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    • 51. 发明授权
    • Calibration reference light source and calibration system using the same
    • 校准参考光源和校准系统使用相同
    • US07710559B2
    • 2010-05-04
    • US12229171
    • 2008-08-20
    • Kenji Imura
    • Kenji Imura
    • G01J3/02
    • G01J3/10G01J3/0254G01J3/28G01J2003/104G01J2003/2866
    • In a calibration reference light source and a sensitivity calibration system using the same, a plurality of single-wavelength light sources for emitting reference lights having mutually different single-wavelengths are used instead of a black body radiation source for radiating a white light, and not only the intensities of the single-wavelength reference lights, but also the wavelengths thereof are measured to obtain sensitivity correction coefficients of intensity-to-radiance conversion data. Thus, obtained reference radiance are highly reliable and sensitivity correction of spectrophotometers and spectral illuminometers can be performed with high accuracy and reliability at a user side, whereby the calibration reference light source and the calibration system using the same can be obtained at low cost.
    • 在校准基准光源和使用其的灵敏度校准系统中,使用用于发射具有相互不同的单一波长的参考光的多个单波长光源代替用于发射白光的黑体辐射源,而不是 仅测量单波长参考光的强度,还测量其波长,以获得强度到辐射转换数据的灵敏度校正系数。 因此,获得的基准亮度高度可靠,并且可以在用户侧以高精度和可靠性执行分光光度计和光谱照度计的灵敏度校正,由此可以以低成本获得校准参考光源和使用其的校准系统。
    • 53. 发明申请
    • Polychrometer and method for correcting stray lights of the same
    • 多光谱仪及其相似方法
    • US20090059224A1
    • 2009-03-05
    • US12229687
    • 2008-08-26
    • Kenji Imura
    • Kenji Imura
    • G01J3/28
    • G01J3/02G01J3/0294G01J3/28
    • In a polychrometer and a method for correcting stray light of the polychrometer, relative spectral (inter-pixel) distribution of stray light independent of a spectral distribution of an incident light is obtained, intensity coefficient of the stray light is calculated according to spectral (inter-pixel) distribution of the incident light, spectral (inter-pixel) distribution of the stray light included in a spectral (inter-pixel) distribution of an incident light is estimated and corrected. Thus, the stray light can be more accurately corrected as compared with a conventional case where stray light distribution is directly estimated from an incident light.
    • 在多光谱仪和用于校正多光谱杂散光的方法中,获得独立于入射光的光谱分布的杂散光的相对光谱(像素间)分布,根据光谱(相互间)计算杂散光的强度系数 - 像素)分布,入射光的频谱(像素间)分布中包括的杂散光的光谱(像素间)分布被估计和校正。 因此,与从入射光直接估计杂散光分布的常规情况相比,可以更精确地校正杂散光。
    • 54. 发明申请
    • Apparatus and method for measuring optical property
    • 用于测量光学性能的装置和方法
    • US20080246969A1
    • 2008-10-09
    • US12080061
    • 2008-03-31
    • Kenji Imura
    • Kenji Imura
    • G01N21/55
    • G01N21/57
    • An optical property measuring apparatus and an optical property measuring method of the invention determine a specified optical property of a sample by using a distribution function indicating a distribution of the amounts of reflected light incident on an optical sensor along a coordinate axis defined on a light-sensing surface of the optical sensor. Therefore, even when the optical sensor is a light-sensing device provided with a relatively small number of photosensitive elements, it is possible to measure the specified optical property regardless of a position error of the sample, if any, and reduce errors in measurement values caused by such a sample position error.
    • 本发明的光学性质测量装置和光学特性测量方法通过使用指示入射在光学传感器上的沿着限定在光学传感器上的坐标轴的反射光量的分布的分布函数来确定样本的指定光学特性, 感测光学传感器的表面。 因此,即使当光学传感器是具有相对较少数量的感光元件的光感测装置时,也可以测量指定的光学特性,而不管样品的位置误差如何,并且减少测量值的误差 造成这种样品位置误差。
    • 56. 发明授权
    • Two-dimensional spectroradiometer
    • 二维光谱仪
    • US07365850B2
    • 2008-04-29
    • US11300778
    • 2005-12-15
    • Kenji Imura
    • Kenji Imura
    • G01N21/25
    • G01N21/251G01J3/02G01J3/0208G01J3/0254G01J3/06G01J3/26G01J3/28G01J3/2823G01J3/32G01J2003/1213G01J2003/1243G01N21/274
    • A two-dimensional spectroradiometer has an optical system such as an objective optical system 2 and a relay lens 6 for receiving light rays La from a two-dimensional light source L to form an optical image i.e. a first image 2a and a second image 6a, a WBPF 12 as a transmittance wavelength variable filter having a spectral transmittance characteristic that transmittance wavelengths of the light rays La differ from each other depending on transmittance sites of the filter where the respective light rays La pass, a scanning WBPF 10 which scannably holds the WBPF 12 on an optical path forming the optical image, and an image sensor 7 for capturing the second image 6a composed of the light rays La passing through the WBPF 12 at a position corresponding to each of scanning steps of the WBPF 12 to acquire a plurality of images each having a different spectral sensitivity among pixels of the image at the position corresponding to the each of the scanning steps. This arrangement enables to provide a compact and inexpensive two-dimensional spectroradiometer with shortening of the measurement time.
