会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 42. 发明申请
    • Radio Frequency Assigning Apparatus, Wireless Communication System, and Radio Frequency Assigning Method
    • 射频分配装置,无线通信系统和射频分配方法
    • US20070242650A1
    • 2007-10-18
    • US11628986
    • 2005-06-09
    • Atsushi Fujiwara
    • Atsushi Fujiwara
    • H04L12/28
    • H04W72/0406
    • A radio channel allocation apparatus of a node in a radio communication system which controls to allocate a radio channel between nodes by a virtual carrier sense is disclosed. The radio channel allocation apparatus includes a node information collecting unit which collects information of a neighboring node to which the node can directly transmit data, and a radio channel determining unit that determines a radio channel, which is allocated to a communication link between a node which has transmission inhibition conditions and another node which does not have the transmission inhibition conditions by communications between predetermined nodes. The determined radio channel is a different radio channel from a radio channel between the predetermined nodes, based on node information of the node and the neighboring node.
    • 公开了一种无线电通信系统中的无线电信道分配装置,其控制通过虚拟载波侦听在节点之间分配无线电信道。 无线电信道分配装置包括:节点信息收集单元,其收集节点可以直接发送数据的相邻节点的信息;以及无线信道确定单元,其确定分配给节点之间的通信链路的无线电信道, 具有传输抑制条件,另一节点不具有通过预定节点之间的通信的传输抑制条件。 基于节点和相邻节点的节点信息,确定的无线电信道是与预定节点之间的无线电信道不同的无线电信道。
    • 46. 发明授权
    • Pressure control apparatus
    • 压力控制装置
    • US06338358B1
    • 2002-01-15
    • US09644674
    • 2000-08-24
    • Tadao WatanabeAtsushi Fujiwara
    • Tadao WatanabeAtsushi Fujiwara
    • G05D1620
    • G05D16/2093Y10T137/2544Y10T137/7761
    • Disclosed is a pressure control apparatus comprising an air-supplying solenoid-operated valve and an air-discharging solenoid-operated valve which are composed of normally closed type solenoid-operated valves respectively, a power source-monitoring circuit for detecting whether or not a power supply source is dropped to be lower than a predetermined value, a power source-compensating circuit for delaying drop of a solenoid-operated valve-driving power source for driving the air-discharging solenoid-operated valve when the power supply source is dropped, and a control circuit for deriving an OFF signal to the air-supplying solenoid-operated valve and deriving an ON signal to the air-discharging solenoid-operated valve when the power supply source is dropped.
    • 公开了一种压力控制装置,包括分别由常闭型电磁阀构成的供气电磁阀和排气电磁阀,电源监视电路,用于检测电力 供电源降低到预定值以下;电源补偿电路,用于在供电源下降时延迟用于驱动排气电磁阀的电磁阀驱动电源的下降;以及 控制电路,用于在供电电磁阀下降时向空气供给电磁阀导出OFF信号,并将该信号导出到排气电磁阀。
    • 47. 发明授权
    • Semiconductor integrated circuit and a method of testing the same
    • 半导体集成电路及其测试方法
    • US5248936A
    • 1993-09-28
    • US767998
    • 1991-09-30
    • Yoshiro NakataAtsushi FujiwaraAkinori Shibayama
    • Yoshiro NakataAtsushi FujiwaraAkinori Shibayama
    • H01L27/10G01R31/28H01L21/66
    • G01R31/2884
    • A semiconductor integrated circuit has a main circuit (1), a self testing circuit (2) for testing the main circuit (1), a test start signal detection circuit (5) having at least one light sensitive device for detecting a test start signal in the form of light, and a test result output circuit (4) having at least one light emitting device for outputting test results from the self testing circuit (2) in the form of light. A drastic reduction in test time is accomplished by applying the test start signal in a non-contacting manner to the semiconductor integrated circuit so as to activate the self testing circuit. Furthermore, the test result is output to the outside of the semiconductor integrated circuit without having to provide electrical connections, and the simultaneous testing of a greater number of semiconductor integrated circuits as formed on the same wafer can be accomplished.
    • 半导体集成电路具有主电路(1),用于测试主电路(1)的自检电路(2),具有至少一个用于检测测试开始信号的光敏装置的测试开始信号检测电路(5) 以及具有至少一个发光装置的测试结果输出电路(4),用于以光的形式从自检电路(2)输出测试结果。 通过将测试开始信号以非接触的方式施加到半导体集成电路以激活自检电路来实现测试时间的急剧减少。 此外,测试结果输出到半导体集成电路的外部,而不必提供电连接,并且可以实现在同一晶片上形成的更多数量的半导体集成电路的同时测试。