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41. 发明申请

US20110128032A1 WAFER FOR TESTING, TEST SYSTEM, AND SEMICONDUCTOR WAFER 审中-公开
标题翻译：用于测试，测试系统和半导体波形的测量
公开(公告)号：US20110128032A1
公开(公告)日：2011-06-02
申请号：US12954562
申请日：2010-11-24
申请人： Daisuke WATANABE , Toshiyuki OKAYASU
发明人： Daisuke WATANABE , Toshiyuki OKAYASU
IPC分类号： G01R31/26
CPC分类号： G01R31/2889
摘要： Provided is a test wafer that tests a plurality of semiconductor chips that are formed on a semiconductor wafer and that each include an operation circuit and an internal memory. The test wafer comprises a plurality of test circuits that correspond to the plurality of semiconductor chips, supply the operation circuits of the corresponding semiconductor chips with measurement signals, and measure electrical characteristics of signals output by the operation circuits in response to the measurement signals; and a plurality of write circuits that correspond to the plurality of semiconductor chips and each write, to the internal memory of the corresponding semiconductor chip, data corresponding to a measurement result of the corresponding test circuit.
摘要翻译：提供了测试形成在半导体晶片上的多个半导体芯片并且每个都包括运算电路和内部存储器的测试晶片。测试晶片包括对应于多个半导体芯片的多个测试电路，向对应的半导体芯片的操作电路提供测量信号，并且响应于测量信号测量由操作电路输出的信号的电特性; 以及对应于多个半导体芯片的多个写入电路，并且将相应的半导体芯片的内部存储器写入对应于相应测试电路的测量结果的数据。

42. 发明申请

US20100090709A1 TEST APPARATUS AND TEST METHOD 有权
标题翻译：测试装置和测试方法
公开(公告)号：US20100090709A1
公开(公告)日：2010-04-15
申请号：US12570400
申请日：2009-09-30
申请人： Daisuke WATANABE , Toshiyuki OKAYASU
发明人： Daisuke WATANABE , Toshiyuki OKAYASU
IPC分类号： H01H31/02
CPC分类号： G01R31/31917 , G01R29/26 , G01R31/31709 , G01R31/31937 , H03K3/84 , H03K5/156
摘要： Provided is a test apparatus that tests a device under test, comprising a pattern generating section that generates a test pattern determined according to a test signal to be supplied to the device under test; a timing signal generating section that generates a timing signal indicating a timing for supplying the test signal to the device under test; a digital filter that filters the test pattern to output a jitter control signal representing jitter corresponding to the test pattern; a jitter injecting section that injects the timing signal with jitter by delaying the timing signal according to the jitter control signal; and a waveform shaping section that generates the test signal formed according to the test pattern, with the timing signal into which the jitter is injected as a reference.
摘要翻译：提供了一种测试被测设备的测试装置，包括：图形生成部，生成根据要提供给被测设备的测试信号确定的测试图; 定时信号生成部，其生成表示将测试信号提供给被测设备的定时的定时信号; 数字滤波器，其过滤测试图案以输出表示对应于测试图案的抖动的抖动控制信号; 抖动注入部分，通过根据抖动控制信号延迟定时信号来注入具有抖动的定时信号; 以及波形整形部，其生成根据测试图案形成的测试信号，其中注入抖动的定时信号作为参考。

43. 发明申请

US20090100281A1 COMMUNICATION DEVICE AND COMMUNICATION METHOD 审中-公开
标题翻译：通信设备和通信方法
公开(公告)号：US20090100281A1
公开(公告)日：2009-04-16
申请号：US12336607
申请日：2008-12-17
申请人： Daisuke WATANABE , Yoshikazu MOTOMURA
发明人： Daisuke WATANABE , Yoshikazu MOTOMURA
IPC分类号： G06F1/32
CPC分类号： H04W52/0235 , H04W74/002 , Y02D70/00
摘要： A communication method includes transmitting a first transition notification of a sleep mode to make allotment of a channel time unnecessary to a first host, and communicating first data to a second host in a first transition state which the first host transits to the sleep mode.
摘要翻译：一种通信方法包括：发送休眠模式的第一转换通知，以便为第一主机分配不需要的信道时间，以及在第一主机转入睡眠模式的第一转换状态下将第一数据传送到第二主机。