    • 二维光谱仪具有物镜光学系统2和中继透镜6等光学系统,用于从二维光源L接收光线La以形成光学图像,即第一图像2a和第二图像6 a,WBPF12作为透射率波长可变滤波器,具有根据各光线La通过的滤光器的透射率位置彼此不同的光线La的透射率特性的光谱透射率特性,可扫描地保持的扫描WBPF 10 在形成光学图像的光路上的WBPF12和用于捕获由在WBPF 12的每个扫描步骤相对应的位置处通过WBPF 12的光线La组成的第二图像6a的图像传感器7,以获取 在对应于每个扫描步骤的位置处,图像的像素之间各自具有不同的光谱灵敏度的多个图像。 这种布置使得能够提供紧凑且廉价的二维光谱辐射计,缩短了测量时间。
    • 57. 发明授权
    • Apparatus for measuring goniometric reflection property of sample
    • 用于测量样品的测角反射特性的装置
    • US07355712B2
    • 2008-04-08
    • US11472981
    • 2006-06-22
    • Kenji ImuraKazuya KiyoiKatsutoshi Tsurutani
    • Kenji ImuraKazuya KiyoiKatsutoshi Tsurutani
    • G01N21/55
    • G01N21/57G01N21/4738G01N2201/0221
    • An apparatus for measuring a goniometric reflection property of a sample has: one or more illuminators; a toroidal mirror which is rotationally symmetrical around a center axis effectively contacting with a surface of the sample; a light receiver having an incident aperture on the center axis; a rotating optics which rotates around a rotation axis which effectively coincides with the center axis; and a controller for controlling operations of the illuminators, the light receiver, and the rotating optics, wherein the toroidal mirror reflects light fluxes emitted from the surface of the sample illuminated by the one or more illuminators in emitting directions perpendicular to the center axis and directs each of the light fluxes to the center axis, and wherein the rotating optics specifies one of the light fluxes reflected by the toroidal mirror and directs the specified light flux to the incident aperture of the light receiver.
    • 用于测量样品的测角反射特性的装置具有:一个或多个照明器; 围绕中心轴旋转对称的环形镜,其有效地与样品的表面接触; 具有中心轴上的入射孔的光接收器; 围绕旋转轴旋转的旋转光学器件,其有效地与中心轴线重合; 以及用于控制照明器,光接收器和旋转光学器件的操作的控制器,其中环形镜反射从由一个或多个照明器照射的样品的表面发射的光束在垂直于中心轴的发射方向上发射,并引导 每个光通量到中心轴线,并且其中旋转光学器件指定由环形镜反射的光束中的一个,并将指定的光通量引导到光接收器的入射孔径。
    • 59. 发明申请
    • Reflection characteristic measuring apparatus
    • 反射特性测量装置
    • US20070273886A1
    • 2007-11-29
    • US11805486
    • 2007-05-23
    • Jun MatsumotoKenji ImuraYoshihiro Okui
    • Jun MatsumotoKenji ImuraYoshihiro Okui
    • G01N21/55G01N21/47
    • G01N21/57
    • A reflection characteristic measuring apparatus includes: at least one illuminator for illuminating a sample surface to be measured with light; a plurality of light receiving sections each adapted for receiving the light reflected on the sample surface illuminated by the light from the illuminator to output two-dimensional light receiving data, respectively; and a deriving section for deriving a characteristic of the sample surface based on a weighted average obtained by applying a weighting factor to each of the light receiving data outputted from the light receiving sections based on an installation condition concerning the illuminator and the light receiving sections, and by averaging the light receiving data weighed with the weighting factors.
    • 反射特性测量装置包括:至少一个用于用光照射待测样品表面的照明器; 多个光接收部,分别适于接收由来自照明器的光照射的样品表面上反射的光,以分别输出二维光接收数据; 以及导出部,其基于通过对于从所述受光部输出的每个所述光接收数据应用加权因子,基于与所述照明器和所述受光部的安装条件相对应的加权平均值,导出所述样品表面的特性, 并且通过对加权因子加权的光接收数据进行平均。
    • 60. 发明授权
    • Light measuring apparatus and a method for correcting non-linearity of a light measuring apparatus
    • 光测量装置和用于校正光测量装置的非线性的方法
    • US07286215B2
    • 2007-10-23
    • US10841189
    • 2004-05-06
    • Kenji Imura
    • Kenji Imura
    • G01J1/10
    • G01N21/274G01J1/08G01J1/1626G01J1/4228G01J2001/0481G01J2003/2866G01N21/31G01N2201/0623G01N2201/127G01N2201/12723
    • A correction LED is provided to illuminate a light receiving sensor array, and a calculation controlling circuit calculates correction values at the respective illuminance levels based on sensor output levels expected at the respective illuminance levels and actual sensor output levels while successively turning the correction LED on at a plurality of illuminance levels whose illuminance ratios are at least known, and corrects a sensor output level by the corresponding correction value to obtain a measurement output at the time of an actual measurement. The discontinuity of an input/output characteristic resulting from the switching of gains of an amplifier for amplifying a photocurrent and the non-linearity caused by the saturation of the photoelectrically converting characteristic of the optical sensor and the exponential characteristics of the optical sensor and the amplifier can be corrected without employing a large-scale construction such as a bench. The non-linearity can be highly precisely and efficiently corrected in a measuring apparatus realized as a spectral luminometer or a spectral colorimeter without requiring a special facility.
    • 提供校正LED以照明光接收传感器阵列,并且计算控制电路基于在各个照度水平和实际传感器输出电平处预期的传感器输出电平来计算各照度水平下的校正值,同时依次将校正LED接通 其照度比至少为已知的多个照度水平,并且通过相应的校正值校正传感器输出电平,以获得实际测量时的测量输出。 由用于放大光电流的放大器的增益切换引起的输入/输出特性的不连续性以及由光学传感器的光电转换特性的饱和引起的非线性以及光学传感器和放大器的指数特性 可以在不使用诸如台架的大规模构造的情况下进行校正。 在实现为光谱发光计或光谱色度计的测量装置中,不需要特殊设备,可以高精度和有效地校正非线性。