专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

41. 发明申请

US20080284837A1 METHODS AND SYSTEMS FOR THERMA-BASED LASER PROCESSING A MULTI-MATERIAL DEVICE 有权
标题翻译：用于基于激光加工的多种材料的方法和系统
公开(公告)号：US20080284837A1
公开(公告)日：2008-11-20
申请号：US12165853
申请日：2008-07-01
申请人： James J. Cordingley , Jonathan S. Ehrmann , David M. Filgas , Shepard D. Johnson , Joohan Lee , Donald V. Smart , Donald J. Svetkoff
发明人： James J. Cordingley , Jonathan S. Ehrmann , David M. Filgas , Shepard D. Johnson , Joohan Lee , Donald V. Smart , Donald J. Svetkoff
IPC分类号： B41J2/435 , G01B11/14
CPC分类号： B23K26/0736 , B23K26/032 , B23K26/04 , B23K26/043 , B23K26/0613 , B23K26/0622 , B23K26/0624 , B23K26/064 , B23K26/0643 , B23K26/0648 , B23K26/0652 , B23K26/0665 , B23K26/067 , B23K26/082 , B23K26/10 , B23K26/16 , B23K26/361 , B23K26/389 , B23K26/40 , B23K2101/38 , B23K2101/40 , B23K2103/10 , B23K2103/12 , B23K2103/172 , B23K2103/50 , H01L21/485 , H01L21/76888 , H01L21/76894 , H01L22/12 , H01L23/5258 , H01L2924/0002 , H05K3/0026 , H01L2924/00
摘要： A method and system for locally processing a predetermined microstructure formed on a substrate without causing undesirable changes in electrical or physical characteristics of the substrate or other structures formed on the substrate are provided. The method includes providing information based on a model of laser pulse interactions with the predetermined microstructure, the substrate and the other structures. At least one characteristic of at least one pulse is determined based on the information. A pulsed laser beam is generated including the at least one pulse. The method further includes irradiating the at least one pulse having the at least one determined characteristic into a spot on the predetermined microstructure. The at least one determined characteristic and other characteristics of the at least one pulse are sufficient to locally process the predetermined microstructure without causing the undesirable changes.
摘要翻译：提供一种用于局部处理形成在基板上的预定微结构而不引起基板或其上形成在基板上的其它结构的电学或物理特性的不期望的变化的方法和系统。该方法包括基于与预定微结构，衬底和其它结构的激光脉冲相互作用的模型来提供信息。基于该信息确定至少一个脉冲的至少一个特性。生成包括至少一个脉冲的脉冲激光束。该方法还包括将具有至少一个确定特性的至少一个脉冲照射到预定微结构上的点中。所述至少一个脉冲的至少一个确定的特征和其它特征足以在不引起不期望的变化的情况下局部地处理预定的微结构。

42. 发明授权

US07181058B2 Method and system for inspecting electronic components mounted on printed circuit boards 有权
标题翻译：检查安装在印刷电路板上的电子部件的方法和系统
公开(公告)号：US07181058B2
公开(公告)日：2007-02-20
申请号：US09735097
申请日：2000-12-11
申请人： John J. Weisgerber , Donald J. Svetkoff , Donald K. Rohrer
发明人： John J. Weisgerber , Donald J. Svetkoff , Donald K. Rohrer
IPC分类号： G06K9/00
CPC分类号： H05K13/08
摘要： A method and system are provided for inspecting electronic components mounted on printed circuit boards utilizing both 3-D and 2-D data associated with the components and the background on which they are mounted on the printed circuit board. Preferably, a 3-D scanner in the form of a solid state dual detector laser images the components and solder paste on the printed circuit board to obtain the 3-D and 2-D data. Then, a high speed image processor processes the 3-D data to find the locations of the leads and the solder paste. Then, the high speed image processor processes the 2-D data together with the locations of the leads and the solder paste to distinguish the leads from the solder paste. The high speed image processor may calculate centroids of feet of the leads, average height of the feet and border violation percentage of the solder paste.
摘要翻译：提供了一种方法和系统，用于利用与组件相关联的3-D和2-D数据以及它们安装在印刷电路板上的背景来检查安装在印刷电路板上的电子部件。优选地，以固态双检测器形式的3-D扫描仪将印刷电路板上的部件和焊膏成像，以获得3-D和2-D数据。然后，高速图像处理器处理3-D数据以找到引线和焊膏的位置。然后，高速图像处理器将二维数据与引线和焊膏的位置一起处理以区分引线与焊膏。高速图像处理器可以计算引线的脚的重心，脚的平均高度和焊膏的边界违例百分比。

