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    • 51. 发明授权
    • Apparatus and semiconductor component for assuring test flow compliance
    • 用于确保测试流程符合性的设备和半导体组件
    • US5603412A
    • 1997-02-18
    • US595796
    • 1996-02-02
    • William Gross, Jr.Gregory D. Sabin
    • William Gross, Jr.Gregory D. Sabin
    • B07C5/36B07C5/344
    • B07C5/361
    • The present invention provides test flow assurance using memory imprinting. The device being tested includes a nonvolatile memory portion for storing an information imprint in a present test status field. The imprint indicates the bin category to which the device is to be directed according to the results of a test sequence. During the start of a test in the test flow, the present test status field is read to determine whether the device has already passed through the present test. If so, the device is not retested according to that test step, and it is binned out according to the imprinted information. If the imprint indicates that the device has not already passed through the present test, then the present test sequence is performed, the device programmed with its imprint, and binned out accordingly. If, during the present test sequence, the imprint indicates that the device did not pass through a previous test sequence as it should have, then the device is binned out as a failure because it was not properly processed. Alternatively, the device may be binned out as requiring testing according to the prior tests that the part has not undergone.
    • 本发明提供使用存储器印记的测试流程保证。 正在测试的设备包括用于在当前测试状态字段中存储信息印记的非易失性存储器部分。 印记表示根据测试序列的结果来指定设备的仓类别。 在测试流程开始测试期间,读取当前测试状态字段以确定设备是否已经通过当前测试。 如果是,则根据该测试步骤不重新测试该设备,并且根据打印的信息将其装箱。 如果打印表示设备尚未通过当前测试,则执行本测试序列,该设备用其压印编程,并相应地进行合并。 如果在本测试序列期间,打印指示设备未按原来的方式通过以前的测试序列,那么由于设备未正确处理,设备将被丢弃为故障。 或者,该装置可以根据先前的测试要求进行测试,该零件未经过处理。
    • 52. 发明授权
    • Device for testing and sorting small electronic components
    • 用于测试和分类小型电子元件的设备
    • US5568870A
    • 1996-10-29
    • US293011
    • 1994-08-18
    • Klaus Utech
    • Klaus Utech
    • B07C5/344G01R31/01
    • G01R31/01B07C5/344
    • The invention is a machine used to test and sort small electronic components. The machine includes a feed station, a testing station and a sorting station. The components are carried between the different stations by a rotatable transport wheel that includes a number of peripherally-located and radially-aligned compartments.The testing station includes a top lead that is moved in a direction away from or toward the central axis of the wheel. The movement is controlled by a follower roller that is connected to the lead and that travels along a surface of a cam ring that is attached to the transport wheel. The testing station further includes a shielding strip that isolates the electronic component from surrounding fields during the testing operation.
    • 本发明是用于测试和分类小型电子部件的机器。 该机器包括进料站,检测站和分拣站。 组件通过包括多个周边定位和径向对准的隔间的可旋转传送轮在不同站之间传送。 测试台包括沿远离或朝向车轮的中心轴线的方向移动的顶部引线。 移动由连接到引线并且沿着附接到传送轮的凸轮环的表面行进的随动辊控制。 测试站还包括屏蔽条,其在测试操作期间将电子部件与周围的场隔离。
    • 53. 发明授权
    • Device for separating magnetically labelled cells
    • 用于分离磁性标记细胞的装置
    • US5514340A
    • 1996-05-07
    • US185064
    • 1994-01-24
    • Peter LansdorpTerry Thomas
    • Peter LansdorpTerry Thomas
    • B03C1/00B03C1/025B03C1/031B03C1/034C12M1/26C12M1/42C12M3/06C12N1/02G01N33/543G01N33/569B07C5/344
    • G01N33/56972B03C1/002B03C1/025B03C1/031B03C1/034C12N1/02G01N33/54326C12M47/04
    • A device for separating magnetically labelled cells in a sample using an applied magnetic field having a housing; an inlet element at the top portion of the housing having an input end and an output end; a filter chamber adjacent to the output end of the inlet element for filtering the magnetically labelled cells from the fluid while allowing unlabelled cells to pass through when a magnetic field is applied thereto, and containing a multiplicity of magnetic matrix elements extending transversely across the filter chamber; and an outlet element for collecting the fluid which passes through the filter chamber having an input end coupled to the filter chamber and an output end. The device has one or more of the following features: (i) the inlet and/or outlet element having flow distribution means for distributing the flow from the inlet element generally uniformly across the filter chamber; (ii) the peripheries of the magnetic matrix elements are connected to the housing by a junction which is substantially impenetrable to the fluid; and (iii) the magnetic matrix elements are ordered and spaced apart so as to maximize the magnetic capture of magnetically labelled cells onto the magnetic matrix element when a magnetic field is applied. Methods of using the device and a hematopoietic cell preparation obtained using the device of the invention are also described.
