for producing a scanning beam of X-rays directed toward the object, a detector assembly for providing a signal representative of an intensity of X-rays backscattered from the object, and processing circuitry to determine a time difference between when the X-ray source is switched on and when the backscattered X-rays arrive at the detector assembly. The processing circuitry is adapted to output data representative of the surface profile of the object under inspection.
摘要翻译：本申请公开了一种用于确定被检查物体的表面轮廓的X射线成像装置，其位于距离该装置一定距离处。 X射线成像系统具有用于产生朝向物体的X射线的扫描光束的X射线源，用于提供表示从物体反向散射的X射线的强度的信号的检测器组件，以及处理电路确定当X射线源接通时和反向散射X射线到达检测器组件时的时间差。处理电路适于输出表示检查对象的表面轮廓的数据。

52. 发明申请

US20120087473A1 SURFACE MICROSTRUCTURE MEASUREMENT METHOD, SURFACE MICROSTRUCTURE MEASUREMENT DATA ANALYSIS METHOD AND X-RAY SCATTERING MEASUREMENT DEVICE 有权
标题翻译：表面微结构测量方法，表面微结构测量数据分析方法和X射线散射测量装置
公开(公告)号：US20120087473A1
公开(公告)日：2012-04-12
申请号：US13264222
申请日：2010-04-12
申请人： Kazuhiko Omote , Yohiyasu Ito
发明人： Kazuhiko Omote , Yohiyasu Ito
IPC分类号： G01N23/201 , G01B15/04
CPC分类号： G01B15/04
摘要： There is provided a surface microstructure measurement method, a surface microstructure measurement data analysis method, and an X-ray scattering measurement device which can accurately measure a microstructure on a surface and which can evaluate a three-dimensional structural feature. In the surface microstructure measurement method, the specimen surface is irradiated with X-ray at a grazing incident angle and a scattering intensity is measured; a specimen model with a microstructure on a surface in which one or more layers is formed in a direction perpendicular to the surface and unit structures are periodically arranged in a direction parallel to the surface within the layers is assumed; a scattering intensity of X-ray scattered by the microstructure is calculated in consideration of effects of refraction and reflection caused by the layer; and the scattering intensity of X-ray calculated by the specimen model is fitted to the measured scattering intensity. Then, as a result of the fitting, an optimum value of a parameter for specifying the shape of the unit structures is determined. Therefore, it is possible to accurately measure a microstructure.
摘要翻译：提供了可以精确地测量表面上的微结构并且可以评估三维结构特征的表面微结构测量方法，表面微结构测量数据分析方法和X射线散射测量装置。在表面微结构测定方法中，以放射入射角对X射线照射试样表面，测定散射强度; 在垂直于表面的方向上形成一个或多个层的表面上的微结构的样本模型和单元结构在与层内的表面平行的方向上周期性地布置; 考虑到由该层引起的折射和反射的影响，计算由微结构散射的X射线的散射强度; 并且通过样本模型计算的X射线的散射强度适合于测量的散射强度。然后，作为拟合的结果，确定用于指定单位结构的形状的参数的最佳值。因此，可以精确地测量微结构。

53. 发明授权

US08149988B2 Use of nearly monochromatic and tunable photon sources with nuclear resonance fluorescence in non-intrusive inspection of containers for material detection and imaging 有权
标题翻译：使用具有核共振荧光的近似单色和可调谐光子源进行非侵入式检查容器进行材料检测和成像
公开(公告)号：US08149988B2
公开(公告)日：2012-04-03
申请号：US12731695
申请日：2010-03-25
申请人： William Bertozzi , Robert J. Ledoux
发明人： William Bertozzi , Robert J. Ledoux
IPC分类号： G01N23/04 , G01N23/201
CPC分类号： G01N23/20066 , G01N23/223 , G01N2223/076
摘要： Methods and systems for detecting potential items of interest in target samples, using nuclear resonance fluorescence, utilize incident photon spectra that are narrower than traditional bremsstrahlung spectra but overlap nuclear resonances in elements of interest for purposes of detection, such as but not limited to the detection of threats in luggage or containers being scanned.
摘要翻译：用于使用核共振荧光检测目标样品中的潜在目标项目的方法和系统利用比传统的bre致辐射谱更窄的入射光子光谱，但重叠感兴趣元素中的核共振用于检测目的，例如但不限于检测正在扫描的行李或容器中的威胁。

