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    • 48. 发明授权
    • Method for substrate mapping
    • 基板测绘方法
    • US06555400B2
    • 2003-04-29
    • US09934620
    • 2001-08-22
    • Warren M. FarnworthDerek J. Gochnour
    • Warren M. FarnworthDerek J. Gochnour
    • G01R3126
    • H01L23/544H01L24/83H01L2223/54413H01L2223/5442H01L2223/54473H01L2223/54486H01L2224/83192H01L2924/01029H01L2924/01078H01L2924/01079H01L2924/12042H01L2924/14H01L2924/181Y10T29/49004Y10T29/49146Y10T29/53043Y10T29/53178Y10T29/53187H01L2924/00
    • A method and apparatus relating to fabricating semiconductor die packages including a mounting substrate and dice attached thereto. The mounting substrate includes multiple die attach sites and a designator having substrate identification information. The die attach sites are evaluated and categorized as either good or defective die attach sites, wherein the evaluated information is saved in an electronic file as mapped information. A die attach apparatus attaches dice to the die attach sites in accord with the mapped information, wherein known good dice are attached to the good die attach sites and known defective dice are attached to the defective die attach sites. The assembly is then encapsulated in a transfer molding operation. Since each die attach site includes a die attached thereto, the structural integrity of the mounting substrate is maintained and there is greater volume control of encapsulation material in the transfer molding operation to prevent waste and shortage of the encapsulation material. The assembly may then be segregated into individual semiconductor die packages, in which the defective die packages having the defective dice and defective die attach sites are discarded in accord with the mapped information.
    • 涉及制造半导体管芯封装的方法和装置,包括安装衬底和附着于其上的裸片。 安装基板包括多个管芯附接位置和具有衬底识别信息的指示符。 芯片附着位点被评估并分类为良好或有缺陷的裸片附着位点,其中所评估的信息作为映射信息保存在电子文件中。 芯片连接装置根据映射信息将裸片附着到裸片附着位置,其中已知的良好裸片附着到裸片附着位置,并且已知的有缺陷的裸片附着到有缺陷的裸片附着位置上。 然后将组件封装在传递模制操作中。 由于每个管芯附接部位都包括附接到其上的管芯,所以保持安装基板的结构完整性,并且在传输模制操作中对密封材料进行更大的体积控制以防止封装材料的浪费和短缺。 然后将组件分离成单独的半导体管芯封装,其中根据映射的信息丢弃具有缺陷管芯和缺陷管芯附着位置的缺陷管芯封装。
    • 50. 发明授权
    • Method and apparatus for thinning article, and article
    • 减薄物品的方法和装置,以及文章
    • US06180527B2
    • 2001-01-30
    • US09374128
    • 1999-08-09
    • Warren M. FarnworthDerek J. Gochnour
    • Warren M. FarnworthDerek J. Gochnour
    • H01L21302
    • H01L21/304B24B37/042
    • A method for thinning articles, such as wafers in an IC product, includes applying a reference layer to a first surface of the article to be thinned; removing a portion of the reference layer from its exposed surface to provide a reference surface; and thinning the article by removing a portion of the article from its second surface to provide a thinned surface. The orientation of the reference surface relative to the second surface is controlled, and the orientation of the thinned surface relative to the reference surface is controlled. There are also provided apparatuses and systems which are suitable for use in such methods, as well as intermediate articles and finished products containing articles formed in such methods.
    • 用于减薄诸如IC产品中的晶片的制品的方法包括将参考层施加到待稀释的制品的第一表面; 从其暴露的表面去除参考层的一部分以提供参考表面; 并通过从其第二表面去除一部分制品来使制品变薄以提供变薄的表面。 控制参考表面相对于第二表面的取向,并且控制薄化表面相对于参考表面的取向。 还提供了适用于这些方法的装置和系统,以及含有以这种方法形成的制品的中间制品和成品。