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    • 54. 发明申请
    • Method and device for the open-load diagnosis of a switching stage
    • 用于开关阶段开路诊断的方法和装置
    • US20020070773A1
    • 2002-06-13
    • US10011876
    • 2001-11-05
    • Michael FreyStefan HaimerlDieter SassMario Seifert
    • H03B001/00
    • F02D41/20F02D41/221F02P3/0554Y02T10/40
    • A method and a device for an open-load diagnosis of a switching stage includes the steps of turning off the switching transistor if, after a first delay time has elapsed since an appearance of a control signal, the output voltage is less than a first reference voltage, and if, after a second delay time has elapsed, the output voltage is less than a second reference voltage, then, with the switching transistor in the on state again, comparing the output current flowing through the switching transistor with a reference current, and if the output current is less than the reference current, effecting an open-load indication. The device includes a switchable buffer amplifier; a switching transistor, second and third transistors, a reference current source, first and second comparators, and a control circuit connected to the buffer amplifier, to the second and third transistors, and to the first and second comparators.
    • 用于开关级的开路负载诊断的方法和装置包括以下步骤:关闭开关晶体管,如果在出现控制信号后经过第一延迟时间之后输出电压小于第一参考值 并且如果在经过第二延迟时间之后,输出电压小于第二参考电压,则再次将开关晶体管处于导通状态,将流过开关晶体管的输出电流与参考电流进行比较, 并且如果输出电流小于参考电流,则进行开路负载指示。 该装置包括可切换缓冲放大器; 开关晶体管,第二和第三晶体管,参考电流源,第一和第二比较器以及连接到缓冲放大器的控制电路连接到第二和第三晶体管,以及连接到第一和第二比较器。