会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 37. 发明授权
    • Ultra low-loss CMOS compatible silicon waveguides
    • 超低损耗CMOS兼容硅波导
    • US07941023B2
    • 2011-05-10
    • US11890123
    • 2007-08-03
    • Vipulkumar PatelDavid PiedeMargaret GhironPrakash Gothoskar
    • Vipulkumar PatelDavid PiedeMargaret GhironPrakash Gothoskar
    • G02B6/10
    • G02F1/025G02B6/122G02B6/1228G02B2006/12061G02B2006/12097
    • A low loss optical waveguiding structure for silicon-on-insulator (SOI)-based arrangements utilizes a tri-material configuration including a rib/strip waveguide formed of a material with a refractive index less than silicon, but greater than the refractive index of the underlying insulating material. In one arrangement, silicon nitride may be used. The index mismatch between the silicon surface layer (the SOI layer) and the rib/strip waveguide results in a majority of the optical energy remaining within the SOI layer, thus reducing scattering losses from the rib/strip structure (while the rib/strip allows for guiding along a desired signal path to be followed). Further, since silicon nitride is an amorphous material without a grain structure, this will also reduce scattering losses. Advantageously, the use of silicon nitride allows for conventional CMOS fabrication processes to be used in forming both passive and active devices.
    • 用于绝缘体上硅(SOI)的布置的低损耗光波导结构利用三材料构造,其包括由折射率小于硅的材料形成的肋/条波导,但大于 底层绝缘材料。 在一种布置中,可以使用氮化硅。 硅表面层(SOI层)和肋/条形波导之间的折射率失配导致剩余在SOI层内的大部分光学能量,从而减少了肋/条带结构的散射损耗(而肋/条允许 用于沿着要遵循的期望信号路径引导)。 此外,由于氮化硅是不具有晶粒结构的无定形材料,所以这也将减少散射损耗。 有利地,使用氮化硅允许常规CMOS制造工艺用于形成无源器件和有源器件。
    • 38. 发明申请
    • Ultra low-loss CMOS compatible silicon waveguides
    • 超低损耗CMOS兼容硅波导
    • US20070280616A1
    • 2007-12-06
    • US11890123
    • 2007-08-03
    • Vipulkumar PatelDavid PiedeMargaret GhironPrakash Gothoskar
    • Vipulkumar PatelDavid PiedeMargaret GhironPrakash Gothoskar
    • G02B6/10H01L21/62
    • G02F1/025G02B6/122G02B6/1228G02B2006/12061G02B2006/12097
    • A low loss optical waveguiding structure for silicon-on-insulator (SOI)-based arrangements utilizes a tri-material configuration including a rib/strip waveguide formed of a material with a refractive index less than silicon, but greater than the refractive index of the underlying insulating material. In one arrangement, silicon nitride may be used. The index mismatch between the silicon surface layer (the SOI layer) and the rib/strip waveguide results in a majority of the optical energy remaining within the SOI layer, thus reducing scattering losses from the rib/strip structure (while the rib/strip allows for guiding along a desired signal path to be followed). Further, since silicon nitride is an amorphous material without a grain structure, this will also reduce scattering losses. Advantageously, the use of silicon nitride allows for conventional CMOS fabrication processes to be used in forming both passive and active devices.
    • 用于绝缘体上硅(SOI)的布置的低损耗光波导结构利用三材料构造,其包括由折射率小于硅的材料形成的肋/条波导,但大于 底层绝缘材料。 在一种布置中,可以使用氮化硅。 硅表面层(SOI层)和肋/条形波导之间的折射率失配导致剩余在SOI层内的大部分光学能量,从而减少了肋/条带结构的散射损耗(而肋/条允许 用于沿着要遵循的期望信号路径引导)。 此外,由于氮化硅是不具有晶粒结构的无定形材料,所以这也将减少散射损耗。 有利地,使用氮化硅允许常规CMOS制造工艺用于形成无源器件和有源器件。
    • 40. 发明申请
    • Ultra low-loss CMOS compatible silicon waveguides
    • 超低损耗CMOS兼容硅波导
    • US20060133754A1
    • 2006-06-22
    • US11314305
    • 2005-12-21
    • Vipulkumar PatelDavid PiedeMargaret GhironPrakash Gothoskar
    • Vipulkumar PatelDavid PiedeMargaret GhironPrakash Gothoskar
    • G02B6/10
    • G02F1/025G02B6/122G02B6/1228G02B2006/12061G02B2006/12097
    • A low loss optical waveguiding structure for silicon-on-insulator (SOI)-based arrangements utilizes a tri-material configuration including a rib/strip waveguide formed of a material with a refractive index less than silicon, but greater than the refractive index of the underlying insulating material. In one arrangement, silicon nitirde may be used. The index mismatch between the silicon surface layer (the SOI layer) and the rib/strip waveguide results in a majority of the optical energy remaining within the SOI layer, thus reducing scattering losses from the rib/strip structure (while the rib/strip allows for guiding along a desired signal path to be followed). Further, since silicon nitirde is an amorphous material without a grain structure, this will also reduce scattering losses. Advantageously, the use of silicon nitride allows for conventional CMOS fabrication processes to be used in forming both passive and active devices.
    • 用于绝缘体上硅(SOI)的布置的低损耗光波导结构利用三材料构造,其包括由折射率小于硅的材料形成的肋/条波导,但大于 底层绝缘材料。 在一种布置中,可以使用硅氮化硅。 硅表面层(SOI层)和肋/条形波导之间的折射率失配导致剩余在SOI层内的大部分光学能量,从而减少了肋/条带结构的散射损耗(而肋/条允许 用于沿着要遵循的期望信号路径引导)。 此外,由于硅氮化物是不具有晶粒结构的无定形材料,因此也将降低散射损耗。 有利地,使用氮化硅允许常规CMOS制造工艺用于形成无源器件和有源器件。