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    • 52. 发明授权
    • Scanner with modular parts
    • 带模块化部件的扫描仪
    • US07942331B2
    • 2011-05-17
    • US11294646
    • 2005-12-05
    • Hiroshi Hayakawa
    • Hiroshi Hayakawa
    • G06K7/10
    • G06K7/10623G06K7/10881
    • A modular barcode scanner for identifying various types of barcodes or the like is provided. The scanner has a housing that has a light source mounted therein and a plurality of walls with one wall at least partially disposed to allow a light path originating from the light source to pass out of the housing to reach the bar codes. The scanner further has a top module mounted on the top of the housing comprising a flat member having light receiving and processing optics as well as subsequent electronic processing devices mounted thereon; and a bottom module mounted on the bottom of the housing having an inner surface with a rotating mirror mounted thereon for directing the light path.
    • 提供了用于识别各种类型的条形码等的模块化条形码扫描器。 扫描器具有安装在其中的光源的壳体,并且具有至少部分地设置有多个壁的多个壁,以允许源自光源的光路通过壳体以达到条形码。 扫描仪还具有安装在壳体的顶部上的顶部模块,该顶部模块包括具有光接收和处理光学器件的平坦构件以及安装在其上的随后的电子处理装置; 以及安装在壳体的底部上的底部模块,其具有安装在其上的旋转镜的内表面,用于引导光路。
    • 55. 发明授权
    • Module for optical information reader
    • 光学信息读取器模块
    • US07483194B2
    • 2009-01-27
    • US11604238
    • 2006-11-27
    • Hiroshi HayakawaToru TakahashiKentaro Takahashi
    • Hiroshi HayakawaToru TakahashiKentaro Takahashi
    • G02B26/08
    • G06K7/1098G02B7/1821G02B26/105G06K7/10633
    • A module for an optical information reader, wherein a light emitting unit (22), a collimator lens (23), a vibration mirror (31) for scanning, a condensing mirror (40), and a light receiving unit (50) are installed in a module casing (10) for modularization, and a lens-barrel hole (13b) opening at one end thereof and having an aperture (13a) formed at the tip face thereof is provided in the module casing (10), the collimator lens (23) is installed in the lens-barrel hole (13b) so as to come into contact with the tip bottom part thereof, and the light emitting unit (22) is press-fitted into the press-fit part (13c) of the lens-barrel hole in front of the collimator lens to form a laser beam generating part (20).
    • 一种用于光学信息读取器的模块,其中安装有发光单元(22),准直透镜(23),用于扫描的反射镜(31),聚光镜(40)和光接收单元(50) 在用于模块化的模块壳体(10)中,并且在模块壳体(10)中设置有在其一端开口并且在其顶端形成有孔(13a)的透镜筒孔(13b),准直透镜 (23)安装在透镜镜筒孔(13b)中以与其顶端底部接触,并且将发光单元(22)压配合到该压配合部分(13c)中 在准直透镜之前的透镜镜筒孔,以形成激光束产生部件(20)。
    • 57. 发明授权
    • Method of producing high-quality silicon single crystals
    • 生产高品质硅单晶的方法
    • US06458204B1
    • 2002-10-01
    • US09717135
    • 2000-11-22
    • Masahiko OkuiHiroki MurakamiKazuyuki EgashiraMakoto ItoHiroshi HayakawaKelly GarretYoshinori Shirakawa
    • Masahiko OkuiHiroki MurakamiKazuyuki EgashiraMakoto ItoHiroshi HayakawaKelly GarretYoshinori Shirakawa
    • C30B1520
    • C30B29/06C30B15/203C30B15/305
    • A method of producing high-quality and large-diameter single crystals by the Czochralski method is disclosed which can provide wafers with a minimized number of such grown-in defects as dislocation clusters and laser scattering tomography defects. Specifically, it is a method of producing silicon single crystals which comprises carrying out the crystal pulling while maintaining the solid-melt interface during pulling in the shape of an upward convex with the central portion of the interface being higher by at least 5 mm than the peripheral region thereof and while applying a magnetic field, and optionally in addition to the above, while maintaining the temperature gradient in the direction of axis of pulling in the peripheral region at a level lower than that in the central portion in the range of from the melting point to 1,200° C. In this case, it is desirable that the portion of the single crystal surface lying at least 50 mm above the melt surface be shielded from direct radiant heat from the heater and/or crucible wall, that a horizontal magnetic field of 0.08 to 0.3 T be applied in parallel with the melt surface or a cusped magnetic field showing an intensity of 0.02 to 0.07 T at a crucible wall site on the melt surface be applied and that the crucible be rotated at a speed of not more than 5 min−1 and the single crystal at a speed of not less than 13 min−1.
    • 公开了通过Czochralski方法生产高质量和大直径单晶的方法,其可以为晶片提供最少数量的诸如位错簇和激光散射层析成像缺陷的这种生长缺陷。 具体地说,它是一种生产硅单晶的方法,其中包括在拉伸成呈向上凸起的形状的同时保持固溶体界面的同时进行晶体拉伸,其中界面的中心部分高​​于 并且在施加磁场的同时,并且可选地除了上述之外,同时保持在周边区域中的拉动轴线方向上的温度梯度比在中心部分的温度梯度低 熔点为1200℃。在这种情况下,希望在熔体表面上方至少50毫米的单晶表面的部分被屏蔽不受来自加热器和/或坩埚壁的直接辐射热,即水平磁 在熔融表面上的坩埚壁部位处,与熔体表面平行施加0.08〜0.3T的场,或者表示强度为0.02〜0.07T的尖细磁场b 并且坩埚以不超过5分钟-1的速度旋转,并且单晶以不小于13分钟-1的速度旋转。
    • 58. 发明授权
    • Method and apparatus for performing exception processing routine in
pipeline processing
    • 在流水线处理中执行异常处理程序的方法和装置
    • US5938762A
    • 1999-08-17
    • US726753
    • 1996-10-07
    • Hiroshi HayakawaHarutsugu FukumotoHiroaki Tanaka
    • Hiroshi HayakawaHarutsugu FukumotoHiroaki Tanaka
    • G06F9/32G06F9/38G06F9/46
    • G06F9/322G06F9/3861
    • An information processing apparatus and method, such that when an interruption occurs in a microprocessor, an exception processing sequence control is started, a program condition of an interrupted program and an address of the interrupted program are saved in a RAM, a program address of a jump instruction is read out from an exception processing generating source and is set in a program counter, and the exception processing sequence control is stopped. Thereafter, a normal processing sequence control is started, the jump instruction is read out from a ROM, an address of an exception processing vector is calculated according to the jump instruction, the exception processing vector is read out from the ROM, a branch address of an exception processing routine indicated by the exception processing vector is set in the program counter, and an operation state of the microprocessor is branched to the exception processing routine. Thereafter, the normal processing sequence control is stopped, and the exception processing routine is performed in the exception processing sequence control.
    • 一种信息处理装置和方法,当在微处理器中发生中断时,开始异常处理顺序控制,中断程序的程序条件和中断程序的地址被保存在RAM中,程序地址 从异常处理生成源读出跳转指令,并将其设置在程序计数器中,并停止异常处理顺序控制。 此后,开始通常的处理顺序控制,从ROM读出跳转指令,根据跳转指令计算出异常处理向量的地址,从ROM中读出异常处理向量,分支地址 在程序计数器中设置由异常处理向量指示的异常处理程序,并且将微处理器的操作状态分支到异常处理程序。 此后,停止正常处理顺序控制,并且在异常处理顺序控制中执行异常处理程序。