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    • 50. 发明授权
    • Repair circuit and control method thereof
    • 修理电路及其控制方法
    • US08547762B2
    • 2013-10-01
    • US13190046
    • 2011-07-25
    • Sung Ho Kim
    • Sung Ho Kim
    • G11C7/00
    • G11C17/14G11C29/787
    • A semiconductor memory apparatus including a repair circuit may comprise: a fuse set block configured to store a repair address, compare the repair address with an input address, and generate a primary repair signal; and a redundancy control block configured to receive the primary repair signal, determine whether a repair cell in a repair memory designated by the primary repair signal is failed or not, and generate a secondary repair signal which repair the failed repair cell with another repair cell in the repair memory.
    • 包括修复电路的半导体存储装置可以包括:熔丝组块,被配置为存储修复地址,将修复地址与输入地址进行比较,并生成主修复信号; 以及冗余控制块,被配置为接收所述主修复信号,确定由所述主修复信号指定的修复存储器中的修复单元是否故障,并且生成辅助修复信号,所述修复信号用另一修复单元修复所述故障修复单元 修复记忆。