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    • 31. 发明授权
    • Composition of conductive rubber
    • 导电橡胶的组成
    • US08221653B2
    • 2012-07-17
    • US12694582
    • 2010-01-27
    • Takashi AoyamaIwao Watanabe
    • Takashi AoyamaIwao Watanabe
    • H01B1/06H01B7/18
    • H01B1/24
    • A composition of conductive rubber which does not adhere each other in uncross-linked state is provided to exhibit good workability. The composition of conductive rubber including carbon as conductive additive in a base rubber to be cross-linkable by electron beam radiation includes 5 to 40% by weight of an adhesion inhibitor of uncross-linked rubber into a base rubber which is selected from ethylene ethyl acrylic acid copolymer resin (EEA), ethylene vinyl acetate copolymer resin (EVA), ethylene methyl acrylate copolymer resin (EMA), and ethylene acrylic acid copolymer resin (EAA).
    • 提供了在非交联状态下彼此不粘合的导电橡胶的组合物,以表现出良好的可加工性。 包含碳作为导电添加剂的导电橡胶的组成可以通过电子束辐射可交联的基础橡胶中,包括5-40重量%的未交联橡胶的粘合抑制剂,其选自乙烯丙烯酸乙酯 酸性共聚物树脂(EEA),乙烯 - 乙酸乙烯酯共聚物树脂(EVA),乙烯丙烯酸甲酯共​​聚树脂(EMA)和乙烯丙烯酸共聚物树脂(EAA)。
    • 32. 发明授权
    • Element mapping unit, scanning transmission electron microscope, and element mapping method
    • 元素映射单元,扫描透射电子显微镜和元素映射方法
    • US07928376B2
    • 2011-04-19
    • US11232964
    • 2005-09-23
    • Kazutoshi KajiKazuhiro UedaKoji KimotoTakashi AoyamaShunroku TayaShigeto Isakozawa
    • Kazutoshi KajiKazuhiro UedaKoji KimotoTakashi AoyamaShunroku TayaShigeto Isakozawa
    • H01J47/00
    • H01J37/256
    • There is provided an element mapping unit, scanning transmission electron microscope, and element mapping method that enable to acquire an element mapping image very easily. On the scanning transmission electron microscope, the electron beam transmitted through an object to be analyzed enters into the element mapping unit. The electron beam is analyzed of its energy into spectrum by an electron spectrometer and an electron energy loss spectrum is acquired. Because the acceleration voltage data for each element and window data for 2-window method, 3-window method or contrast tuning method are already stored in a database and accordingly the spectrum measurement is carried out immediately even when an element to be analyzed is changed to another, the operator can confirm a two-dimensional element distribution map immediately. Besides, because every electron beam that enters into an energy filter passes through the object point, aberration strain in the electron spectrometer can be minimized and higher energy stability can be achieved. As a result, drift of the electron energy loss spectrum acquired by analyzing the electron beam into spectrum can be minimized and element distribution with higher accuracy can be acquired.
    • 提供了能够非常容易地获取元素映射图像的元素映射单元,扫描透射电子显微镜和元件映射方法。 在扫描透射电子显微镜上,通过待分析物体传输的电子束进入元件映射单元。 电子束通过电子光谱仪将其能量分析成光谱,并获得电子能量损失光谱。 因为用于2窗口方法,3窗口方法或对比度调整方法的每个元素和窗口数据的加速电压数据已经存储在数据库中,因此即使当要分析的元素被改变为 另一方面,操作者可以立即确认二维元素分布图。 此外,由于进入能量过滤器的每个电子束通过物点,所以可以使电子光谱仪中的像差应变最小化并且可以实现更高的能量稳定性。 结果,可以将通过将电子束分析成光谱而获得的电子能量损耗光谱的漂移最小化,并且可以获得具有更高精度的元素分布。
    • 35. 发明申请
    • Image rejection curcuit
    • 影像抑制电路
    • US20070178872A1
    • 2007-08-02
    • US11597960
    • 2005-05-25
    • Takashi AoyamaHiroshi Miyagi
    • Takashi AoyamaHiroshi Miyagi
    • H04B1/26
    • H04B1/28H03D7/14
    • In order to provide an image rejection circuit that can reject an image signal without being affected by manufacturing variations in circuit elements such as resistors, condensers, or the like, an image rejection circuit is provided which comprises a first mixer unit 2 for mixing a signal received by a receiver device with a first local oscillation signal generated by a local oscillator 1, a second mixer unit 3 for mixing the received signal with a second local oscillation signal obtained by shifting the local oscillation signal generated by the local oscillator 1 by 90°, a polyphase filter circuit 4 including condensers C1 and switched capacitors, and a composition/output unit 5 for composing and outputting the IF signals output from the polyphase filter circuit 4.
