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    • 42. 发明授权
    • Circuit and method for interpolative delay
    • 内插延迟的电路和方法
    • US07116147B2
    • 2006-10-03
    • US10967898
    • 2004-10-18
    • Kiyoshi Kase
    • Kiyoshi Kase
    • H03L7/06
    • H03L7/0814H03K5/133H03K5/1504H03K2005/00039
    • A circuit and a method for interpolative delay is provided. The circuit includes a delay locked loop with interpolation delay. The delay locked loop includes a differential inverter, an interpolation circuit, and a differential compare circuit. The differential inverter is coupled to receive a differential clock signal and coupled to provide an inverted differential clock signal. The interpolation circuit is coupled to receive both the clock signal and the inverted clock signal, and to provide an interpolated clock signal having a first delay relative to the clock signal. The differential compare circuit is coupled to receive the inverted clock signal and coupled to provide a non-interpolated clock signal having a second delay relative to the clock signal. The second delay corresponds to a full delay of the differential inverter and the first delay corresponds to a predetermined fraction of the full delay.
    • 提供了一种用于内插延迟的电路和方法。 该电路包括具有插值延迟的延迟锁定环。 延迟锁定环路包括差分逆变器,内插电路和差分比较电路。 差分反相器耦合以接收差分时钟信号并被耦合以提供反相差分时钟信号。 内插电路被耦合以接收时钟信号和反相时钟信号,并提供相对于时钟信号具有第一延迟的内插时钟信号。 差分比较电路被耦合以接收反相时钟信号并被耦合以提供相对于时钟信号具有第二延迟的非内插时钟信号。 第二延迟对应于差分逆变器的完全延迟,并且第一延迟对应于完全延迟的预定分数。
    • 45. 发明授权
    • Sample and hold circuit and method therefor
    • 采样保持电路及其方法
    • US06198314B1
    • 2001-03-06
    • US09236064
    • 1999-01-25
    • Kiyoshi Kase
    • Kiyoshi Kase
    • G11C2702
    • G11C27/024
    • A sample and hold circuit (200) accepts an input (202). During a first half of the clock (204) (either an active high portion or an active low portion) the devices (216, 220, and 222) drive the node (218) to a voltage representative of the voltage present on input (202). At a rising edge of the clock (204), the switch (222) is disabled and the voltage on the node (218) is forced to a higher hold voltage by a capacitor (224). While sample circuit (208) is holding the high voltage on node (218), a hold circuit (210) is settling to a hold voltage representative of the voltage on node (218) in a master-slave fashion. This manner of clocking and controlling the circuit (200) allows circuit (200) to be used in low power, high speed telecommunications systems.
    • 采样和保持电路(200)接受输入(202)。 在第一半时钟(204)(有效高部分或有效低电平部分)期间,器件(216,220和222)将节点(218)驱动到表示输入(202)上存在的电压的电压 )。 在时钟(204)的上升沿,开关(222)被禁止,并且节点(218)上的电压被电容器(224)强制到更高的保持电压。 当采样电路(208)保持节点(218)上的高电压时,保持电路(210)以主从方式建立到表示节点(218)上的电压的保持电压。 时钟和控制电路(200)的这种方式允许电路(200)用于低功率,高速电信系统中。
    • 46. 发明授权
    • Overcurrent sense circuit
    • 过流检测电路
    • US5559500A
    • 1996-09-24
    • US401751
    • 1995-03-09
    • Kiyoshi Kase
    • Kiyoshi Kase
    • G01R19/165G01R31/40H02H3/087G08B21/00
    • H02H3/087G01R19/16538G01R31/40
    • An overcurrent is detected with small power consumption and at a high level of accuracy. A first transistor section 3 comprised of one NPN transistor 31 and a second transistor section 4 comprised of four NPN transistors 41-44 having the same characteristics as those of the transistor 31 are connected across a current sense resistor 2, with their emitters connected to the resistor 2. The transistors 31 and 41-44 have their bases commonly connected, with a voltage applied between their base and emitter by a voltage application unit 5, and have their collectors connected to transistors 61 and 62 which form a current mirror circuit. Once a bandgap voltage, .DELTA.V.sub.BE, i.e., a voltage difference between the base-emitter voltages of the transistor sections 3 and 4, is determined, the current density ratio of both the transistor sections 3 and 4 is determined, which is used to detect an overcurrent.
    • 以低功耗和高精度检测过电流。 由具有与晶体管31相同特性的四个NPN晶体管41-44构成的一个NPN晶体管31和第二晶体管部分4构成的第一晶体管部分3连接在电流检测电阻器2上,其发射极连接到 晶体管31和41-44的基极共同连接,电压施加单元5在其基极和发射极之间施加电压,并且其集电极连接到形成电流镜电路的晶体管61和62。 一旦确定了带隙电压DELTA VBE,即晶体管部分3和4的基极 - 发射极间电压之间的电压差,则确定两个晶体管部分3和4的电流密度比,这被用于检测 过电流