    • 一种用于使用具有壳体的施加磁场分离样品中的磁性标记细胞的装置; 壳体顶部的入口元件具有输入端和输出端; 与入口元件的输出端相邻的过滤室,用于从流体过滤磁性标记的细胞,同时允许未标记的细胞在施加磁场时通过,并且包含横向延伸穿过过滤器室的多个磁性矩阵元件 ; 以及用于收集通过过滤室的流体的出口元件,其具有联接到过滤室的输入端和输出端。 该装置具有一个或多个以下特征:(i)入口和/或出口元件具有流量分配装置,用于将来自入口元件的流体大致均匀地分布在过滤室上; (ii)磁矩阵元件的周边通过基本上不透过流体的接头连接到壳体; 和(iii)磁矩阵元件被排序并间隔开,以便当施加磁场时,使磁性标记的细胞在磁矩阵元件上的磁捕获最大化。 还描述了使用本发明的装置获得的使用该装置和造血细胞制剂的方法。
    • 54. 发明授权
    • Diced semiconductor device handler
    • 切割半导体器件处理程序
    • US5510723A
    • 1996-04-23
    • US205678
    • 1994-03-01
    • Robert L. CanellaWarren M. Farnworth
    • Robert L. CanellaWarren M. Farnworth
    • B07C5/344G01R1/073G01R31/02G01R31/28
    • B07C5/344G01R1/07314G01R31/2831
    • An apparatus for testing an unencapsulated, diced semiconductor device comprises a test head. The test head comprises a carousel table having a chamfered portion and a chamfered pedestal. While testing is pending the pedestal rests against the chamfered portion of the carousel table, and the pedestal receives a semiconductor device to be tested. The carousel table rotates 90.degree. to position the semiconductor device under the test head. The pedestal is lifted, and the chamfered nature of the pedestal and the carousel table allow for adjustments to the pedestal in the X-, Y-, and theta-directions to align the die with a probe responsive to signals from a camera positioned above the probe. Once the die is aligned, the pedestal continues to rise until contact is made between bond pads on the die and the probe, and testing is performed.
    • 用于测试未封装的切割半导体器件的装置包括测试头。 测试头包括具有倒角部分和倒角基座的转盘台。 当测试正在等待时,基座搁置在转盘台的倒角部分上,并且基座接收待测试的半导体器件。 圆盘传送带旋转90°,将半导体器件放置在测试头下方。 基座被提起,并且基座和转盘台的倒角特性允许在X,Y和θ方向上对基座进行调整,以使管芯与探头对准,以响应来自位于 探测。 一旦芯片对准,基座将继续上升,直到与芯片上的接合焊盘和探头接触,并进行测试。
    • 55. 发明授权
    • Sock sorting device
    • 袜子分拣装置
    • US5456392A
    • 1995-10-10
    • US252453
    • 1994-06-01
    • James W. Majors
    • James W. Majors
    • B07C5/36D05B23/00A47G25/90B07C5/344
    • B07C5/361D05B23/007
    • An adapter working in concert with a parent or host machine to divert socks of different styles or quality into separate collection containers, including a logic controller, a diverter assembly, at least two discharge conduits, and a manifold. The diverter assembly is pneumatically connected in series with the sock discharge outlet of the host machine. Depending upon a selection entered into the logic controller by an operator, a sock on a rotating turret on the host machine may be designated, at predetermined turret positions, to be of a particular style, or to be of second quality. The entry is entered into the logic controller, where it is remembered until the sock is ready to be everted and discharged. A index detection device is provided to indicate indexing of the turret to the logic controller. When the sock is in the discharge position, the logic controller operates the diverter valves in accordance with the choice or choices made earlier by the host machine operator, to cause the diverter valves to divert the sock into one of several conduits. The sock passes a detector in the selected conduit, which causes a counter for that style of sock (or for second quality socks) to increment, and which, after a time that permits the sock to be collected in a sock separator device, causes the vacuum in the selected conduit to be removed. Removal of the vacuum permits the sock to drop into a collection area or bin. The adapter permits uninterrupted seaming operations to occur, even though different styles and qualities of socks may be present in the run. The run need not be interrupted when a second quality sock or a sock of a different design is loaded or detected on the host machine.