43. 发明授权

US06979798B2 Laser system and method for material processing with ultra fast lasers 失效
标题翻译：激光系统和超快激光材料处理方法
公开(公告)号：US06979798B2
公开(公告)日：2005-12-27
申请号：US10787517
申请日：2004-02-26
申请人： Bo Gu , Donald J. Svetkoff , Kurt Pelsue
发明人： Bo Gu , Donald J. Svetkoff , Kurt Pelsue
IPC分类号： B23K26/06 , B23K26/38 , B23K26/36
CPC分类号： B23K26/38 , B23K26/0624 , B23K2101/40
摘要： Laser system and method for material processing with ultra fast lasers are provided. One aspect of the invention features the method which removes at least a portion of a target structure such as a memory link while avoiding undesirable damage to adjacent non-target structures. The method includes applying a single ultra short laser pulse to the target structure to remove the target structure with the single pulse.
摘要翻译：提供了具有超快激光材料处理的激光系统和方法。本发明的一个方面的特征在于除去目标结构的至少一部分，例如存储器链路，同时避免对相邻的非目标结构的不期望的损坏。该方法包括将单个超短激光脉冲施加到目标结构以用单个脉冲去除目标结构。

44. 发明授权

US06777645B2 High-speed, precision, laser-based method and system for processing material of one or more targets within a field 有权
标题翻译：高速，精密，基于激光的方法和系统，用于处理场内一个或多个靶材的材料
公开(公告)号：US06777645B2
公开(公告)日：2004-08-17
申请号：US10107027
申请日：2002-03-27
申请人： Jonathan S. Ehrmann , James J. Cordingley , Donald V. Smart , Donald J. Svetkoff
发明人： Jonathan S. Ehrmann , James J. Cordingley , Donald V. Smart , Donald J. Svetkoff
IPC分类号： B23K2606
CPC分类号： B23K26/0736 , B23K26/032 , B23K26/04 , B23K26/043 , B23K26/0613 , B23K26/0622 , B23K26/0624 , B23K26/064 , B23K26/0643 , B23K26/0648 , B23K26/0652 , B23K26/0665 , B23K26/067 , B23K26/082 , B23K26/10 , B23K26/16 , B23K26/361 , B23K26/389 , B23K26/40 , B23K2101/38 , B23K2101/40 , B23K2103/10 , B23K2103/12 , B23K2103/172 , B23K2103/50 , H01L21/485 , H01L21/76888 , H01L21/76894 , H01L22/12 , H01L23/5258 , H01L2924/0002 , H05K3/0026 , H01L2924/00
摘要： A precision, laser-based method and system for high-speed, sequential processing of material of targets within a field are disclosed that control the irradiation distribution pattern of imaged spots. For each spot, a laser beam is incident on a first anamorphic optical device and a second anamorphic optical device so that the beam is controllably modified into an elliptical irradiance pattern. The modified beam is propagated through a scanning optical system with an objective lens to image a controlled elliptical spot on the target. In one embodiment, the relative orientations of the devices along an optical axis are controlled to modify the beam irradiance pattern to obtain an elliptical shape while the absolute orientation of the devices controls the orientation of the elliptical spot.
摘要翻译：公开了一种精确的，基于激光的方法和系统，用于高速，顺序地处理场内目标物质的方法和系统，其控制成像斑点的照射分布模式。对于每个点，激光束入射在第一变形光学器件和第二变形光学器件上，使得光束被可控地修改为椭圆辐照度图案。修改的光束通过具有物镜的扫描光学系统传播，以对靶上的受控椭圆点进行成像。在一个实施例中，控制沿着光轴的装置的相对取向以修改束辐照度图案以获得椭圆形，同时装置的绝对取向控制椭圆点的取向。

45. 发明授权

US5815275A Method and system for triangulation-based, 3-D imaging utilizing an angled scanning beam of radiant energy 失效
标题翻译：用于基于三角测量的三维成像的方法和系统，其利用角度扫描的辐射能量束
公开(公告)号：US5815275A
公开(公告)日：1998-09-29
申请号：US825108
申请日：1997-03-27
申请人： Donald J. Svetkoff , Donald K. Rohrer , David A. Noblett , Robert L. Jackson
发明人： Donald J. Svetkoff , Donald K. Rohrer , David A. Noblett , Robert L. Jackson
IPC分类号： G01B11/24 , G01B11/245 , G01S7/497 , G01S17/46 , G01S17/88 , G01S17/89 , H05K13/00 , H05K13/08
CPC分类号： G01S17/48 , G01S17/89 , H05K13/0015 , H05K13/08 , G01S17/88 , G01S7/497
摘要： A method and system for three-dimensional imaging of objects, including integrated circuit interconnections and many other microelectronic assemblies and miniature parts, is used to greatly improve the efficiency of triangulation-based laser line scanning systems. A scanning beam is incident at a normal angle to the X,Y inspection plane with the scan line oriented at 45.degree., diagonal to an axis defining a first direction of motion. Motion of the imaging head along the axis is used to acquire line scan images in the non-orthogonal coordinate system having symmetry about the orthogonal axes of motion.
摘要翻译：用于物体三维成像（包括集成电路互连和许多其他微电子组件和微型部件）的方法和系统用于大大提高基于三角测量的激光线扫描系统的效率。扫描光束以与X，Y检查平面垂直的角度入射，扫描线定向在45°处，与定义第一运动方向的轴对角。使用成像头沿着轴的运动来获取具有关于正交运动轴对称的非正交坐标系中的行扫描图像。

