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    • 34. 发明申请
    • Magnetic sensor
    • 磁传感器
    • US20050012937A1
    • 2005-01-20
    • US10495127
    • 2003-02-14
    • Yoshinori TokuraMasashi KawasakiHiroyuki YamadaYoshihiro OgawaYoshio Kaneko
    • Yoshinori TokuraMasashi KawasakiHiroyuki YamadaYoshihiro OgawaYoshio Kaneko
    • G01R33/032G11B5/127G11B11/105G01B11/14
    • G11C13/06G01R33/0325G01R33/095G11B5/1278G11B11/10547
    • The present invention provides a magnetic sensor capable of reproducing a magnetic record even if the size of a recorded magnetization is a minute one, directly reading a magnetization recorded on a magneto-optical disk without applying incident light itself to the magneto-optical disk, and obtaining signals of a second harmonic having a high S/N ratio. This magnetic sensor includes a magnetic sensor element (102) having electric polarization disposed with respect to a perpendicular recording medium (101), and laser generating means acting on the magnetic sensor element (102). The magnetic sensor reads information in the perpendicular recording medium (101) based on the variation of the rotation angle φ of the polarization plane of a second harmonic (105) of a frequency 2ω exiting the magnetic sensor element (102) by the application of laser light (104) with a frequency ω from the laser generation means to the magnetic sensor element (102).
    • 本发明提供一种能够再现磁记录的磁传感器,即使记录的磁化的大小是微小的,直接读取记录在磁光盘上的磁化而不将入射光本身插入磁光盘,以及 获得具有高S / N比的二次谐波的信号。 该磁传感器包括相对于垂直记录介质(101)设置的具有电极化的磁传感器元件(102)和作用在磁传感器元件(102)上的激光产生装置。 磁传感器基于通过施加激光器离开磁传感器元件(102)的频率为2omega的二次谐波(105)的偏振面的旋转角度phi的变化,读取垂直记录介质(101)中的信息 具有从激光产生装置到磁传感器元件(102)的频率ω的光(104)。
    • 37. 发明授权
    • Semiconductor device and semiconductor chip
    • 半导体器件和半导体芯片
    • US06329642B1
    • 2001-12-11
    • US09526469
    • 2000-03-15
    • Yoshio KanekoSatoru Suto
    • Yoshio KanekoSatoru Suto
    • H05B102
    • G11C29/50G11C29/028G11C2029/5002
    • A semiconductor device has an oscillator for generating an oscillating signal whose frequency is dependent on temperature, a frequency tester for determining whether or not the frequency of the oscillating signal is normal, a heater for generating heat if the frequency tester determines that the frequency is abnormal, and a first hard macro core that is shifted to a normal operation mode if the frequency tester determines that the frequency is normal. The oscillator, heater, and first hard macro core are put under the same temperature condition. The frequency tester employs a lower limit of an operating temperature range of the first hard macro core as a reference to determine whether or not the frequency of the oscillating signal is normal.
    • 半导体器件具有用于产生频率取决于温度的振荡信号的振荡器,用于确定振荡信号的频率是否正常的频率测试器,如果频率测试器确定频率异常则产生热的加热器 以及如果频率测试器确定频率正常,则转移到正常操作模式的第一硬宏核心。 振荡器,加热器和第一个硬宏核放在相同的温度条件下。 频率测试仪采用第一硬宏核心的工作温度范围的下限作为参考,以确定振荡信号的频率是否正常。