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    • 32. 发明申请
    • Ic Carrier, Ic Socket and Method for Testing Ic Device
    • Ic载体,Ic插座和Ic器件测试方法
    • US20080191723A1
    • 2008-08-14
    • US11886139
    • 2005-03-11
    • Eichi OsatoJunichi KasaiKouichi MeguroMasanori Onodera
    • Eichi OsatoJunichi KasaiKouichi MeguroMasanori Onodera
    • G01R31/02H05K7/00
    • G01R1/0483G01R1/0466
    • An IC device (10) held on an IC carrier (24) is a double-sided electrode type BGA IC device (10) provided with bump electrodes (14) on a first surface of a package. The IC device has, on a second surface opposite the first surface, (a) a central protrusion (30), (b) a peripheral portion (32) lower than the protrusion by one step, and (c) upper electrodes (18) formed on the peripheral portion of the IC device. The IC carrier is provided with a frame (36), a cover (40), and a holding means (42). The frame forms a device reception space (38) for receiving the IC device. The cover can cover the upper electrodes while in contact with the periphery of the IC device held on the IC carrier. The holding means can hold the IC device on the IC carrier with the cover covering the upper electrodes of the IC device. The IC device can be set in an IC socket while being mounted on the IC carrier.
    • 保持在IC载体(24)上的IC器件(10)是在封装的第一表面上设置有凸块电极(14)的双面电极型BGA IC器件(10)。 IC器件在与第一表面相对的第二表面上具有(a)中心突起(30),(b)比突起低一级的周边部分(32),(c)上电极(18) 形成在IC器件的周边部分上。 IC载体设有框架(36),盖(40)和保持装置(42)。 该帧形成用于接收IC设备的设备接收空间(38)。 盖可以覆盖上电极,同时与保持在IC载体上的IC器件的周边接触。 保持装置可以将IC器件保持在IC载体上,盖子覆盖IC器件的上部电极。 该IC器件可以安装在IC载体上而设置在IC插座中。