会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 38. 发明申请
    • Test probe and manufacturing method for test probe
    • 测试探针和测试探针的制造方法
    • US20060261826A1
    • 2006-11-23
    • US11415459
    • 2006-05-01
    • Haruki Ito
    • Haruki Ito
    • G01R31/02
    • G01R1/0735
    • A test probe for testing a semiconductor device, includes: a substrate having a first surface and a second surface; an input projection portion formed on the first surface; an output projection portion formed on the first surface; input contacting portions, each of which is in contact with each of the input terminals and is formed on the input projection portion; output contacting portions, each of which is in contact with each of the output terminals and is formed on the output projection portion; input conductive portions formed on the first surface, each of which is electrically connected to each of the input contacting portions; and output conductive portions formed on the first surface, each of which is electrically connected to each of the output contacting portions.
    • 一种用于测试半导体器件的测试探针,包括:具有第一表面和第二表面的衬底; 形成在所述第一表面上的输入突出部; 形成在所述第一表面上的输出突出部; 输入接触部分,每个输入接触部分与每个输入端子接触并形成在输入突出部分上; 输出接触部分,其每个与每个输出端子接触并形成在输出突出部分上; 形成在第一表面上的输入导电部分,每个输入导电部分电连接到每个输入接触部分; 并且输出形成在第一表面上的导电部分,每个导电部分电连接到每个输出接触部分。