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    • 43. 发明授权
    • Optical measuring system and optical measuring method
    • 光学测量系统和光学测量方法
    • US07488070B2
    • 2009-02-10
    • US11472030
    • 2006-06-21
    • Christoph HaugerPeter Reimer
    • Christoph HaugerPeter Reimer
    • A61B3/00A61B3/10
    • A61B3/1015A61B3/1005A61B3/102A61B3/12G01J9/00G01N21/47
    • An optical measuring system, including at least one radiation source; a first beam splitter; a second beam splitter; an OCT detector; a wavefront detector which is different from the OCT detector; at least one active optical element; and a collimator. The radiation source, the first beam splitter, the second beam splitter, the OCT detector, the wavefront detector, the at least one active optical element, and the collimator are arranged such that a source beam generated by the at least one radiation source is divided into an object illuminating beam and a reference beam by the first beam splitter; the object illuminating beam is directed by the collimator to an object position via the at least one active optical element; radiation emanating from the object position is formed to an object measuring beam by at least the collimator; the object measuring beam is directed to the second beam splitter via the at least one active optical element; the object measuring beam is divided into an OCT measuring beam and a wavefront measuring beam by the second beam splitter; the wavefront measuring beam is directed to the wavefront detector; the OCT measuring beam is directed to the OCT detector; and the reference beam is directed to the OCT detector.
    • 一种光学测量系统,包括至少一个辐射源; 第一分束器; 第二分束器; OCT检测器 与OCT检测器不同的波前检测器; 至少一个有源光学元件; 和准直仪。 辐射源,第一分束器,第二分束器,OCT检测器,波前检测器,至少一个有源光学元件和准直器被布置成使得由至少一个辐射源产生的源光束被分割 通过第一分束器成为物体照明光束和参考光束; 物体照明光束通过至少一个有源光学元件被准直器引导到物体位置; 从物体位置发出的辐射通过至少准直器形成对象测量光束; 物体测量光束经由至少一个有源光学元件被引导到第二分束器; 物体测量光束由第二分束器分为OCT测量光束和波前测量光束; 波前测量光束被引导到波前检测器; OCT测量光束被引导到OCT检测器; 并且参考光束被引导到OCT检测器。
    • 44. 发明申请
    • Microscopy System
    • 显微镜系统
    • US20080212171A1
    • 2008-09-04
    • US12090629
    • 2006-10-20
    • Fritz StrahleChristoph Hauger
    • Fritz StrahleChristoph Hauger
    • G02B21/22
    • G02B21/025G02B15/14G02B17/026G02B21/0028G02B21/22
    • The invention relates to a microscopy system for representing an object that can be placed on an object plane (1) of the microscopy system, the latter comprising a representation system (26) containing several optical elements for providing at least one optical representation path (2a, 2b, 2c, 2d). According to one embodiment of the invention, the optical elements comprise a plurality of optical lenses (4-8, 11, 13, 14), through which the optical representation path(s) (2a-2d) pass(es) in sequence and which represent the object plane (1) in an intermediate image (P). The optical lenses (4-8, 11) are configured in such a way that the representation of the object plane (1) in the intermediate image (P) is reduced a maximum 0.9 times, preferably a maximum 0.8 times, preferably a maximum 0.6 times, with 0.5 times being the preferred maximum reduction.
    • 本发明涉及一种用于表示可放置在显微系统的物平面(1)上的物体的显微镜系统,后者包括一个表示系统(26),其包含若干光学元件,用于提供至少一个光学表示路径(2) a,2b,2c,2d)。 根据本发明的一个实施例,光学元件包括多个光学透镜(4至8,11,13,14),光学表示路径(a2a-2d)通过该光学透镜 并且其表示中间图像(P)中的物体平面(1)。 光学透镜(4〜8,11)的配置使得中间图像(P)中的物平面(1)的表示最大减少0.9倍,优选地减小最大0.8倍,优选地减小最大0.6 次,优选最大减少量为0.5倍。
    • 47. 发明授权
    • Microscope system
    • 显微镜系统
    • US08040599B2
    • 2011-10-18
    • US12162601
    • 2007-01-30
    • Joachim SteffenHelge JessChristoph Hauger
    • Joachim SteffenHelge JessChristoph Hauger
    • G02B21/06G02B21/00
    • G02B21/16G02B21/20G02B21/22
    • A microscope system is for sequential observation of different fluorescent dyes that are accumulated in a tissue in an object plane. An illumination system and an observation system have at least two operating states. In one operating state, illumination radiation has a spectrum that includes an excitation band of a first fluorescent dye and is partly free from an excitation band of another fluorescent dye. In one operating state of the observation system, observation radiation guided in the first observation optical path has a spectrum in sections of the first observation optical path, which includes a first fluorescence band of the first fluorescent dye, while in another operating state observation radiation has a spectrum in at least some sections which is partly free from the first fluorescence band. A controller is configured to selectively switch the illumination system and the observation system into the first and second operating states.
    • 显微镜系统用于顺序观察积聚在物体平面中的组织中的不同荧光染料。 照明系统和观察系统具有至少两个操作状态。 在一个操作状态下,照射辐射具有包括第一荧光染料的激发带并且部分没有另一荧光染料的激发带的光谱。 在观察系统的一个操作状态下,在第一观察光路中引导的观察辐射具有包括第一荧光染料的第一荧光带的第一观察光路的部分的光谱,而在另一个操作状态下,观察辐射具有 在至少部分无第一荧光带的部分的光谱。 控制器被配置为选择性地将照明系统和观察系统切换到第一和第二操作状态。
    • 49. 发明申请
    • STEREOSCOPIC MICROSCOPE
    • US20110170179A1
    • 2011-07-14
    • US13071975
    • 2011-03-25
    • Fritz StrãhleChristoph Hauger
    • Fritz StrãhleChristoph Hauger
    • G02B21/22
    • G02B21/22
    • A microscope or stereomicroscope for representing an object that can be placed on an object plane of the stereomicroscope provides at least one pair of optical paths and comprises at least one deflection element with a reflecting surface and a representation system containing several optical elements. The optical elements include a plurality of lenses. In addition, the optical elements are configured in such a way that pupil planes of the optical representation paths intersect the reflecting surface of the deflection element or are located at a distance from said reflecting surface less than 1.5 times the diameter of one of the reflecting surfaces along the optical representation paths on the closest lens of the plurality of lenses. An alternative embodiment provides a stereomicroscope with a particularly compact construction, in which at least one pair of optical representation paths is reflected on a first, second, third, and fourth reflecting surface.
    • 用于表示可以放置在立体显微镜的物平面上的物体的显微镜或立体显微镜提供至少一对光路,并且包括具有反射表面的至少一个偏转元件和包含多个光学元件的表示系统。 光学元件包括多个透镜。 此外,光学元件被配置成使得光学表示路径的光瞳平面与偏转元件的反射表面相交,或者位于离所述反射表面一定距离处的距离小于反射表面之一的直径的1.5倍 沿着多个透镜最近的透镜上的光学表示路径。 替代实施例提供具有特别紧凑结构的立体显微镜,其中至少一对光学表示路径在第一,第二,第三和第四反射表面上被反射。