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41. 发明申请

US20150310161A1 METHOD OF DESIGNING CIRCUIT BOARD INSPECTING JIG, CIRCUIT BOARD INSPECTING JIG, AND CIRCUIT BOARD INSPECTING APPARATUS 审中-公开
标题翻译：设计电路板检查方法，电路板检查电路和电路板检查装置
公开(公告)号：US20150310161A1
公开(公告)日：2015-10-29
申请号：US14693134
申请日：2015-04-22
申请人： NIDEC-READ CORPORATION
发明人： Michio KAIDA , Toshihide MATSUKAWA , Makoto FUJINO , Osamu HIKITA
IPC分类号： G06F17/50
CPC分类号： G06F17/5086
摘要： Provided is a method of designing a circuit board inspecting jig having a contact to be brought into conductive contact with a test point on a circuit board to be inspected. The method includes: preparing temporary design data by temporarily designing the circuit board inspecting jig based on design data for the circuit board to be inspected (a first designing process); acquiring an expansion and contraction ratio of the circuit board based on a condition upon manufacturing the circuit board (and an environmental condition upon inspecting the circuit board) (an expansion and contraction ratio acquiring process); and obtaining design data for the circuit board inspecting jig to be actually manufactured by scaling the temporary design data up and down by the expansion and contraction ratio (a second designing process).
摘要翻译：提供一种设计电路板检查夹具的方法，该夹具具有与要检查的电路板上的测试点导电接触的触点。该方法包括：基于要检查的电路板的设计数据临时设计电路板检查夹具（第一设计过程），准备临时设计数据; 根据制造电路板的条件（以及检查电路板的环境条件）（扩张和收缩比率获取过程）获得电路板的膨胀和收缩比; 并通过缩小比例（第二设计过程）来获取实际制造的电路板检查夹具的设计数据。

42. 发明申请

US20150123693A1 INSPECTION JIG 有权
标题翻译：检查大
公开(公告)号：US20150123693A1
公开(公告)日：2015-05-07
申请号：US14530850
申请日：2014-11-03
申请人： NIDEC-READ CORPORATION
发明人： Norihiro OTA , Mitsunobu TOKIMASA , Kosuke HIROBE , Kohei TSUMURA
IPC分类号： G01R1/04 , G01R31/28
CPC分类号： G01R31/2808 , G01R1/07357 , G01R31/2801 , G01R31/2886
摘要： An inspection jig may include a frame, an electrode body provided with electrodes, conductive contactors having a wire shape, a support block having a facing surface opposite to which an inspection circuit board is disposed, guiding one ends of the contactors to the inspection points of the circuit board mounted on the facing surface, guiding other ends to the electrodes, and configured to move relatively to the frame in a moving direction which crosses the facing surface, biasing parts configured to bias the support block in a direction moving away from the electrode body and close to the circuit board, and a regulating plate disposed between the support block and the frame so as to extend in a direction from the support block to the frame, having elasticity, and having regulation of deformation in a first direction which is parallel to the facing surface and which crosses the extending direction.
摘要翻译：检查夹具可以包括框架，设置有电极的电极体，具有导线形状的导电接触器，具有与设置有检查电路板相对的相对表面的支撑块，将接触器的一端引导到所述电路板安装在所述面对表面上，将其他端部引导到所述电极，并且被构造成在与所述相对表面相交的移动方向上相对于所述框架移动，偏置部件被配置为在远离所述电极的方向偏置所述支撑块并且靠近电路板，以及调节板，其设置在支撑块和框架之间，以沿着从支撑块到框架的方向延伸，具有弹性，并且具有在平行的第一方向上的变形调节到达所述面对表面并且穿过所述延伸方向。

