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    • 33. 发明申请
    • Reprogrammable nonvolatile memory devices and methods
    • 可重复编程的非易失性存储器件和方法
    • US20070183216A1
    • 2007-08-09
    • US11634058
    • 2006-12-05
    • Jin-Young ChunJae-Yong Jeong
    • Jin-Young ChunJae-Yong Jeong
    • G11C16/04G11C11/34G11C16/06
    • G11C16/12G11C16/26G11C16/3459
    • A nonvolatile memory device includes a command decoder configured to generate a read/write flag signal in response to a read/write command and to generate a reprogram flag signal in response to a reprogram command, and a read/write circuit configured to control reading and writing operations in a memory cell array. The device further includes a read/write controller configured to cause the read/write circuit to perform a reading/writing operation in response to the read/write flag signal provided from the command decoder, and a reprogram controller configured to cause the read/write controller to perform a reprogramming operation in response to the reprogram flag signal. Methods of reprogramming a memory device include determining whether the memory device is in a busy state, delaying a reprogramming operation if the memory device is in a busy state, and executing the reprogramming operation when the memory device has turned to a standby state from the busy state.
    • 非易失性存储器件包括:命令解码器,被配置为响应于读/写命令产生读/写标志信号,并且响应于重编程命令产生再编程标志信号;以及读/写电路,被配置为控制读/ 在存储单元阵列中进行写操作。 该装置还包括读/写控制器,其被配置为使得读/写电路响应于从命令解码器提供的读/写标志信号执行读/写操作;以及重新编程控制器,其被配置为使读/ 控制器响应于重新编程标志信号执行重新编程操作。 重新编程存储器件的方法包括:确定存储器件是否处于忙状态,如果存储器件处于忙状态,则延迟重新编程操作,并且当存储器件已经从忙时转为待机状态时执行重新编程操作 州。
    • 34. 发明授权
    • Method of erasing data in flash memory device
    • 擦除闪存设备中数据的方法
    • US07986565B2
    • 2011-07-26
    • US12458502
    • 2009-07-14
    • Jin-Young ChunJae-Yong Jeong
    • Jin-Young ChunJae-Yong Jeong
    • G11C16/04
    • G11C16/16G11C16/344G11C16/3445
    • A method of erasing data in a flash memory device, including erasing data in at least one flash memory cell using a first erase voltage; detecting whether the at least one flash memory cell has a threshold voltage less than a first voltage; programming the at least one flash memory cell by varying the threshold voltage of the at least one flash memory cell using a second voltage that is greater than the first voltage if the detecting step detects the threshold voltage is less than the first voltage; maintaining the threshold voltage of the at least one flash memory cell if the detecting step detects the threshold voltage is greater than the first voltage; and verifying the at least one flash memory cell using a first verification voltage.
    • 一种擦除闪速存储器件中的数据的方法,包括使用第一擦除电压擦除至少一个闪存单元中的数据; 检测所述至少一个闪存单元是否具有小于第一电压的阈值电压; 如果所述检测步骤检测到所述阈值电压小于所述第一电压,则使用大于所述第一电压的第二电压改变所述至少一个闪存单元的阈值电压来对所述至少一个闪存单元进行编程; 如果所述检测步骤检测到所述阈值电压大于所述第一电压,则保持所述至少一个闪存单元的阈值电压; 以及使用第一验证电压验证所述至少一个闪存单元。
    • 36. 发明授权
    • Reprogrammable nonvolatile memory devices and methods
    • 可重复编程的非易失性存储器件和方法
    • US07821837B2
    • 2010-10-26
    • US12466679
    • 2009-05-15
    • Jin-Young ChunJae-Yong Jeong
    • Jin-Young ChunJae-Yong Jeong
    • G11C11/34
    • G11C16/12G11C16/26G11C16/3459
    • A nonvolatile memory device includes a command decoder configured to generate a read/write flag signal in response to a read/write command and to generate a reprogram flag signal in response to a reprogram command, and a read/write circuit configured to control reading and writing operations in a memory cell array. The device further includes a read/write controller configured to cause the read/write circuit to perform a reading/writing operation in response to the read/write flag signal provided from the command decoder, and a reprogram controller configured to cause the read/write controller to perform a reprogramming operation in response to the reprogram flag signal. Methods of reprogramming a memory device include determining whether the memory device is in a busy state, delaying a reprogramming operation if the memory device is in a busy state, and executing the reprogramming operation when the memory device has turned to a standby state from the busy state.
    • 非易失性存储器件包括:命令解码器,被配置为响应于读/写命令产生读/写标志信号,并且响应于重编程命令产生再编程标志信号;以及读/写电路,被配置为控制读/ 在存储单元阵列中进行写操作。 该装置还包括读/写控制器,其被配置为使得读/写电路响应于从命令解码器提供的读/写标志信号执行读/写操作;以及重新编程控制器,其被配置为使读/ 控制器响应于重新编程标志信号执行重新编程操作。 重新编程存储器件的方法包括:确定存储器件是否处于忙状态,如果存储器件处于忙状态,则延迟重新编程操作,并且当存储器件已经从忙时转为待机状态时执行重新编程操作 州。