44. 发明申请

US20080315130A1 FOCUSED ION BEAM PROCESSING SYSTEM AND METHOD 失效
标题翻译：聚焦离子束处理系统和方法
公开(公告)号：US20080315130A1
公开(公告)日：2008-12-25
申请号：US12144360
申请日：2008-06-23
申请人： Daisuke WATANABE
发明人： Daisuke WATANABE
IPC分类号： H01J37/08
CPC分类号： H01J37/3056 , H01J37/304 , H01J2237/221 , H01J2237/30466 , H01J2237/31745
摘要： A focused ion beam (FIB) processing system includes a FIB irradiation unit that irradiates a FIB onto a pattern formed in a wafer, to form a section of the pattern, an imaging unit that images the section of the pattern, a calculation unit that calculates a pattern size based on the image of the section, a judgment unit that judges whether or not a differential of the pattern size with respect to time is equal to or below a threshold; and a control unit that stops the FIB irradiation unit if the judgment unit judges that the differential of the pattern size is equal to or below the threshold.
摘要翻译：聚焦离子束（FIB）处理系统包括：FIB照射单元，其将FIB照射到形成在晶片中的图案上，以形成图案的一部分;成像单元，其对图案的该部分进行成像;计算单元，其计算基于该部分的图像的图案尺寸;判断单元，判断图案尺寸相对于时间的差异是否等于或低于阈值; 以及控制单元，如果判断单元判断图案尺寸的差异等于或低于阈值，则停止FIB照射单元。

45. 发明申请

US20110193138A1 ELECTRONIC DEVICE AND MANUFACTURING METHOD 有权
标题翻译：电子设备和制造方法
公开(公告)号：US20110193138A1
公开(公告)日：2011-08-11
申请号：US13027977
申请日：2011-02-15
申请人： Daisuke WATANABE , Toshiyuki OKAYASU
发明人： Daisuke WATANABE , Toshiyuki OKAYASU
IPC分类号： H01L31/0224 , H01L31/18
CPC分类号： H01L29/788 , H01L21/28273 , H01L22/14 , H01L22/20 , H03K5/13
摘要： Provided is an electronic device that generates an output signal corresponding to an input signal, comprising a signal processing section that receives the input signal and outputs the output signal corresponding to the input signal, and a floating electrode that accumulates a charge by being irradiated by an electron beam. The signal processing section adjusts electric characteristics of the output signal according to a charge amount accumulated in the floating electrode, and includes a transistor formed on the semiconductor substrate between an input terminal that receives the input signal and an output terminal that outputs the output signal. The floating electrode is formed between a gate electrode of the transistor and the semiconductor substrate
摘要翻译：提供一种电子设备，其产生与输入信号相对应的输出信号，包括：信号处理部，其接收输入信号并输出与输入信号对应的输出信号;以及浮动电极，其通过被电子束。信号处理部根据在浮置电极中累积的电荷量调节输出信号的电特性，并且包括在接收输入信号的输入端子与输出输出信号的输出端子之间形成在半导体基板上的晶体管。浮置电极形成在晶体管的栅电极和半导体衬底之间

46. 发明申请

US20110128027A1 WAFER UNIT FOR TESTING AND TEST SYSTEM 有权
标题翻译：用于测试和测试系统的WAFER单元
公开(公告)号：US20110128027A1
公开(公告)日：2011-06-02
申请号：US12954565
申请日：2010-11-24
申请人： Daisuke WATANABE , Toshiyuki OKAYASU
发明人： Daisuke WATANABE , Toshiyuki OKAYASU
IPC分类号： G01R31/00 , G01R31/02
CPC分类号： G01R31/31917 , G01R31/318511 , H01L22/32
摘要： Provided is a test wafer unit that tests a plurality of circuits under test formed on a wafer under test. The test wafer unit comprises a test wafer that is formed of a semiconductor material and exchanges signals with each of the circuits under test, and a plurality of loop-back sections that are provided in the test wafer to correspond to the plurality of circuits under test and that each supply the corresponding circuit under test with a loop-back signal corresponding to a signal received from the corresponding circuit under test.
摘要翻译：提供了一种测试晶片单元，其测试被测试的晶片上形成的多个被测电路。测试晶片单元包括由半导体材料形成并与被测电路中的每一个交换信号的测试晶片和设置在测试晶片中以对应于被测试的多个电路的多个环回部分并且每个都提供相应的被测电路与对应于从相应的被测电路接收的信号的环回信号。