    • 与母机或主机一起工作的适配器,用于将不同样式或质量的袜子转移到单独的收集容器中,包括逻辑控制器,分流器组件,至少两个排出管道和歧管。 分流器组件与主机的袜子排出口串联地气动连接。 根据操作者输入到逻辑控制器中的选择,主机上的旋转转台上的袜子可以在预定转塔位置被指定为具有特定风格或具有第二质量。 该条目输入到逻辑控制器中,在该位置被记住,直到袜子准备摆脱并放出。 索引检测装置被提供以指示转台到逻辑控制器的索引。 当袜子处于排放位置时,逻辑控制器根据主机操作者先前做出的选择或选择来操作分流阀,以使分流阀将袜子转移到多个管道之一。 袜子通过所选择的导管中的检测器,这导致针对这种类型的袜子(或第二质量袜子)的计数器增加,并且在允许将袜子收集在袜子分离器装置中的时间之后,使得 在选择的导管中抽真空将被去除。 去除真空可以使袜子落入收集区域或垃圾桶。 适配器允许发生不间断的缝合操作,即使在运行中可能存在不同样式和袜子的质量。 当在主机上加载或检测到不同设计的第二个质量袜子或袜子时,不需要中断跑步。
    • 56. 发明授权
    • Apparatus and method for detecting defects in an article
    • 用于检测文章中的缺陷的方法和方法
    • US5165551A
    • 1992-11-24
    • US556831
    • 1990-07-23
    • Robert J. Frost
    • Robert J. Frost
    • B07C5/344B07C5/36
    • B07C5/344B07C5/36Y10S209/919Y10S209/929
    • An apparatus for detecting defects in discrete articles, such as fasteners having an indexable article carrier with a plurality of article holders on the article carrier for supporting articles in a holding position so that each article in the holding position moves in a prescribed path as the article carrier is operated; structure for incrementally indexing the article carrier to position each article holder alternatively in (a) a first position in which an article can be inserted therein from a supply, and (b) a second position spaced from said first position; structure for shifting an article in a holder in the second position out of the holding position therefor into an inspecting position and for rotating an article in a holder in an inspecting position so that the complete periphery of an article to be inspected is exposed for examination is included; and eddy current scanning structure for examining the exposed part of an article while being rotated in the inspection position therefor.
    • 用于检测离散制品中的缺陷的装置,例如具有可转位物品载体的紧固件,该物品载体具有在物品载体上的多个物品保持件,用于将物品保持在保持位置,使得保持位置中的每个物品作为物品以规定的路径移动 承运人经营; 结构,用于递增地分度物品托架以便在(a)第一位置中将物品夹持位置,在第一位置,物品可以从其中插入其中,以及(b)与所述第一位置间隔开的第二位置; 用于将位于第二位置的保持器中的物品从保持位置移动到检查位置并将待检查物品的整个周边暴露以进行检查的用于将检查件中的物品旋转到检查位置的结构, 包括 以及涡流扫描结构,用于在被检查位置旋转的同时检查物品的暴露部分。
    • 57. 发明授权
    • Apparatus and method for priority processing of financial documents
using video image capture
    • 使用视频图像捕获优先处理财务文件的装置和方法
    • US5159548A
    • 1992-10-27
    • US560019
    • 1990-07-27
    • David D. Caslavka
    • David D. Caslavka
    • B07C3/14B07C5/344
    • B07C3/14B07C5/344G06Q20/042
    • Financial documents, such as checks and deposit slips, are processed by capturing a video image of each document and sorting each document into a predetermined rehandle pocket during a prime pass, prior to proof of deposit processing. Particular one of the documents are selected for priority processing. Selected data is read from the captured images of the selected documents and any errors are corrected to create verified data, including balanced deposit information. The selected documents are then encoded with machine readable data indicative of the balanced deposit information and are further sorted into predetermined kill pockets during a rehandle pass.