54. 发明授权

US08122097B2 System, method and computer program for recipient controlled communications 有权
标题翻译：收件人控制通信的系统，方法和计算机程序
公开(公告)号：US08122097B2
公开(公告)日：2012-02-21
申请号：US13083277
申请日：2011-04-08
申请人： Daniel Gross , Erwin Gross
发明人： Daniel Gross , Erwin Gross
IPC分类号： G06F15/16 , G01N23/201
CPC分类号： H04L51/22 , H04L51/00 , H04L51/18
摘要： A communication system is provided in which users associate handling data identifying how messages are to be processed with contact data. Handling data for the identified contacts in the contact data is then dispatched to those contacts. Subsequently when messages are dispatched from the locations identified by the contact data a sender of a message selects handling data to be associated with a message being dispatched. Upon receipt of a message associated with handling data the message is then processed in the manner identified by the handling data.
摘要翻译：提供了一种通信系统，其中用户将识别消息的处理数据与联系人数据相关联。然后将联系人数据中识别的联系人的数据处理到这些联系人。随后，当从由联系人数据标识的位置发送消息时，消息的发送者选择与要分派的消息相关联的处理数据。在接收到与处理数据相关联的消息时，以处理数据标识的方式处理该消息。

55. 发明申请

US20120008747A1 DIFFERENTIAL PHASE-CONTRAST IMAGING WITH CIRCULAR GRATINGS 有权
标题翻译：具有圆形光栅的差分相位对比成像
公开(公告)号：US20120008747A1
公开(公告)日：2012-01-12
申请号：US13260380
申请日：2010-03-15
申请人： Ewald Roessl , Thomas Koehler , Gerhard Martens
发明人： Ewald Roessl , Thomas Koehler , Gerhard Martens
IPC分类号： G01N23/201 , G01N23/04
CPC分类号： G21K7/00 , A61B6/4291 , A61B6/484 , A61B6/502
摘要： The invention relates to an X-ray differential phase-contrast imaging system which has three circular gratings. The circular gratings are aligned with the optical axis of the radiation beam and a phase stepping is performed along the optical axis with the focal spot, the phase grating and/or the absorber grating. The signal measured is the phase-gradient in radial direction away from the optical axis.
摘要翻译：本发明涉及一种具有三个圆形光栅的X射线差分相位对比成像系统。圆形光栅与辐射束的光轴对准，并且沿着光轴与焦斑，相位光栅和/或吸收光栅一起执行相位步进。测量的信号是远离光轴的径向相位梯度。

