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    • 35. 发明申请
    • Semiconductor memory device and electric device with the same
    • 半导体存储器件和电器件相同
    • US20060092708A1
    • 2006-05-04
    • US11305193
    • 2005-12-19
    • Koichi KawaiTomoharu TanakaNoboru Shibata
    • Koichi KawaiTomoharu TanakaNoboru Shibata
    • G11C16/06
    • G11C16/3468
    • A semiconductor memory device includes: a plurality of cell array blocks in each of which a plurality of memory cells are arranged; address decode circuits for selecting memory cells in the cell array blocks; sense amplifier circuits for reading cell data of the cell array blocks; and a busy signal generation circuit for generating a busy signal to the chip external, wherein in a first read cycle selecting a first area in a first cell array block, cell data read operations for the first area of the first cell array block and a second area of a second cell array block are simultaneously executed, while the busy signal generation circuit generates a true busy signal, and then a read data output operation is executed for outputting the read out data of the first area held in the sense amplifier circuits to the chip external, and in a second read cycle selecting the second area in the second cell array block, after the busy signal generation circuit has output a dummy busy signal shorter in time length than the true busy signal without executing cell data read operation, a read data output operation is executed for outputting the read out data of the second area held in the sense amplifier circuits to the chip external.
    • 半导体存储器件包括:多个单元阵列块,每个单元阵列块中布置有多个存储单元; 用于选择单元阵列块中的存储单元的地址解码电路; 用于读取单元阵列块的单元数据的读出放大器电路; 以及用于向芯片外部产生忙信号的忙信号产生电路,其中在第一读周期中选择第一单元阵列块中的第一区,对第一单元阵列块的第一区进行单元数据读操作, 同时执行第二单元阵列块的区域,而忙信号产生电路产生真正的忙信号,然后执行读数据输出操作,以将保持在读出放大器电路中的第一区域的读出数据输出到 芯片外部,并且在第二读取周期中选择第二单元阵列块中的第二区域,在忙信号产生电路在不执行单元数据读取操作的情况下输出比真实忙信号更短的时间长度的虚拟忙信号,读取 执行数据输出操作,以将保持在读出放大器电路中的第二区域的读出数据输出到芯片外部。