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    • 51. 发明授权
    • Transistor microstructure
    • 晶体管微结构
    • US5397904A
    • 1995-03-14
    • US906873
    • 1992-07-02
    • Susanne C. ArneyNoel C. MacDonaldJun J. Yao
    • Susanne C. ArneyNoel C. MacDonaldJun J. Yao
    • H01L29/06H01L29/423H01L29/73H01L29/786
    • H01L29/0665B82Y10/00H01L29/0673H01L29/42384H01L29/7317H01L29/78654H01L29/78696
    • A method for isolating transistors and a microstructure for providing isolation for transistors includes a beam located on a substrate. The beam is formed from the same material as the substrate, preferably single crystal silicon, and is released so as to be suspended in the cavity and spaced apart from the substrate. The beam is supported in the cavity by a cantilever structure or by spaced pedestals, or both. One or more transistors are fabricated in the beam, and are thus isolated from the substrate and may be isolated from each other if desired. Contact beams may also be provided to contact the transistor electrodes for interconnection of adjacent transistors or connection of the transistors to electrical circuitry on the substrate. The contact beams also provide mechanical support for the beams.Multiple beams in side-by-side arrays or stacked arrays may be provided.
    • 用于隔离晶体管的方法和用于提供晶体管隔离的微结构包括位于衬底上的光束。 光束由与衬底相同的材料形成,优选为单晶硅,并且被释放以便悬挂在空腔中并与衬底间隔开。 梁通过悬臂结构或间隔开的支座或两者支撑在腔体中。 一个或多个晶体管制造在光束中,并且因此与衬底隔离,并且如果需要可以彼此隔离。 还可以提供接触光束以接触晶体管电极,用于相邻晶体管的互连或将晶体管连接到衬底上的电路。 接触梁还为梁提供机械支撑。 可以提供并排阵列或堆叠阵列中的多个光束。
    • 59. 发明授权
    • Method of making high aspect ratio probes with self-aligned control
electrodes
    • 制作具有自对准控制电极的高纵横比探针的方法
    • US6027951A
    • 2000-02-22
    • US135176
    • 1998-08-18
    • Noel C. MacDonaldZ. Lisa Zhang
    • Noel C. MacDonaldZ. Lisa Zhang
    • B81B1/00H01L21/00H01L29/06
    • G01Q60/04B82Y35/00G01Q60/16G01Q60/38G01Q70/10Y10S977/878
    • A high aspect ratio field emission or tunnelling probe is fabricated utilizing a single crystal reactive etching and metallization process. The resulting field emission probes have self-aligned single crystal silicon sharp tips, high aspect ratio supporting posts for the tips, and integrated, self-aligned gate electrodes surrounding an electrically isolated from the tips. The gate electrodes are spaced from the tips by between 200 and 800 nm and metal silicide or metal can be applied on the tips to achieve emitter turn on at low operational gate voltages. The resulting tips have a high aspect ratio for use in probing various surface phenomena, and for this purpose, the probes can be mounted on or integrated in a three-dimensional translator for mechanical scanning across the surface and for focusing by adjusting the height of the emitter above the surface.
    • 使用单晶反应蚀刻和金属化工艺制造高纵横比场致发射或隧道探针。 所产生的场致发射探针具有自对准单晶硅尖尖,用于尖端的高纵横比支撑柱,以及围绕与尖端电隔离的集成的自对准栅电极。 栅电极与尖端间隔200至800nm,并且金属硅化物或金属可以施加在尖端上,以在低操作栅极电压下实现发射极导通。 所得到的尖端具有高的纵横比用于探测各种表面现象,并且为此目的,探针可以安装在三维平移机上或集成在三维平移机中,用于穿过表面进行机械扫描,并通过调整高度来进行聚焦 发射体在表面以上。