会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 53. 发明授权
    • Low temperature sintered ceramic material for use in solid dielectric
capacitors or the like, and method of manufacture
    • 用于固体介质电容器等的低温烧结陶瓷材料及其制造方法
    • US4610969A
    • 1986-09-09
    • US676796
    • 1984-11-30
    • Takeshi WadaHiroshi NakamuraMasami FukuiNobutatsu Yamaoka
    • Takeshi WadaHiroshi NakamuraMasami FukuiNobutatsu Yamaoka
    • C04B35/00C04B35/468H01G4/12H01G4/232C04B35/46H01G4/10
    • H01G4/2325C04B35/4682H01G4/1227
    • A ceramic composition capable of sintering at a sufficiently low temperature to enable the use of a low cost base metal as the electrode material in the fabrication of capacitors. The major ingredient of the composition is expressed as Ba.sub.k-x M.sub.x O.sub.k TiO.sub.2, where M is at least either of magnesium and zinc and where k and x are numerals in the ranges of 1.00 to 1.04 and of 0.02 to 0.05, respectively. To this major ingredient is added a minor proportion of a mixture of lithium oxide, silicon dioxide, and, possibly, at least one of barium oxide, calcium oxide, and strontium oxide. For the fabrication of coherently bonded bodies of this composition, as for use as the dielectric bodies of capacitors, the moldings of the mixture of the major ingredient and additive in finely divided form are sintered in a reductive or neutral atmosphere and then reheated at a lower temperature in an oxidative atmosphere. The sintering temperature can be so low (typically from 1050.degree. to 1200.degree. C.) that the moldings can be co-sintered with base metal electrodes buried therein without difficulties encountered heretofore.
    • 能够在足够低的温度下烧结以在电容器制造中能够使用低成本贱金属作为电极材料的陶瓷组合物。 组合物的主要成分表示为Bak-xMxOkTiO 2,其中M为镁和锌中的至少一种,其中k和x分别为1.00至1.04和0.02至0.05的数字。 向该主要成分中加入少量氧化锂,二氧化硅和可能的氧化钡,氧化钙和氧化锶中的至少一种的混合物。 对于该组合​​物的相干结合体的制造,对于用作电容器的介电体,主要成分和细分散形式的添加剂的混合物的模制品在还原性或中性气氛中烧结,然后在较低的温度下再加热 氧化气氛中的温度。 烧结温度可以如此低(通常为1050℃至1200℃),模制品可以与埋在其中的贱金属电极共烧结而不会遇到困难。
    • 57. 发明授权
    • Signal analyzing apparatus
    • 信号分析仪
    • US08074127B2
    • 2011-12-06
    • US12295179
    • 2007-03-29
    • Takeshi WadaHajime ImazekiTakashi Miyamoto
    • Takeshi WadaHajime ImazekiTakashi Miyamoto
    • G01R31/28G01R13/02
    • G01R31/3171G01R31/31709
    • The present invention is to provide a signal analyzing apparatus which can easily identify a pattern high in error rate and a pattern causing bit errors in comparison with the conventional device. In a signal analyzing apparatus (4) for analyzing a signal from an object under test, and having a display unit (21) display an analysis result on the signal, the signal analyzing apparatus (4) includes a statistical processing unit (34) for statistically processing the analysis result for each of divided sections obtained by dividing an analysis section set for the signal; and a display control unit (23) for causing the display device to display statistical results obtained by the statistical processing unit for each of the divided sections, when a divided section are identified as a new analysis section, the statistical processing unit performs statistical processing of the analysis result for each of divided sections obtained by dividing the new analysis section, the display control unit causes the display device to display the statistical results obtained by the statistical processing unit for each of new divided sections.
    • 本发明是提供一种信号分析装置,其能够容易地识别错误率高的图案和与常规装置相比导致比特错误的图案。 在用于分析来自受检对象的信号的信号分析装置(4)中,并且具有显示单元(21)对信号进行分析结果显示的信号分析装置(4)包括:统计处理单元(34),用于 统计处理通过划分为信号设置的分析部分而获得的每个分割部分的分析结果; 以及显示控制单元(23),用于使得所述显示设备显示由所述统计处理单元为每个所述分割区域获得的统计结果,当分割区段被识别为新分析单元时,所述统计处理单元执行统计处理 通过划分新的分析部分获得的每个分割部分的分析结果,显示控制单元使显示装置显示由每个新分割部分由统计处理单元获得的统计结果。
    • 58. 发明申请
    • SIGNAL ANALYZING APPARATUS
    • 信号分析装置
    • US20110050705A1
    • 2011-03-03
    • US12295179
    • 2007-03-29
    • Takeshi WadaHajime ImazekiTakashi Miyamoto
    • Takeshi WadaHajime ImazekiTakashi Miyamoto
    • G09G5/22
    • G01R31/3171G01R31/31709
    • The present invention is to provide a signal analyzing apparatus which can easily identify a pattern high in error rate and a pattern causing bit errors in comparison with the conventional device. In a signal analyzing apparatus (4) for analyzing a signal from an object under test, and having a display unit (21) display an analysis result on the signal, the signal analyzing apparatus (4) includes a statistical processing unit (34) for statistically processing the analysis result for each of divided sections obtained by dividing an analysis section set for the signal; and a display control unit (23) for causing the display device to display statistical results obtained by the statistical processing unit for each of the divided sections, when a divided section are identified as a new analysis section, the statistical processing unit performs statistical processing of the analysis result for each of divided sections obtained by dividing the new analysis section, the display control unit causes the display device to display the statistical results obtained by the statistical processing unit for each of new divided sections.
    • 本发明是提供一种信号分析装置,其能够容易地识别错误率高的图案和与常规装置相比导致比特错误的图案。 在用于分析来自受检对象的信号的信号分析装置(4)中,并且具有显示单元(21)对信号进行分析结果显示的信号分析装置(4)包括:统计处理单元(34),用于 统计处理通过划分为信号设置的分析部分而获得的每个分割部分的分析结果; 以及显示控制单元(23),用于使得所述显示设备显示由所述统计处理单元为每个所述分割区域获得的统计结果,当分割区段被识别为新分析单元时,所述统计处理单元执行统计处理 通过划分新的分析部分获得的每个分割部分的分析结果,显示控制单元使显示装置显示由每个新分割部分由统计处理单元获得的统计结果。