    • 财务凭证(如支票和存款单)通过在存款处理证明之前通过捕获每个文档的视频图像并在每次通过期间将每个文档分类到预定的重新处理口袋中进行处理。 选择特定的文件之一进行优先处理。 从所选文档的捕获图像中读取所选数据,并且校正任何错误以创建验证数据,包括平衡存储信息。 然后,所选择的文档用指示平衡存储信息的机器可读数据进行编码,并且在重新通过期间被进一步分类到预定的杀毒袋中。
    • 58. 发明授权
    • Packaged semiconductor device handler
    • 封装半导体器件处理程序
    • US5151650A
    • 1992-09-29
    • US753455
    • 1991-09-03
    • Milo W. FrisbieLarry A. NickersonMavin C. Swapp
    • Milo W. FrisbieLarry A. NickersonMavin C. Swapp
    • B07C5/02B07C5/344G01R31/01H01L21/00H01L21/673
    • H01L21/67333B07C5/02B07C5/344G01R31/01H01L21/67242
    • A handler (11) which transports a number of packaged semiconductor devices (12) in a boat (23) to a test head (14) and tests the devices (12) is provided. The handler (11) has an input staging section (29), a testing section (31) which is adjacent to the test head (14), and an output staging section (36). A boat transport (27a, 27b) moves the boat (23) from the input staging section (29) to the testing section (31) and from the testing section (31) to the output staging section (36). The boat transport (27a, 27b) operates during the device testing to provide substantially parallel operation of the testing and handling steps. A boat lift (39) moves the boat (23) to the test head (14) to allow the packaged semiconductor devices (12) to remain in the boat (23) during testing.
    • 提供了将船(23)中的多个封装半导体器件(12)运送到测试头(14)并测试器件(12)的处理器(11)。 处理器(11)具有输入分段部分(29),与测试头(14)相邻的测试部分(31)和输出分段部分(36)。 船舶运输(27a,27b)将船(23)从输入分段部分(29)移动到测试部分(31),并从测试部分(31)移动到输出分段部分(36)。 船舶运输(27a,27b)在设备测试期间运行,以提供测试和处理步骤的基本上并行的操作。 船升降机(39)将船(23)移动到测试头(14),以允许封装的半导体器件(12)在测试期间保持在船(23)中。
    • 59. 发明授权
    • Device for testing and sorting electronic components, more particularly
integrated circuit chips
    • US4889242A
    • 1989-12-26
    • US868290
    • 1986-05-28
    • Hans H. WillbergEkkehard Ueberreiter
    • Hans H. WillbergEkkehard Ueberreiter
    • B07C5/344G01R31/28
    • G01R31/2851B07C5/344G01R31/2893
    • In a device for testing and sorting electronic components, and more particularly integrated circuit chips, the untested components are arranged in parallel magazine channels, which are arranged on a gradient, of an input magazine. The tested components are collected in an output magazine set up in the same way. The magazines are to be suitable, more particularly, for taking up CC (chip carrier) components. These components have a free rear surface upon which they can slip in the magazine channels arranged on a gradient. The magazines consist of a flat base plate (15), upon which guide rails, which are T-shaped in cross section, are mounted in such a way that they limit the magazine channels at the side and at the top, the guide rails being connected with each other to form a block which, as a whole, is capable of being exchanged. The components are tested in a channel, their connecting contacts being connected up with corresponding test contacts. The contact movement is initiated by the components here, while the test contacts are fixed. For this purpose, the components are displaced into the test channel crosswise to the direction of transportation. A shuttle is arranged between the output magazine and a test unit (6) for the components, containing the test channel. The shuttle sits on a shuttle sliding carriage with which it is possible to move along the individual magazine channels. The shuttle may be adjusted in respect of the shuttle sliding carriage executing just the conveying movement, between a loading position, a transporting position and an unloading position. In order to be able to test the components successively in the test unit, they are isolated by means of an isolating apparatus. This consists of two stopping elements which are arranged one after another with interspacing in the direction of transportation of the components, which are capable of being adjusted transverse to the direction of transportation and which are connected with each other by means of a pendulum mechanism. The latter guarantees that the stopping elements are alternately dipped into or drawn out of an isolating channel.