56. 发明申请

US20120002788A1 ARTICLE INSPECTION DEVICE AND INSPECTION METHOD 有权
标题翻译：文章检查设备和检查方法
公开(公告)号：US20120002788A1
公开(公告)日：2012-01-05
申请号：US13142511
申请日：2010-12-29
申请人： Yigang Yang , Tiezhu Li , Qinjian Zhang , Yi Zhang , Yingkang Jin , Qinghao Chen , Yuanjing Li , Yinong Liu
发明人： Yigang Yang , Tiezhu Li , Qinjian Zhang , Yi Zhang , Yingkang Jin , Qinghao Chen , Yuanjing Li , Yinong Liu
IPC分类号： G01N23/201
CPC分类号： G01V5/0025
摘要： The present invention discloses an article inspection device, comprising: a x-ray machine, a collimation unit, a transmission detector array and at least one scattering detector array. Each of the at least one scattering detector array comprising a plurality of same scattering detector modules arranged in a matrix of i-rows and j-columns. A transmission cross section of the article transmitted by the x-rays is divided into a plurality of same sub-regions arranged in a matrix of i-rows and j-columns. The plurality of scattering detector modules arranged in i-rows and i-columns correspond to the plurality of sub-regions arranged in i-rows and j-columns one by one for detecting pair production effect annihilation photons and Compton-effect scattering photons from the respective sub-regions. Obtaining atomic numbers of the respective sub-regions based on a ratio of the pair production effect annihilation photon count to the Compton-effect scattering photon count, so as to form a three-dimensional image of the article. In addition, the present invention further discloses an article inspection method.
摘要翻译：本发明公开了一种物品检查装置，包括：x射线机，准直单元，透射检测器阵列和至少一个散射检测器阵列。所述至少一个散射检测器阵列中的每一个包括以i行和j列的矩阵排列的多个相同的散射检测器模块。通过X射线透射的物品的透射截面被划分成以i行和j列的矩阵排列的多个相同的子区域。布置在i行和i列中的多个散射检测器模块对应于一排一列地排列在i行和j列中的多个子区域，用于检测来自该对象的生成效应湮灭光子和康普顿效应散射光子各分区域。基于对生产效应湮灭光子计数与康普顿效应散射光子计数的比率来获得各个子区域的原子序数，以形成物品的三维图像。此外，本发明还公开了一种物品检查方法。

57. 发明申请

US20110261929A1 ADAPTIVE SCANNING IN AN IMAGING SYSTEM 有权
标题翻译：成像系统中的自适应扫描
公开(公告)号：US20110261929A1
公开(公告)日：2011-10-27
申请号：US13176176
申请日：2011-07-05
申请人： Ronald Steven McNabb, JR. , Nicholas Danvers Penrose Gillett
发明人： Ronald Steven McNabb, JR. , Nicholas Danvers Penrose Gillett
IPC分类号： G01N23/04 , G01N23/201
CPC分类号： G01T7/005 , A61B6/483 , G01N23/04 , G01N23/20083 , G01V5/0016
摘要： An object within a region is exposed to a first beam of penetrating radiation. The first beam of penetrating radiation is sensed on a side opposite the region from a source of the first beam. An attenuation of the first beam caused by passing the first beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of a second of beam of penetrating radiation is adjusted based on the determined attenuation.
摘要翻译：区域内的物体暴露于第一穿透辐射束。第一束穿透辐射在与第一光束的源相反的一侧被感测。确定通过使第一光束通过物体而导致的第一光束的衰减，将衰减与阈值衰减进行比较。如果衰减超过阈值衰减，则根据所确定的衰减来调整穿透辐射束的第二束参数。

58. 发明申请

US20110188632A1 MULTIPLE PLANE MULTI-INVERSE FAN-BEAM DETECTION SYSTEMS AND METHOD FOR USING THE SAME 审中-公开
标题翻译：多平面多反射扇形光束检测系统及其使用方法
公开(公告)号：US20110188632A1
公开(公告)日：2011-08-04
申请号：US12699528
申请日：2010-02-03
申请人： Geoffrey Harding , Stephan Olesinski , Dirk Kosciesza , Helmut Rudolf Strecker
发明人： Geoffrey Harding , Stephan Olesinski , Dirk Kosciesza , Helmut Rudolf Strecker
IPC分类号： G01N23/201 , G21K1/02
CPC分类号： G21K1/025 , G01V5/0016 , G01V5/0025
摘要： A detection system includes a multi-focus radiation source configured to generate X-ray radiation and a primary collimator defining a first row of apertures and a second row of apertures. The first row of apertures forms first X-ray beams within a first plane from the X-ray radiation, and the second row of apertures forms second X-ray beams within a second plane from the X-ray radiation. The first plane is different than the second plane. The detection system further includes a scatter detector including a first row of scatter detector elements and a second row of scatter detector elements. The first row of scatter detector elements is configured to detect scattered radiation from the first X-ray beams, and the second row of scatter detector elements is configured to detect scattered radiation from the second X-ray beams.
摘要翻译：检测系统包括被配置为产生X射线辐射的多焦点辐射源和限定第一排孔和第二排孔的主准直器。第一排孔从X射线辐射在第一平面内形成第一X射线束，并且第二排孔从X射线辐射在第二平面内形成第二X射线束。第一个平面与第二个平面不同。检测系统还包括散射检测器，其包括第一排散射检测器元件和第二排散射检测器元件。第一排散射检测器元件被配置为检测来自第一X射线束的散射辐射，并且第二排散射检测器元件被配置为检测来自第二X射线束的散射辐射。