43. 发明申请

US20140354316A1 CIRCUIT BOARD INSPECTION METHOD, CIRCUIT BOARD INSPECTION APPARATUS AND CIRCUIT BOARD INSPECTION TOOL 审中-公开
标题翻译：电路板检查方法，电路板检查装置和电路板检查工具
公开(公告)号：US20140354316A1
公开(公告)日：2014-12-04
申请号：US14294187
申请日：2014-06-03
申请人： NIDEC-READ CORPORATION
发明人： Shinji Matsuoka
IPC分类号： G01R31/28
CPC分类号： G01R31/2887 , G01R1/06705 , G01R31/2808 , G01R31/2812
摘要： There is provided a circuit board inspection tool configured to electrically connect a circuit board with a built-in electronic component and a circuit board inspection apparatus configured to inspect a plurality of wiring patterns formed on the circuit board. The circuit board inspection tool includes a plurality of contactors, an electrode body on which the respective contactors abut at the other end and which are electrically connected to the circuit board inspection apparatus, and a holding body having an inspection-side holding unit configured to guide one ends of the contactors to the inspection points and an electrode-side holding unit configured to guide the other ends thereof to the electrode units, wherein an amount of projection of a contactor which abuts on an inspection point of a wiring pattern conductively connected to the electronic component is formed to be greater than that of the other contactors.
摘要翻译：提供了一种电路板检查工具，其被配置为将电路板与内置电子部件电连接，以及电路板检查装置，其被配置为检查形成在电路板上的多个布线图案。电路板检查工具包括多个接触器，电极体，各个接触器在另一端抵接并与电路板检查装置电连接的电极体，以及具有检查侧保持单元的保持体，接触器的一端到检查点，以及电极侧保持单元，其被配置为将其另一端引导到电极单元，其中接触器的突出量抵接在与导电连接的布线图案的检查点上电子部件形成为大于其他接触器的电子部件。

44. 发明申请

US20230127522A1 CLAMP-TYPE AC VOLTAGE PROBE 有权
公开(公告)号：US20230127522A1
公开(公告)日：2023-04-27
申请号：US17910362
申请日：2021-02-22
申请人： NIDEC READ CORPORATION
发明人： Masahiro KAWAGUCHI
IPC分类号： G01R15/16 , G01R1/04 , G01R1/067 , G01R19/00
摘要： A clamp-type AC voltage probe includes: a clamp portion that clamps a cable to be measured; an electrode disposed to be opposed to the cable clamped by the clamp portion; a parallel circuit in which a capacitor and a resistance are connected in parallel, and one end of which is connected to the electrode; a resistance one end of which is connected to the other end of the parallel circuit and the other end of which is connected to a circuit ground; a capacitor one end of which is connected to the other end of the parallel circuit and the other end of which is connected to the circuit ground; and an amplifier an input terminal of which is connected to the one end or the other end of the parallel circuit, and that amplifies and outputs a signal input into the input terminal.

45. 发明授权

US11415599B2 Contact probe and electrical connection jig 有权
公开(公告)号：US11415599B2
公开(公告)日：2022-08-16
申请号：US16466656
申请日：2017-10-04
申请人： NIDEC READ CORPORATION
发明人： Masami Yamamoto , Norihiro Ota , Shigeki Sakai
IPC分类号： G01R1/067 , G01R31/00 , G01R3/00 , G01R31/28
摘要： A contact probe may include a Ni pipe that may include a coiled spring structure, and the Ni pipe 11 may contain 0.5 to 10 wt % of phosphorus (P). The contact probe may have improved durability, by reducing shrinkage, after probing performed in a high temperature environment.

46. 发明申请

US20220155399A1 DETECTION VALUE CORRECTION SYSTEM, COEFFICIENT CALCULATION METHOD, AND DETECTION VALUE CORRECTION METHOD 有权
公开(公告)号：US20220155399A1
公开(公告)日：2022-05-19
申请号：US17438471
申请日：2020-03-05
申请人： NIDEC READ CORPORATION
发明人： Tatsufumi KUSUDA
IPC分类号： G01R35/00 , G01R33/06 , G01T1/20 , G01F25/10
摘要： A detection value correction system is a detection value correction system that corrects detection values of a plurality of sensors that are arranged in a line and detect a physical quantity, and includes a correction processing unit that corrects a detection value of a target sensor, which is a sensor to be corrected, among the sensors based on at least detection values of sensors adjacent to the target sensor.

