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    • 42. 发明授权
    • Creating short program pulses in asymmetric memory arrays
    • 在非对称存储器阵列中创建短程序脉冲
    • US08040721B2
    • 2011-10-18
    • US12551546
    • 2009-08-31
    • Tyler ThorpRoy E. Scheuerlein
    • Tyler ThorpRoy E. Scheuerlein
    • G11C11/00
    • G11C13/0011G11C13/0004G11C13/0064G11C13/0069G11C2013/009G11C2013/0092G11C2213/72G11C2213/77
    • The present invention provides methods and apparatus for adjusting voltages of bit and word lines to create short programming pulses to program a memory cell. The invention may include setting a first line connected to a memory cell to a first voltage from a first line standby voltage, charging a second line connected to the memory cell to a predetermined voltage from a second line standby voltage, switching the first line from the first voltage to a second voltage, and switching the first line from the second voltage to the first voltage. The voltage difference between the first voltage and the predetermined voltage is such that a safe voltage results that does not program the memory cell. A voltage difference between the second voltage and the predetermined voltage is such that a programming voltage operative to program the memory cell results. The switching operations together may create a first pulse.
    • 本发明提供了用于调整位和字线的电压以产生编程脉冲以编程存储器单元的方法和装置。 本发明可以包括将连接到存储器单元的第一线路从第一线路备用电压设置为第一电压,将连接到存储器单元的第二线路从第二线路待机电压充电到预定电压,将第一线路从 第一电压到第二电压,并且将第一线路从第二电压切换到第一电压。 第一电压和预定电压之间的电压差使得不对存储单元进行编程的安全电压。 第二电压和预定电压之间的电压差使得可操作以编程存储器单元的编程电压结果。 一起切换操作可以产生第一脉冲。
    • 48. 发明申请
    • REDUCING PROGRAMMING TIME OF A MEMORY CELL
    • 减少存储单元的编程时间
    • US20110051505A1
    • 2011-03-03
    • US12551548
    • 2009-08-31
    • Tyler ThorpRoy E. Scheuerlein
    • Tyler ThorpRoy E. Scheuerlein
    • G11C11/00G11C7/00
    • G11C7/12G11C7/065G11C8/08G11C13/0004G11C13/0023G11C13/0061G11C13/0069
    • The present invention provides methods and apparatus for adjusting voltages of bit and word lines to program a two terminal memory cell. The invention may include setting a first line connected to a memory cell to a first voltage from a first line standby voltage, charging a second line connected to the memory cell to a predetermined voltage from a second line standby voltage, and switching the first line from the first voltage to a second voltage. The voltage difference between the first voltage and the predetermined voltage is such that a safe voltage results that does not program the memory cell. A voltage difference between the second voltage and the predetermined voltage is such that a programming voltage operative to program the memory cell results.
    • 本发明提供了调节位和字线的电压以编程两个终端存储单元的方法和装置。 本发明可以包括将连接到存储器单元的第一线路从第一线路待机电压设置为第一电压,将连接到存储器单元的第二线路从第二线路待机电压充电到预定电压,以及将第一线路从 第一电压到第二电压。 第一电压和预定电压之间的电压差使得不对存储单元进行编程的安全电压。 第二电压和预定电压之间的电压差使得可操作以编程存储器单元的编程电压结果。
    • 50. 发明授权
    • Current sensing method and apparatus for a memory array
    • 用于存储器阵列的电流感测方法和装置
    • US07773443B2
    • 2010-08-10
    • US12405160
    • 2009-03-16
    • Roy E. Scheuerlein
    • Roy E. Scheuerlein
    • G11C7/02
    • G11C7/062G11C5/025G11C7/067G11C7/18G11C8/08G11C8/10G11C17/18G11C2207/063
    • A memory array includes a sensing circuit for sensing bit line current while keeping the voltage of the selected bit line substantially unchanged. The word lines and bit lines are biased so that essentially no bias voltage is impressed across half-selected memory cells, which substantially eliminates leakage current through half-selected memory cells. The bit line current which is sensed arises largely from only the current through the selected memory cell. A noise detection line in the memory array reduces the effect of coupling from unselected word lines to the selected bit line. In a preferred embodiment, a three-dimensional memory array having a plurality of rail-stacks forming bit lines on more than one layer, includes at least one noise detection line associated with each layer of bit lines. A sensing circuit is connected to a selected bit line and to its associated noise detection line.
    • 存储器阵列包括用于感测位线电流的感测电路,同时保持所选位线的电压基本上不变。 字线和位线被偏置,使得基本上不会在半选择的存储器单元上施加偏置电压,这几乎消除了通过半选择的存储器单元的泄漏电流。 感测的位线电流很大程度上仅来自所选存储单元的电流。 存储器阵列中的噪声检测线减少了从未选择的字线耦合到所选位线的影响。 在优选实施例中,具有在多于一个层上形成位线的多个轨道堆叠的三维存储器阵列包括与每个位线层相关联的至少一个噪声检测线。 感测电路连接到选定的位线及其相关的噪声检测线。