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    • 52. 发明申请
    • RECOGNITION APPARATUS AND METHOD THEREOF, AND COMPUTER PROGRAM
    • 识别装置及其方法,以及计算机程序
    • US20110206237A1
    • 2011-08-25
    • US13030956
    • 2011-02-18
    • Takayuki SarutaMasakazu MatsuguMasato Aoba
    • Takayuki SarutaMasakazu MatsuguMasato Aoba
    • G06K9/00
    • G06K9/4661G01B11/00
    • A recognition apparatus for recognizing a position and an orientation of a target object, inputs a captured image of the target object captured by an image capturing apparatus; detects a plurality of feature portions from the captured image, and to extract a plurality of feature amounts indicating image characteristics in each of the plurality of feature portions; inputs property information indicating respective physical properties in the plurality of feature portions on the target object; inputs illumination information indicating an illumination condition at the time of capturing the captured image; determines respective degrees of importance of the plurality of extracted feature amounts based on the respective physical properties indicated by the property information and the illumination condition indicated by the illumination information; and recognizes the position and the orientation of the target object based on the plurality of feature amounts and the respective degrees of importance thereof.
    • 用于识别目标对象的位置和取向的识别装置输入由图像捕获装置捕获的目标对象的拍摄图像; 从捕获的图像中检测多个特征部分,并且提取指示多个特征部分中的每一个中的图像特征的多个特征量; 输入表示所述目标物体上的所述多个特征部中的各物理属性的属性信息; 输入指示拍摄图像时的照明条件的照明信息; 基于由所述属性信息和由所述照明信息指示的照明条件指示的各个物理属性来确定所述多个提取的特征量的各自的重要程度; 并且基于多个特征量及其各自的重要程度来识别目标对象的位置和取向。
    • 56. 发明申请
    • MEASUREMENT SYSTEM AND MEASUREMENT PROCESSING METHOD
    • 测量系统和测量处理方法
    • US20100328649A1
    • 2010-12-30
    • US12816069
    • 2010-06-15
    • Kazuyuki OtaMasakazu MatsuguKenji Saitoh
    • Kazuyuki OtaMasakazu MatsuguKenji Saitoh
    • G01B11/24G01B11/30
    • G01B11/25
    • This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic.
    • 本发明旨在通过图案投影法在测量测量对象的表面形状的测量系统中测量表面形状时,将测量对象的散射特性一起提取。 为了实现这一点,测量系统包括用点阵图形光照射测量对象的照明单元,以几乎等于入射角的反射角接收反射光的反射光测量单元和提取出的反射光提取单元 基于接收到的反射光的光接收位置与预定的基准位置之间的偏移量,测量对象的表面的倾斜度,并将点阵图案光的反射光的亮度值和点直径提取为 关于散射特性的信息。
    • 59. 发明申请
    • PATTERN IDENTIFICATION APPARATUS AND METHOD THEREOF, ABNORMAL PATTERN DETECTION APPARATUS AND METHOD THEREOF, AND PROGRAM
    • 模式识别装置及其方法,异常模式检测装置及其方法及程序
    • US20080253665A1
    • 2008-10-16
    • US12100664
    • 2008-04-10
    • Yusuke MitaraiMasakazu Matsugu
    • Yusuke MitaraiMasakazu Matsugu
    • G06K9/70
    • G06K9/6252
    • A pattern identification apparatus for identifying one of a plurality of classes defined in advance, to which data of a pattern identification target belongs, comprises a read unit adapted to read out, from a storage unit in correspondence with each of the plurality of classes, a projection rule to a hyperplane which approximates a manifold corresponding to the class in a feature space an input unit adapted to input identification target data; a calculation unit adapted to calculate, for each class, a projection result obtained by projecting the input identification target data to the hyperplane which approximates the manifold corresponding to each of the plurality of classes, on the basis of the projection rule; and an identification unit adapted to identify, on the basis of the projection result of each classes calculated by said calculation unit, one of the plurality of classes to which the identification target data belongs.
    • 一种模式识别装置,用于识别模式识别目标所属的数据预先定义的多个类别中的一个,包括适于从存储单元中读出与多个类别中的每个类别相对应的读取单元 投影规则到近似对应于特征空间中的类别的歧管的超平面,适于输入识别目标数据的输入单元; 计算单元,用于根据所述投影规则,针对每个类计算通过将所述输入的识别目标数据投影到与所述多个类别中的每一个对应的所述歧管的所述超平面上而获得的投影结果; 以及识别单元,其适于基于由所述计算单元计算出的每个类别的投影结果来识别识别目标数据所属的多个类别中的一个。