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    • 42. 发明授权
    • Fluorescence light scanning microscope having a birefringent chromatic beam shaping device
    • 具有双折射彩色光束整形装置的荧光光扫描显微镜
    • US08586945B2
    • 2013-11-19
    • US13297872
    • 2011-11-16
    • Matthias ReussJohann Engelhardt
    • Matthias ReussJohann Engelhardt
    • G01J1/58
    • G02B21/0032G02B21/0068G02B21/0076
    • A fluorescence light scanning microscope (2) comprises a light source providing excitation light (8) for exciting a fluorophore in a sample to be imaged for spontaneous emission of fluorescence light, and suppression light (7) for suppressing spontaneous emission of fluorescence light by the fluorophore on a common optical axis (4), the suppression wavelength differing from the excitation wavelength; an objective (19) focusing both the excitation (8) and the suppression (7) light to a focus point; a detector (21) detecting fluorescence light (11) spontaneously emitted by the fluorophore; and a chromatic beam shaping device (1) arranged on the common optical axis (4), and including a birefringent chromatic optical element (3) adapted to shape a polarization distribution of the suppression light (7) such as to produce an intensity zero at the focus point, and to leave the excitation light such as to produce a maximum at the focus point.
    • 荧光光扫描显微镜(2)包括提供用于激发要成像的样品中的荧光团以激发荧光的自发发射的激发光(8)的光源,以及用于抑制荧光的自发发射的抑制光(7) 荧光团在共同的光轴(4)上,抑制波长与激发波长不同; 将激发(8)和抑制(7)光聚焦到焦点的目标(19) 检测器(21),检测由荧光团自发发射的荧光(11); 以及布置在公共光轴(4)上的色光束整形装置(1),并且包括适于使抑制光(7)的偏振分布成形的双折射彩色光学元件(3),以产生在 焦点,并留下激发光,以便在焦点处产生最大值。
    • 45. 发明申请
    • Method and device for determining a critical angle of an excitation light beam
    • 用于确定激发光束的临界角的方法和装置
    • US20130265407A1
    • 2013-10-10
    • US13857610
    • 2013-04-05
    • CARL ZEISS MICROSCOPY GMBH
    • Robin Zur Nieden
    • G01J1/58
    • G01J1/58G01N21/6458G02B21/16
    • A method for determining a critical angle of total reflection based upon images captured at different angles of incidence of a light beam includes illuminating a sample with an excitation light beam, capturing images of at least part of the sample at a plurality of different angles of incidence of the excitation light beam, and determining a critical angle of total reflection at an interface of the sample based upon analysis of the images. An apparatus for determining a critical angle of total reflection at an interface of a sample includes a light source arrangement to illuminate a sample with an angle of incidence, an image capturing arrangement to capture an image of the sample, and a processing arrangement to determine the critical angle of total reflection at an interface of the sample on the basis of an analysis of images captured at a plurality of different angles of incidence.
    • 基于以不同的入射角捕获的图像来确定全反射的临界角的方法包括用激发光束照射样品,以多个不同的入射角拍摄至少部分样品的图像 的激发光束,并且基于图像的分析来确定样品的界面处的全反射的临界角。 用于确定样品的界面处的全反射的临界角的装置包括以入射角照射样品的光源装置,用于捕获样品的图像的图像捕获装置,以及用于确定样品的处理装置 基于对以多个不同入射角拍摄的图像的分析,在样品的界面处的全反射的临界角。
    • 48. 发明授权
    • Fluoroscopy apparatus and fluorescence image processing method
    • 荧光透视仪和荧光图像处理方法
    • US08421034B2
    • 2013-04-16
    • US13646169
    • 2012-10-05
    • Olympus Corporation
    • Fumiko Ono
    • G01J1/58
    • A61B1/05A61B1/00009A61B1/043A61B5/0071A61B5/0084
    • Provided is a fluoroscopy apparatus comprising a white-light-image generating section that generates a white-light image of observation target, a fluorescence-image generating section that generates a fluorescence image of the observation target, a fluorescence-image correcting section that normalizes the fluorescence image with the white-light image, a displacement calculating section that calculates the displacement of the observation target from a plurality of white-light images generated at time intervals, a region-size calculating section that calculates the size of a region having a fluorescence intensity higher than or equal to a predetermined threshold value from the fluorescence image, and a control unit that controls the fluorescence-image correcting section so that, when the displacement of the observation target relative to the size of the region is larger than or equal to a predetermined proportion, normalization of the fluorescence image is stopped.
    • 本发明提供一种荧光透视装置,其包括产生观察对象物的白光图像的白色光图像生成部,产生观察对象物的荧光图像的荧光图像生成部,使该观察对象的荧光图像正常化的荧光图像校正部 具有白光图像的荧光图像;位移计算部,其计算来自以时间间隔生成的多个白光图像的观察对象的位移;区域尺寸计算部,其计算具有荧光的区域的大小; 强度高于或等于来自荧光图像的预定阈值;以及控制单元,其控制所述荧光图像校正部,使得当所述观察对象相对于所述区域的大小的位移大于或等于 预定比例,停止荧光图像的归一化。
    • 50. 发明授权
    • Fluorescence microscopy imaging system
    • 荧光显微镜成像系统
    • US08410414B2
    • 2013-04-02
    • US12872910
    • 2010-08-31
    • Ping Jung WuKuen Chiuan ChengHsing Cheng YuJau Jiu JuChun Chieh HuangYuan Chin Lee
    • Ping Jung WuKuen Chiuan ChengHsing Cheng YuJau Jiu JuChun Chieh HuangYuan Chin Lee
    • G02B7/04G01J1/58
    • G02B21/16G02B21/245
    • A fluorescence microscopy imaging system is used for detecting a fluorescence signal of a sample, and includes a module for detecting fluorescence and a module for focusing control. The module for detecting fluorescence includes a fluorescence excitation light source generator (FELSG) and a fluorescence detector. The FELSG is capable of generating an excitation light beam having a first wavelength to excite the sample to emit fluorescence. The fluorescence detector is used to read the fluorescence signal of the sample. The module for focusing control generates a servo light beam having a second wavelength. A servo light beam reflecting film disposed on an observation plane is used to reflect the servo light beam. A return beam signal is analyzed using a focusing detection method. An actuator is used to move the objective for focusing, so as to enable the fluorescence excitation light beam to excite the sample to emit fluorescence.
    • 荧光显微镜成像系统用于检测样品的荧光信号,并且包括用于检测荧光的模块和用于聚焦控制的模块。 用于检测荧光的模块包括荧光激发光源发生器(FELSG)和荧光检测器。 FELSG能够产生具有第一波长的激发光束以激发样品发射荧光。 荧光检测器用于读取样品的荧光信号。 用于聚焦控制的模块产生具有第二波长的伺服光束。 使用设置在观察平面上的伺服光束反射膜来反射伺服光束。 使用聚焦检测方法分析回波信号。 使用致动器来移动用于聚焦的物镜,以便使荧光激发光束能够激发样品以发射荧光。