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    • 42. 发明授权
    • Surface inspection method and surface inspection apparatus
    • 表面检查方法和表面检查装置
    • US06888918B2
    • 2005-05-03
    • US10715767
    • 2003-11-18
    • Izuo HoraiKenji AikouKyoichi Mori
    • Izuo HoraiKenji AikouKyoichi Mori
    • G01B11/30G01N21/88G01N21/95G01N23/223G01B15/06
    • G01N23/223G01B11/30G01N21/88G01N2021/8861G01N2223/076
    • An optical inspection unit inspects a surface of an object under inspection optically. A processing unit detects defects on the surface of the object under inspection and their features according to inspection results from the optical inspection unit, detects positions of the detected defects on the surface of the object under inspection, and classifies the detected defects according to their features. The processing unit selects the defects, on which a X-ray analysis should be performed, according to predetermined conditions about the features or the classification results of the defects. Alternatively, the processing unit displays the positions and the classification results of the defects, and an operator picks the defects, on which the X-ray analysis should be performed. A X-ray inspection unit performs the X-ray analyses on the selected or picked defects.
    • 光学检查单元在光学上检查被检查物体的表面。 处理单元根据来自光学检查单元的检查结果来检测被检查物体的表面上的缺陷及其特征,检测检测对象表面上检测到的缺陷的位置,并根据其特征对检测到的缺陷进行分类 。 处理单元根据关于缺陷的特征或分类结果的预定条件选择应执行X射线分析的缺陷。 或者,处理单元显示缺陷的位置和分类结果,并且操作者选择应执行X射线分析的缺陷。 X射线检查单元对所选或选择的缺陷进行X射线分析。