47. 发明申请

US20220026481A1 CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS 有权
公开(公告)号：US20220026481A1
公开(公告)日：2022-01-27
申请号：US17421739
申请日：2019-12-19
申请人： NIDEC READ CORPORATION
发明人： Norihiro OTA , Michio KAIDA
IPC分类号： G01R31/26 , G01R1/073 , G01R31/68
摘要： A probe includes a tubular body having conductivity and a tubular shape, and a first central conductor having conductivity and a stick shape. The tubular body has a cross section perpendicular to an axial direction, the cross section having a shape that is rectangular or hexagonal, and the first central conductor includes a first insertion portion having a cross section perpendicular to an axial direction of the first central conductor, the cross section having a shape that is same as the shape of the cross section of the tubular body, the first insertion portion being inserted into one end portion side of the tubular body, and a first projecting portion projecting from one end portion of the tubular body.

48. 发明申请

US20210141023A1 BATTERY IMPEDANCE MEASURING DEVICE 有权
公开(公告)号：US20210141023A1
公开(公告)日：2021-05-13
申请号：US17043729
申请日：2019-07-23
申请人： NIDEC-READ CORPORATION
发明人： Keita GUNJI
IPC分类号： G01R31/389 , G01R31/52 , G01R31/392 , H02J7/00
摘要： A battery impedance measuring device includes a connection circuit unit that includes a terminal detachable from a charging terminal for charging a secondary battery, a terminal detachable from a charging terminal for charging the secondary battery, a first capacitor connected to the terminal, and a second capacitor connected to terminal, and a main body unit that includes an AC signal supply unit that supplies an AC signal to the secondary battery via the first and second capacitors, and a measurement unit that detects at least one of a signal obtained from the secondary battery via the terminal and the first capacitor and a signal obtained from the secondary battery via the terminal and the second capacitor and measures impedance of the secondary battery based on the detected signal.

49. 发明申请

US20210132112A1 PROBE, INSPECTION JIG, INSPECTION DEVICE, AND METHOD FOR MANUFACTURING PROBE 有权
公开(公告)号：US20210132112A1
公开(公告)日：2021-05-06
申请号：US17043770
申请日：2019-05-27
申请人： NIDEC-READ CORPORATION
发明人： Hidekazu YAMAZAKI , Yukio KUMAMOTO
IPC分类号： G01R1/067
摘要： A probe has a substantially bar shape, and includes a tip end, a base end, and a body portion that is located between the tip end and the base end and has a thickness in a thickness direction orthogonal to an axial direction of the substantially bar shape thinner than the tip end. The body portion includes a slope surface that is continuous with the tip end and is inclined with respect to the axial direction in a direction in which the thickness becomes gradually thinner with increasing distance from the tip end. A first region having a surface shape that bulges outward is provided in at least a part of the slope surface.

50. 发明申请

US20210063454A1 RESISTANCE MEASURING DEVICE AND RESISTANCE MEASURING JIG 有权
公开(公告)号：US20210063454A1
公开(公告)日：2021-03-04
申请号：US17040555
申请日：2019-03-04
申请人： NIDEC READ CORPORATION
发明人： Tadashi TAKAHASHI
IPC分类号： G01R27/14 , G01R15/00
摘要： A resistance measuring device includes: a first jig; a plurality of first contacts; a second jig; a plurality of second contacts; a resistance measuring unit that supplies a current between a first contact and a second contact, which correspond to each other, detects a voltage between a first contact and a second contact, and calculates a resistance value of an object to be measured based on a relationship between a value of the supplied current and a value of the detected voltage; first wirings connecting the resistance measuring unit and each of the first contacts, for the first contacts, respectively; and second wirings connecting the resistance measuring unit and each of the second contacts while passing from the resistance measuring unit through the first jig, for the second contacts, respectively.

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