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    • 54. 发明授权
    • Magnetic recording medium using a glass substrate
    • 使用玻璃基板的磁记录介质
    • US06503600B2
    • 2003-01-07
    • US09881023
    • 2001-06-15
    • Tsuyoshi WatanabeKoji TakahashiMasao Takano
    • Tsuyoshi WatanabeKoji TakahashiMasao Takano
    • G11B582
    • G11B5/7315C03C19/00C03C2204/08G11B5/7325G11B5/8404Y10S428/90Y10T428/24355Y10T428/315
    • In a magnetic recording medium, surface roughness of a glass substrate and the variation of the surface roughness are suppressed to the predetermined range. Namely, the surface roughness (Rmax, Ra, Rq) and the relation (Rmax/Ra) between Rmax and Ra are restricted to the predetermined range. In this event, Ra is representative of a center-line mean roughness, Rmax is defined as a maximum height representative of a difference between a highest point and a lowest point and Rq is representative of a root mean square roughness. Thereby, crystal grains of an underlying layer and a magnetic layer formed thereon are equalized. Specifically, the surface roughness is specified by Rmax≦15 nm, Ra≦1 nm and Rq≦1.5 nm. Further, the ratio between the surface roughness Rmax and the surface roughness Ra is specified by Rmax/Ra≦30.
    • 在磁记录介质中,玻璃基板的表面粗糙度和表面粗糙度的变化被抑制到预定范围。 也就是说,Rmax和Ra之间的表面粗糙度(Rmax,Ra,Rq)和关系(Rmax / Ra)被限制在预定范围内。 在这种情况下,Ra表示中心线平均粗糙度,Rmax被定义为表示最高点和最低点之间的差的最大高度,Rq表示均方根粗糙度。 由此,使基底层和其上形成的磁性层的晶粒相等。 具体地,表面粗糙度由Rmax <= 15nm,Ra <= 1nm和Rq <= 1.5nm规定。 此外,表面粗糙度Rmax与表面粗糙度Ra之比由Rmax / Ra <30表示。