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    • 51. 发明申请
    • SYSTEM AND METHOD FOR MONITORING RELIABILITY OF A DIGITAL SYSTEM
    • 用于监测数字系统可靠性的系统和方法
    • US20080270049A1
    • 2008-10-30
    • US11742018
    • 2007-04-30
    • Dae Ik KIMJonghae KIMMoon Ju KIMJames R. MOULICHong Hua SONG
    • Dae Ik KIMJonghae KIMMoon Ju KIMJames R. MOULICHong Hua SONG
    • G01R31/00
    • G01R31/31937G01R31/31725
    • System and method are provided for continually monitoring reliability, or aging, of a digital system and for issuing a warning signal if digital system operation degrades past a specified threshold. The technique includes implementing a ring oscillator sensor in association with the digital system, wherein logic and/or device percent composition of the ring oscillator sensor mirrors percent composition thereof within the digital system. Counter logic is coupled to the ring oscillator sensor for converting outputted count signals to an oscillation frequency, and control logic is coupled to the counter logic for periodically evaluating oscillation frequency of the ring oscillator sensor and generating a warning signal indicative of reliability degradation if at least one of: (i) a measured or estimated oscillation frequency is below a warning threshold frequency; or (ii) a measured or estimated rate of change in a difference between measured oscillation frequencies exceeds an acceptable rate of change threshold.
    • 提供系统和方法用于连续监视数字系统的可靠性或老化,并且如果数字系统操作降低到指定的阈值以上,则发出警告信号。 该技术包括实现与数字系统相关联的环形振荡器传感器,其中环形振荡器传感器的逻辑和/或设备百分比组成反映数字系统内的其组成的百分比。 计数器逻辑耦合到环形振荡器传感器,用于将输出的计数信号转换为振荡频率,并且控制逻辑耦合到计数器逻辑,用于周期性评估环形振荡器传感器的振荡频率,并产生指示可靠性降级的警告信号,如果至少 以下之一:(i)测量或估计的振荡频率低于警告阈值频率; 或者(ii)所测量的振荡频率之间的测量或估计的变化率超过可接受的变化率阈值。
    • 53. 发明申请
    • MONITORING RELIABILITY OF A DIGITAL SYSTEM
    • 监测数字系统的可靠性
    • US20080253437A1
    • 2008-10-16
    • US11733318
    • 2007-04-10
    • Dae Ik KIMJonghae KIMMoon Ju KIMJames R. MOULICHong Hua SONG
    • Dae Ik KIMJonghae KIMMoon Ju KIMJames R. MOULICHong Hua SONG
    • H04B17/00
    • G06F11/008
    • Method, system and article of manufacture are provided for continually monitoring reliability, or aging, of a digital system and for issuing a warning signal if digital system operation degrades to or past a specified threshold. The technique includes periodically determining a maximum frequency of operation of the digital system, and generating a warning signal indicative of a reliability degradation of the digital system if at least one of: (i) a measured or estimated maximum frequency of operation of the digital system is below a warning threshold frequency of operation of the digital system, wherein the warning threshold frequency is greater than or equal to a manufacturer specified minimum frequency of operation for the digital system; or (ii) a rate of change in the difference between measured maximum frequencies of operation of the digital system exceeds an acceptable rate of change threshold for the digital system.
    • 提供了方法,系统和制造品,用于连续监视数字系统的可靠性或老化,并且如果数字系统操作降低到或超过指定阈值,则发出警告信号。 该技术包括周期性地确定数字系统的最大操作频率,以及产生指示数字系统的可靠性劣化的警告信号,如果以下至少一个:(i)数字系统的测量或估计的最大操作频率 低于数字系统的警告阈值操作频率,其中警告阈值频率大于或等于制造商规定的数字系统的最小操作频率; 或者(ii)数字系统的测量的最大操作频率之间的差异的变化率超过数字系统的可接受的变化率阈值。
    • 54. 发明授权
    • Method and system for testing processor cores
    • 用于测试处理器内核的方法和系统
    • US07418368B2
    • 2008-08-26
    • US11624329
    • 2007-01-18
    • Dae Ik KimJonghae KimMoon J KimJames R Moulic
    • Dae Ik KimJonghae KimMoon J KimJames R Moulic
    • G06F15/00
    • G06F11/24G01R31/3004G01R31/31721G01R31/318505
    • Systems, methods and program codes are provided for testing multi-core processor chip structures. Individual processor core power supply voltages are provided through controlling individual power supplies for each core, in one aspect to ensure that one or more cores operate at clock rates in compliance with one or more performance specifications. In one example, a first power supply voltage supplied to a first processing core differs from a second core power supply voltage supplied to a second processing core, both cores operating in compliance with a reference clock rate specification. Core power supply voltages may be selected from ordered discrete supply voltages derived by progressively raising or lowering a first supply voltage, optionally wherein the selected supply voltage also enables the core to operate within another performance specification.
    • 提供了系统,方法和程序代码,用于测试多核处理器芯片结构。 单个处理器核心电源电压通过控制每个核心的单独电源来提供,在一个方面,以确保一个或多个核心以按照一个或多个性能规格的时钟速率运行。 在一个示例中,提供给第一处理核心的第一电源电压与提供给第二处理核心的第二核心电源电压不同,两个核心都遵循参考时钟速率规范操作。 核心电源电压可以从通过逐渐提高或降低第一电源电压而导出的有序离散电源电压中选择,任选地,其中所选择的电源电压还使得核能够在另一性能规格内操作。
    • 55. 发明申请
    • METHOD AND SYSTEM FOR INDEPENDENT PROCESSOR VOLTAGE SUPPLY
    • 独立处理器电压供应方法与系统
    • US20080178023A1
    • 2008-07-24
    • US11624333
    • 2007-01-18
    • Dae Ik KimJonghae KimMoon J. KimJames R. Moulic
    • Dae Ik KimJonghae KimMoon J. KimJames R. Moulic
    • G06F1/00
    • G06F1/3203G06F1/3296Y02D10/172
    • Systems, methods and program codes are provided for selectively adjusting multi-core processor chip structure individual processor core power supply voltages through controlling individual power supplies for each core, in one aspect to ensure that one or more cores operate at clock rates in compliance with one or more performance specifications. Nominal power supply voltage is supplied to a first processing core, and a second core power supply voltage greater or lower than the nominal power supply voltage is supplied to a second processing core, both cores operating in compliance with a reference clock rate specification. The second power supply voltage may be selected from ordered discrete supply voltages derived by progressively lowering the nominal supply voltage, optionally wherein the selected supply voltage also enables the second core to operate within another performance specification.
    • 提供了系统,方法和程序代码,用于通过控制每个核心的单个电源来选择性地调整多核处理器核心电源电压的多核处理器芯片结构,以确保一个或多个内核按照一个时钟速率运行 或更多性能规格。 标称电源电压被提供给第一处理核心,并且大于或低于标称电源电压的第二核心电源电压被提供给第二处理核心,两个核心都遵守参考时钟速率规范。 第二电源电压可以从通过逐渐降低标称电源电压而导出的有序的离散电源电压中选择,可选地,其中所选择的电源电压还使得第二磁芯能够在另一性能规范内操作。