47. 发明申请

US20110126522A1 EXHAUST APPARATUS FOR TRANSVERSE ENGINE 审中-公开
标题翻译：用于横向发动机的排气装置
公开(公告)号：US20110126522A1
公开(公告)日：2011-06-02
申请号：US12958194
申请日：2010-12-01
申请人： Kenji USHIJIMA , Hirokazu HASEGAWA , Yasushi NAKATANI , Keishi KITABATAKE , Yasushi KUSUNOKI , Toshiaki KAMO , Yoshitaka NAKAMURA , Daisuke WATANABE , Hiroki SHIMOJI , Masami NEGAMI
发明人： Kenji USHIJIMA , Hirokazu HASEGAWA , Yasushi NAKATANI , Keishi KITABATAKE , Yasushi KUSUNOKI , Toshiaki KAMO , Yoshitaka NAKAMURA , Daisuke WATANABE , Hiroki SHIMOJI , Masami NEGAMI
IPC分类号： F01N3/08
CPC分类号： F01N3/10 , B60K5/04 , B60K13/04 , F01N13/08 , F01N13/10 , F01N13/1816 , F01N13/1822 , F01N2340/04 , Y02A50/2322
摘要： Disclosed is an exhaust apparatus (E) for a transverse engine (1) coupled with a transmission (11) located on one side thereof in a cylinder arrangement direction. The exhaust apparatus (E) has an upstream exhaust assembly (48) which comprises a plurality of branch pipe portions (32), a single exhaust pipe portion (34), and an exhaust gas-purifying unit (40). The exhaust gas-purifying unit (40) is disposed on a vehicle-rear side of the engine (1) to allow a gas passage thereinside to extend approximately in a vehicle-widthwise direction, in top plan view. The upstream exhaust assembly (48) includes, on an exhaust upstream side of the single exhaust pipe portion (34), a section which curves to allow an exhaust downstream region of the section to be oriented toward one side of the vehicle-widthwise direction which is a direction coming close to the transmission (11), in top plan view. The single exhaust pipe portion (34) curves to allow an exhaust downstream region of the single exhaust pipe portion (34) to be oriented toward a vehicle-front side, in top plan view. This makes it possible to compactly lay out the upstream exhaust assembly (48) in an engine compartment (19) without sacrificing a passenger compartment space, and quickly raise a temperature of a catalyst in the exhaust gas-purifying unit (40) during warm-up of the engine (1).
摘要翻译：公开了一种用于横向发动机（1）的排气装置（E），其与位于其一侧的气缸排列方向上的变速器（11）联接。排气装置（E）具有包括多个分支管部（32），单个排气管部（34）和排气净化部（40）的上游侧排气组件（48）。排气净化单元（40）设置在发动机（1）的车辆后侧，以允许其内部的气体通道在顶部平面图中大致沿车辆宽度方向延伸。上游排气组件（48）在单个排气管部（34）的排气上游侧包括弯曲部，该部分曲线以允许该部分的排气下游区域朝向车宽方向的一侧是在接近传输（11）的方向，在俯视图。在顶视图中，单个排气管部分34弯曲以允许单个排气管部分（34）的排气下游区域朝向车辆前侧。这使得可以在不牺牲乘客室空间的情况下将发动机室（19）中的上游排气组件（48）紧凑地布置，并且在暖气期间快速提高排气净化单元（40）中的催化剂的温度，（1）。