59. 发明申请

US20110135061A1 DEVICE AND METHOD FOR ANALYZING NANOPARTICLES BY COMBINATION OF FIELD-FLOW FRACTIONATION AND X-RAY SMALL ANGLE SCATTERING 审中-公开
标题翻译：通过场流分解和X射线小角度散射的组合分析纳米颗粒的装置和方法
公开(公告)号：US20110135061A1
公开(公告)日：2011-06-09
申请号：US12993623
申请日：2009-05-20
申请人： Andreas Thünemann
发明人： Andreas Thünemann
IPC分类号： G01N23/201 , B82Y35/00
CPC分类号： G01N23/201 , G01N15/0211 , G01N15/0227 , G01N2013/003 , G01N2015/0038
摘要： The invention relates to a method and to an apparatus for analyzing nanoparticles, wherein the nanoparticles are first fractionated as a function of their particle size and subsequently analyzed, wherein small angle X-ray scattering is used for the analysis of the nanoparticles, and to a corresponding apparatus for carrying out the method according to the invention. The analysis by means of small angle X-ray scattering comprises the focussing of X-radiation onto the nanoparticles to be analyzed by means of a slit collimator and the analysis of the nanoparticles using a detector-to-sample distance of less than 50 cm.
摘要翻译：本发明涉及一种用于分析纳米颗粒的方法和装置，其中首先将纳米颗粒作为其颗粒尺寸的函数进行分级，随后进行分析，其中使用小角度X射线散射来分析纳米颗粒，并使用用于执行根据本发明的方法的相应装置。通过小角度X射线散射的分析包括通过狭缝准直器将X射线聚焦到待分析的纳米颗粒上，并且使用小于50cm的检测器到样品的距离对纳米颗粒进行分析。

60. 发明申请

US20110135060A1 High Energy X-Ray Inspection System Using a Fan-Shaped Beam and Collimated Backscatter Detectors 有权
标题翻译：高能X射线检测系统使用风扇形波束和准直反向散射检测器
公开(公告)号：US20110135060A1
公开(公告)日：2011-06-09
申请号：US12993831
申请日：2009-05-20
申请人： Edward James Morton
发明人： Edward James Morton
IPC分类号： G01N23/201
CPC分类号： G01V5/0025 , G01N23/20083 , G01N23/203 , G01N2223/053 , G01V5/0016
摘要： This invention provides a scanning system for scanning an object in a scanning zone. The scanning system includes both a radiation source arranged to irradiate the object with radiation having a peak energy of at least 900 keV and a scatter detector arranged to detect radiation scattered from the object wherein the radiation source is arranged to irradiate the object over a plurality of regions to be scanned within a single irradiation event. The scatter detector includes a plurality of detection elements, each detection element being arranged to detect scattered radiation from a predefined part of the scanning zone and a signal processor arranged to calculate scatter intensity across the plurality of detector elements.
摘要翻译：本发明提供一种用于扫描扫描区域中的物体的扫描系统。扫描系统包括布置成以具有至少900keV的峰值能量的辐射照射物体的辐射源和布置成检测从物体散射的辐射的散射检测器，其中辐射源被布置成通过多个在单次照射事件中要扫描的区域。散射检测器包括多个检测元件，每个检测元件被布置成检测来自扫描区域的预定义部分的散射辐射，以及信号处理器，被布置成计算跨越多个检测器元件的散射强度。

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