46. 发明授权

US5812269A Triangulation-based 3-D imaging and processing method and system 失效
标题翻译：基于三角测量的三维成像和处理方法及系统
公开(公告)号：US5812269A
公开(公告)日：1998-09-22
申请号：US853305
申请日：1997-05-09
申请人： Donald J. Svetkoff , Donald K. Rohrer , Robert W. Kelley
发明人： Donald J. Svetkoff , Donald K. Rohrer , Robert W. Kelley
IPC分类号： G01B11/24
CPC分类号： G01B11/24
摘要： A triangulation-based method and system for high speed 3D and gray scale imaging and associated pre-processing of digitized information allows for estimation or filtering of height and gray scale values based upon the confidence level of the information obtained from a pair of sensors and also based upon knowledge of the object structure and its reflectance characteristics. A modulated laser beam is scanned across the object to create a plurality of spots which are viewed by a pair of well-matched receivers. Each receiver includes a light collection and delivery system, a position sensitive detector, and an associated ratiometric signal processor, or similar means for extraction of height and intensity information or data by triangulation. An optional automatic light control sub-system provides greatly extended dynamic range with control inputs derived from an amplifying detector included in each receiver to maximize occurrences of valid data points. Prior to image processing, each point in the digitized 3D and gray scale data is transformed based upon the digital values of the gray scale and height values. The multi-channel pointwise transformation produces an improved estimate of intensity and height at a point of interest, or is used to filter the data for improvements in the 3D and gray scale contrast prior to image processing and measurement analysis. Either linear or non-linear transformations are utilized, based on the match between 3D and gray values, and other conditions which determine the confidence level of the information.
摘要翻译：用于高速3D和灰度成像以及相关的数字化信息预处理的基于三角测量的方法和系统允许基于从一对传感器获得的信息的置信水平来估计或过滤高度和灰度值，并且还基于对象结构及其反射特性的知识。经过对象扫描调制的激光束以产生由一对良好匹配的接收机观看的多个点。每个接收器包括光收集和传送系统，位置敏感检测器和相关联的比率信号处理器，或用于通过三角测量提取高度和强度信息或数据的类似装置。可选的自动光控子系统通过从每个接收器中包括的放大检测器得到的控制输入提供极大的扩展动态范围，以最大化有效数据点的出现。在图像处理之前，数字化3D和灰度数据中的每个点都基于灰度和高度值的数字值进行变换。多通道点转换产生了对感兴趣点的强度和高度的改进估计，或者用于过滤数据，以在图像处理和测量分析之前对3D和灰度级对比度进行改进。基于3D和灰度值之间的匹配以及确定信息的置信水平的其他条件，使用线性或非线性变换。

47. 发明授权

US4928313A Method and system for automatically visually inspecting an article 失效
标题翻译：用于自动视觉检查物品的方法和系统
公开(公告)号：US4928313A
公开(公告)日：1990-05-22
申请号：US355816
申请日：1989-05-19
申请人： Patrick F. Leonard , Donald J. Svetkoff , Robert W. Kelley , Donald K. Rohrer , E. North Coleman, Jr.
发明人： Patrick F. Leonard , Donald J. Svetkoff , Robert W. Kelley , Donald K. Rohrer , E. North Coleman, Jr.
IPC分类号： G01N21/956 , G06T7/00
CPC分类号： G06T7/001 , G01N21/956 , G06T2207/30148
摘要： A method and system are disclosed for automatically visually inspecting an article such as an electronic circuit wherein both reference and non-reference algorithms are utilized to detect circuit defects. The system includes a pipelined cellular image processor which is utilized to implement the non-reference algorithm and an arithmetic logic unit (ALU) is coupled to the output of the cellular image processor to perform the reference method. The non-reference method includes a spaces and traces algorithm and the reference method includes a topology matching algorithm. The system also includes an algorithm for locating and gauging critical areas of the circuit with sub-pixel accuracy. The cellular image processor is supported by a matched host image processor system
摘要翻译：公开了用于自动目视检查诸如电子电路的物品的方法和系统，其中使用参考和非参考算法来检测电路缺陷。该系统包括用于实现非参考算法的流水线蜂窝图像处理器，并且算术逻辑单元（ALU）耦合到蜂窝图像处理器的输出以执行参考方法。非参考方法包括空格和跟踪算法，该参考方法包括拓扑匹配算法。该系统还包括用于定位和测量具有子像素精度的电路的关键区域的算法。蜂窝图像处理器由匹配的主机图像处理器系统支持

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式