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    • 47. 发明申请
    • MEMORY SYSTEM AND METHOD FOR ASSIGNING ADDRESSES TO MEMORY DEVICES
    • 用于将地址分配给存储器件的存储器系统和方法
    • US20050160216A1
    • 2005-07-21
    • US11079407
    • 2005-03-14
    • Robert NormanVinod Lakhani
    • Robert NormanVinod Lakhani
    • G06F12/06G06F12/00
    • G06F13/1694G06F12/0661
    • A memory system having a memory controller and several separate memory devices connected to the controller by a system bus. The memory devices each included an array of memory cells, addressing circuitry used to address the cells and an address storage circuit which stores a local address unique to each of the memory devices. The local addresses are sequentially assigned to the memory devices by selecting a first one of the devices and forwarding an address assign command to the selected device. A command decoder, having detected the address assign command, will permit a local address placed on the bus by the controller to be loaded into the selected memory device. This sequence will continue until all of the memory devices have been assigned local addresses at which time the memory devices can be accessed to perform memory read, program, erase and other operations.
    • 一种存储器系统,具有存储器控制器和通过系统总线连接到控制器的几个单独的存储器件。 存储器件各自包括存储器单元阵列,用于寻址单元的寻址电路和存储每个存储器件唯一的本地地址的地址存储电路。 通过选择设备中的第一个并将地址分配命令转发到所选择的设备,将本地地址依次分配给存储器设备。 已经检测到地址分配命令的命令解码器将允许由控制器放置在总线上的本地地址被加载到所选择的存储器件中。 该序列将继续,直到所有存储器件都被分配了本地地址,此时可以访问存储器件以执行存储器读取,编程,擦除和其他操作。
    • 49. 发明授权
    • Method and apparatus for programming multi-state cells in a memory device
    • 用于在存储器件中编程多状态单元的方法和装置
    • US06567302B2
    • 2003-05-20
    • US09884628
    • 2001-06-19
    • Vinod Lakhani
    • Vinod Lakhani
    • G11C1604
    • G11C16/3463G11C11/5621G11C11/5628G11C16/10G11C16/3486
    • A method for programming multi-state floating gate transistor memory cells, also called multi-state flash cells, in a memory system is disclosed. The memory system includes control circuitry for controlling an array of multi-state flash cells which are arranged in blocks and connected together in rows and columns. The method is implemented as a series of programmable instructions stored and implemented in the memory system. According to the method groups of multi-state flash cells are incrementaly programmed. In each programming step the threshold voltage levels of the cells being programmed is raised only one state. Successive subgroups of cells are programmed to increase their threshold voltage levels in a step-by-step manner. The multi-state flash cells are programmed to store the desired data over several steps. Cells that are under-programmed in any step are reprogrammed before the method continues. Margins between the threshold voltage levels in the cells are maintained by a verification of the programmed cells. Over-programmed multi-state flash cells are identified and discarded at each programming step by calculating and retaining overshoot data.
    • 公开了一种用于在存储器系统中编程多态浮栅晶体管存储单元(也称为多状态闪存单元)的方法。 存储器系统包括用于控制多个状态闪存单元的阵列的控制电路,其以块和列的形式排列并以行和列连接在一起。 该方法被实现为在存储器系统中存储和实现的一系列可编程指令。 根据该方法,多状态闪存单元组被增量编程。 在每个编程步骤中,正被编程的单元的阈值电压电平仅升高一个状态。 单元的连续子组被编程为以逐步方式增加它们的阈值电压电平。 多状态闪存单元被编程为在几个步骤中存储所需的数据。 在任何步骤中编程不足的单元格在方法继续之前重新编程。 通过验证编程的单元来维持单元中的阈值电压电平之间的裕度。 通过计算和保留过冲数据,在每个编程步骤中识别并丢弃过度编程的多状态闪存单元。