会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 51. 发明申请
    • RECONFIGURABLE LOGIC BLOCK
    • 可重构逻辑块
    • US20130007679A1
    • 2013-01-03
    • US13369226
    • 2012-02-08
    • David W. MendelGary LaiLu ZhouBruce B. Pedersen
    • David W. MendelGary LaiLu ZhouBruce B. Pedersen
    • G06F17/50
    • G06F17/5054G06F11/1008H03K19/17756H03K19/17776
    • A programmable logic device includes logic blocks such as a logic array blocks (LAB) that can be configured as a random access memory (RAM) or as a lookup table (LUT). A mode flag is provided to indicate the mode of operation of configuration logic such as a configuration RAM (CRAM) used during partial reconfiguration of a logic block. An enable read flag is provided to indicate if values stored in the configuration logic are to be read out or a known state is to be read out during a data verification process. Thus, exclusion and inclusion of portions of a region of configuration logic from data verification and correction processes allow a region of configuration logic to store both a design state and a user defined state. Moreover, the region of configuration logic may be dynamically reconfigured from one state to another without causing verification errors.
    • 可编程逻辑器件包括诸如可被配置为随机存取存储器(RAM)或查找表(LUT)的逻辑阵列块(LAB)的逻辑块。 提供模式标志以指示诸如在逻辑块的部分重新配置期间使用的配置RAM(CRAM)的配置逻辑的操作模式。 提供使能读取标志以指示在数据验证处理期间是否读出存储在配置逻辑中的值或者是否读出已知状态。 因此,排除和包含来自数据验证和校正处理的配置逻辑区域的部分允许配置逻辑的区域存储设计状态和用户定义的状态。 此外,配置逻辑的区域可以从一个状态被动态地重新配置而不引起验证错误。
    • 52. 发明申请
    • SYSTEMS AND METHODS FOR SECURING A PROGRAMMABLE DEVICE AGAINST AN OVER-VOLTAGE ATTACK
    • 用于安全防止过电压攻击的可编程器件的系统和方法
    • US20120275077A1
    • 2012-11-01
    • US13097313
    • 2011-04-29
    • Bruce B. PedersenDirk A. Reese
    • Bruce B. PedersenDirk A. Reese
    • H02H9/04
    • G11C7/24H03K19/17768
    • Systems and methods are disclosed for securing a programmable integrated circuit device against an over-voltage attack. Generally, programmable devices, such as FPGAs, contain volatile memory registers that may store sensitive information. To prevent tampering and/or reverse engineering of such a programmable device, an over-voltage detection circuit may be employed to disable the device and/or erase the sensitive information stored on the device when an over-voltage attack is suspected. In particular, once the over-voltage detection circuit detects that the voltage applied to the programmable device exceeds a trigger voltage, it may cause logic circuitry to erase the sensitive information stored on the device. Desirably, the over-voltage detection circuit includes components arranged in such a way as to render current consumption negligible when the voltage applied to the programmable device, e.g., by a battery, remains below the trigger voltage.
    • 公开了用于保护可编程集成电路装置免受过电压攻击的系统和方法。 通常,可编程器件(如FPGA)包含可能存储敏感信息的易失性存储器寄存器。 为了防止这种可编程设备的篡改和/或逆向工程,当怀疑有过电压攻击时,可以采用过电压检测电路来禁止该设备和/或擦除存储在设备上的敏感信息。 特别地,一旦过电压检测电路检测到施加到可编程器件的电压超过触发电压,则可能导致逻辑电路擦除存储在器件上的敏感信息。 期望地,过电压检测电路包括以下方式布置的组件,即当例如通过电池施加到可编程器件的电压保持低于触发电压时,电流消耗可以忽略不计。
    • 53. 发明申请
    • VOLATILE MEMORY ELEMENTS WITH SOFT ERROR UPSET IMMUNITY
    • 具有软错误UPS易失性的易失性存储器元件
    • US20120163067A1
    • 2012-06-28
    • US13411436
    • 2012-03-02
    • Bruce B. Pedersen
    • Bruce B. Pedersen
    • G11C11/00
    • G11C11/412G11C7/20G11C11/4125H03K19/00392H03K19/177H03K19/1776H03K19/17764
    • Memory elements are provided that exhibit immunity to soft error upset events when subjected to high-energy atomic particle strikes. The memory elements may each have ten transistors including two address transistors and four transistor pairs that are interconnected to form a bistable element. Clear lines such as true and complement clear lines may be routed to positive power supply terminals and ground power supply terminals associated with certain transistor pairs. During clear operations, some or all of the transistor pairs can be selectively depowered using the clear lines. This facilitates clear operations in which logic zero values are driven through the address transistors and reduces cross-bar current surges.
    • 提供了存储元件,当受到高能原子粒子撞击时,表现出对软错误失调事件的抵抗力。 存储元件可以各自具有十个晶体管,其包括互连以形成双稳态元件的两个地址晶体管和四个晶体管对。 诸如真实和补充清除线之类的清除线可以被路由到与某些晶体管对相关联的正电源端子和接地电源端子。 在清除操作期间,可以使用清除线选择性地削弱部分或全部晶体管对。 这有助于明确的操作,其中逻辑零值通过地址晶体管驱动并且减小交叉电流浪涌。
    • 55. 发明授权
    • Partially reconfigurable memory cell arrays
    • 部分可重新配置的存储单元阵列
    • US07864620B1
    • 2011-01-04
    • US12407750
    • 2009-03-19
    • Bruce B. Pedersen
    • Bruce B. Pedersen
    • G11C8/00
    • G11C11/413G11C7/1006G11C7/1012G11C2207/002H03K19/17752H03K19/17756H03K19/1776
    • Partial reconfiguration techniques and reconfiguration circuitry are provided that allow portions of a memory cell array to be reconfigured with new reconfiguration data without disturbing other portions of the memory cell array. The memory cells may be loaded with configuration data on an integrated circuit such as a programmable logic device. Memory cell outputs may configure programmable logic. To avoid disturbing programmable logic operations for programmable logic that is unaffected by the reconfigured cells during reconfiguration, unaffected memory cells are not unnecessarily cleared. Only those memory cells that need to be cleared to conform to the new configuration data that is being loaded into the array need to be loaded with logic zero values during reconfiguration operations. After these clearing operations are complete, set operations may be performed to convert appropriate memory cells to logic one values to match the new configuration data.
    • 提供部分重配置技术和重新配置电路,其允许存储单元阵列的部分用新的重配置数据重新配置,而不会干扰存储单元阵列的其他部分。 存储器单元可以在诸如可编程逻辑器件的集成电路上加载配置数据。 存储单元输出可以配置可编程逻辑。 为了避免在重新配置期间不受重新配置的单元影响的可编程逻辑的可编程逻辑操作的干扰,未受影响的存储单元不会被不必要地清除。 只有那些需要清除以符合正在加载到阵列中的新配置数据的内存单元需要在重新配置操作期间加载逻辑零值。 这些清除操作完成后,可以执行设置操作,将适当的存储单元转换为逻辑一个值,以匹配新的配置数据。