    • 为了提供可以抑制图像信号的图像抑制电路,而不受诸如电阻器,电容器等的电路元件的制造变化的影响,提供了一种图像抑制电路,其包括用于混合信号的第一混频器单元2 由具有由本地振荡器1产生的第一本地振荡信号的接收机设备接收的第二混频器单元3,用于将接收信号与通过将本地振荡器1产生的本地振荡信号移位90°获得的第二本机振荡信号混合; ,包括电容器C 1和开关电容器的多相滤波器电路4,以及用于组合和输出从多相滤波器电路4输出的IF信号的合成/输出单元5。
    • 37. 发明申请
    • Disk drive
    • 磁盘驱动器
    • US20050060731A1
    • 2005-03-17
    • US10934394
    • 2004-09-07
    • Takashi AoyamaHidekazu SetoKiyoshi OmoriKiyoaki Tsuji
    • Takashi AoyamaHidekazu SetoKiyoshi OmoriKiyoaki Tsuji
    • G11B17/051G11B17/028G11B17/04G11B33/08G11B33/14G11B33/02
    • G11B17/0515G11B17/0284G11B33/08
    • There is provided a disk drive including first and second sliding members (69, 71) made to slide in synchronization with each other, a sliding-member movement driving mechanism (70) to move the first sliding member (69) and have the second sliding member (71) slide in synchronization with the sliding of the first sliding member (69), and a shock absorbing mechanism (83) interposed between the first and second sliding members (69, 71). The shock absorbing mechanism (83) includes a shock absorbing member (84) to absorb a difference in movement between the first and second sliding members (69, 71), caused by an external force to the optical disk brought into or to outside a housing (3) through a disk slot (21) in a direction opposite to the direction in which the optical disk (2) is loaded or ejected when the first sliding member (69) is moved by the sliding-member movement driving mechanism (70)
    • 提供了一种盘驱动器,其包括彼此同步地滑动的第一和第二滑动构件(69,71),滑动构件运动驱动机构(70),用于使第一滑动构件(69)移动并且具有第二滑动 构件(71)与第一滑动构件(69)的滑动同步地滑动,以及设置在第一和第二滑动构件(69,71)之间的减震机构(83)。 减震机构(83)包括减震构件(84),用于吸收第一滑动构件(69)和第二滑动构件(71)之间的移动差异 (3)通过滑动构件移动驱动机构(70)移动第一滑动构件(69)时,与光盘(2)的装载方向相反的方向通过盘槽(21)
    • 39. 发明授权
    • Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
    • 终极分析仪,扫描透射电子显微镜和最终分析方法
    • US06794648B2
    • 2004-09-21
    • US10196577
    • 2002-07-17
    • Kazutoshi KajiTakashi AoyamaShunroku TayaHiroyuki TanakaShigeto Isakozawa
    • Kazutoshi KajiTakashi AoyamaShunroku TayaHiroyuki TanakaShigeto Isakozawa
    • H01J3726
    • G01N23/04G01N23/20H01J37/05H01J37/244H01J37/256H01J37/265H01J37/28H01J2237/057H01J2237/24475H01J2237/24485H01J2237/24495H01J2237/2522H01J2237/2802H01J2237/2804H01J2237/2809
    • An object of the present invention is to provide an ultimate analyzer which can display an element distribution image of an object to be analyzed with high contrast to determine the positions of the element distribution with high accuracy, and a scanning transmission electron microscope and a method of analyzing elements using the ultimate analyzer. The present invention exists in an ultimate analyzer comprising a scattered electron beam detector for detecting an electron beam scattered by an object to be analyzed; an electron spectrometer for energy dispersing an electron beam transmitted through the object to be analyzed; an electron beam detector for detecting said dispersed electron beam; and a control unit for analyzing elements of the object to be analyzed based on an output signal of the electron beam detected by the electron beam detector and an output signal of the electron beam detected by the scattered electron beam detector. Further, the present invention exists in a scanning transmission electron microscope comprising the above ultimate analyzer; an electron beam source; an electron beam scanning coil; a scattered electron beam detector; objective lenses; a focusing lens; a magnifying magnetic field lens; and a focus adjusting electromagnetic lens. Furthermore, the ultimate analyzer or the scanning transmission electron microscope may comprises a control unit which makes it possible that both of an image of element distribution and an STEM image detected and formed by the scatted electron beam detector are observed at a time in real time, and the image of element distribution is corrected by the STEM image detected and formed by the scattered electron beam detector.
    • 本发明的目的是提供一种能够以高对比度显示待分析物体的元素分布图像,以高精度地确定元件分布的位置的最终分析器,以及扫描透射电子显微镜和 使用最终分析仪分析元素。 本发明存在于包含用于检测由待分析物体散射的电子束的散射电子束检测器的终极分析仪中; 用于能量分散通过待分析物体的电子束的电子光谱仪; 用于检测所述分散的电子束的电子束检测器; 以及控制单元,用于基于由电子束检测器检测的电子束的输出信号和由散射电子束检测器检测的电子束的输出信号来分析待分析物体的元件。 此外,本发明存在于包含上述极限分析仪的扫描透射电子显微镜中; 电子束源; 电子束扫描线圈; 散射电子束检测器; 物镜; 聚焦镜头; 放大磁场透镜; 和聚焦调整电磁透镜。 此外,最终分析器或扫描透射电子显微镜可以包括控制单元,其使得可以实时地观察由散射电子束检测器检测和形成的元件分布的图像和STEM图像两者, 并且通过由散射电子束检测器检测和形成的STEM图像校正元件分布的图像。