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    • 35. 发明申请
    • Laser irradiation apparatus and laser irradiation method and method for manufacturing semiconductor device
    • 激光照射装置及激光照射方法及半导体装置的制造方法
    • US20070139660A1
    • 2007-06-21
    • US11640394
    • 2006-12-18
    • Koichiro TanakaYoshiaki Yamamoto
    • Koichiro TanakaYoshiaki Yamamoto
    • G01B11/14
    • B23K26/0853B23K26/04B23K26/0738G03F9/7088H01L21/02675H01L21/2026
    • The present invention provides a laser irradiation apparatus and a laser irradiation method which can conduct irradiation of a laser beam accurately by correcting misalignment of an irradiation position of the laser beam from the predetermined position due to temperature change. A laser irradiation apparatus includes a laser oscillator emitting a laser beam; an XY stage provided with an irradiation object; an optical system which shapes the laser beam into a linear beam on a surface of the irradiation object provided on the XY stage; an illumination which emits light to the surface of the irradiation object; and a camera for imaging reflected light of the light on the surface of the irradiation object, in which misalignment of an irradiation position of the linear beam detected from the reflected light imaged by the camera is corrected.
    • 本发明提供一种激光照射装置和激光照射方法,该激光照射装置和激光照射方法能够通过校正由于温度变化导致的来自预定位置的激光束的照射位置的偏移而精确地进行激光束的照射。 激光照射装置包括发射激光束的激光振荡器; 设置有照射物体的XY台阶; 光学系统,其将激光束成形为设置在XY台上的照射物体的表面上的线性光束; 对照射物体的表面发光的照明; 以及用于对照射物体的表面上的光的反射光进行成像的相机,其中从由照相机成像的反射光检测到的线性光束的照射位置的未对准被校正。
    • 38. 发明授权
    • Light exposure apparatus and manufacturing method of semiconductor device using the same
    • 曝光装置及使用其的半导体装置的制造方法
    • US07695985B2
    • 2010-04-13
    • US10582616
    • 2005-12-21
    • Koichiro TanakaYoshiaki Yamamoto
    • Koichiro TanakaYoshiaki Yamamoto
    • H01L21/66
    • H01L21/02675G03F7/70383H01L21/2026H01L21/268H01L27/1266H01L27/1285Y10T29/41
    • When annealing of a semiconductor film is conducted using a plurality of lasers, each of the distances between laser irradiation regions is different. When a lithography step is conducted in accordance with a marker which is formed over a substrate in advance after the step, light-exposure is not correctly conducted to a portion crystallized by laser. By using a laser irradiation region obtained on a laser irradiation step as a marker, light-exposure is conducted by making a light-exposure position of a stepper coincide with a large grain size region in the laser irradiation region. A large grain size region and a poorly crystalline region are detected by utilizing a thing that scattering intensity of light is different between the large grain size region and the poorly crystalline region, thereby determining a light-exposure position.
    • 当使用多个激光器进行半导体膜的退火时,激光照射区域之间的距离各不相同。 当根据在步骤之后预先在衬底上形成的标记进行光刻步骤时,曝光不能正确地传导到通过激光结晶的部分。 通过使用在激光照射步骤中获得的激光照射区域作为标记,通过使激光照射区域中的步进曝光位置与大粒径区域一致来进行曝光。 通过利用在大晶粒尺寸区域和不良结晶区域之间的散射光强度不同的物质来检测大晶粒尺寸区域和不良结晶区域,从而确定曝光位置。