48. 发明申请

US20100026329A1 TEST APPARATUS AND ELECTRONIC DEVICE 有权
标题翻译：测试装置和电子设备
公开(公告)号：US20100026329A1
公开(公告)日：2010-02-04
申请号：US12512933
申请日：2009-07-30
申请人： Daisuke WATANABE , Toshiyuki OKAYASU
发明人： Daisuke WATANABE , Toshiyuki OKAYASU
IPC分类号： G01R1/06
CPC分类号： G01R31/31813 , G01R31/318385 , G01R31/318544
摘要： Provided is a test apparatus that tests a device under test including an external interface circuit that transfers signals between an internal circuit inside a device and the outside of the device, the test apparatus comprising a pattern generating section that inputs, to the external interface circuit, a test pattern for testing the external interface circuit; an interface control section that causes the external interface circuit to loop back and output the test pattern; and an interface judging section that judges acceptability of the external interface circuit based on the test pattern looped back and output by the external interface circuit.
摘要翻译：提供一种测试装置，其测试包括在设备内部的内部电路和设备外部之间传送信号的外部接口电路的测试设备，所述测试设备包括：图案生成部分，其将外部接口电路，用于测试外部接口电路的测试模式; 接口控制部，其使外部接口电路回路并输出测试图案; 以及接口判断部，其基于由外部接口电路回送并输出的测试模式来判断外部接口电路的可接受性。

49. 发明申请

US20090268926A1 SEMICONDUCTOR INTEGRATED CIRCUIT AND CONDENSER MICROPHONE 有权
标题翻译：半导体集成电路和冷凝器麦克风
公开(公告)号：US20090268926A1
公开(公告)日：2009-10-29
申请号：US12392625
申请日：2009-02-25
申请人： Daisuke WATANABE
发明人： Daisuke WATANABE
IPC分类号： H04R3/00 , H01L27/06
CPC分类号： H03F1/523 , H01L27/0255 , H03F3/187 , H04R19/005
摘要： A semiconductor integrated circuit for a condenser microphone according to one exemplary aspect of the present invention includes a first resistor, a second resistor, a power supply terminal, a first capacitor, and a first diode. The first resistor and the second resistor are connected between a drain of an output transistor and an output terminal in series. The power supply terminal is connected to a source of the output transistor. The first capacitor is arranged between the power supply terminal and a connection point of the first resistor and the second resistor. The first diode is connected in parallel with the first capacitor.
摘要翻译：根据本发明的一个示例性方面的用于电容式麦克风的半导体集成电路包括第一电阻器，第二电阻器，电源端子，第一电容器和第一二极管。第一电阻器和第二电阻器串联连接在输出晶体管的漏极和输出端子之间。电源端子连接到输出晶体管的源极。第一电容器布置在电源端子和第一电阻器和第二电阻器的连接点之间。第一个二极管与第一个电容并联。

50. 发明申请

US20120227857A1 Twisted Wire and Method of Producing Twisted Wire 失效
标题翻译：双绞线和生产双绞线的方法
公开(公告)号：US20120227857A1
公开(公告)日：2012-09-13
申请号：US13461016
申请日：2012-05-01
申请人： Daisuke WATANABE
发明人： Daisuke WATANABE
IPC分类号： B21F15/04
CPC分类号： H01B13/0271 , Y10T29/4989 , Y10T29/5187 , Y10T428/12333
摘要： A twisted wire 1 is produced by twisting two wires 2 together. When that portion of the twisted wire 1 extending from one ends 3 of the two wires 2 to a first predetermined position 4 is defined as a one end-side twisted portion 5, and that portion of the twisted wire 1 extending from the first predetermined position 4 to a second predetermined position 6 is defined as an intermediate twisted portion 7, and that portion of the twisted wire 1 extending from the second predetermined position 6 to the other ends 8 of the two wires 2 is defined as an other end-side twisted portion 9, a twisting pitch of the one end-side twisted portion 5 and the other end-side twisted portion 9 is smaller than a twisting pitch of the intermediate twisted portion 7.
摘要翻译：绞合线1通过将两根线2绞合在一起而制成。当从两条电线2的一端3延伸到第一预定位置4的绞合线1的那部分被定义为一端侧扭曲部分5时，绞线1的从第一预定位置延伸的部分 4至第二预定位置6被定义为中间扭转部分7，并且从第二预定位置6延伸到两条电线2的另一端8的绞合线1的那部分被定义为另一端侧扭曲部分9，一端侧扭转部分5和另一端侧扭转部分9的扭转间距小于中间扭转部分7的扭转间距。

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