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    • 37. 发明授权
    • Apparatus for fast internal reference cell trimming
    • 用于快速内部参考细胞修剪的装置
    • US5444656A
    • 1995-08-22
    • US252908
    • 1994-06-02
    • Mark BauerJohnny Javanifard
    • Mark BauerJohnny Javanifard
    • G11C7/14G11C11/56G11C16/28G11C11/40
    • G11C11/5621G11C11/5642G11C16/28G11C7/14G11C2211/5634
    • A memory array having memory devices arranged in rows and columns, each column including a load device across which a first voltage level is provided when a memory device being read is in one condition and a second voltage level is provided when a memory device being read is in a second condition, a reference device arranged in series with another load device, a sensing device for detecting the voltages across the load devices and providing a first output signal when the voltage across the first load device is greater than the voltage across the second voltage device and a second output when the voltage across the first load device is less than the voltage across the second voltage device. The array also includes an arrangement for decoupling the memory devices and the associated load devices and applying a precise voltage equivalent to the one of the voltages across the load device while programming the reference devices so that the voltage across the second load device is compared to this precise voltage when the reference device is being programmed.
    • 一种具有排列成行和列的存储器件的存储器阵列,每列包括负载装置,当正被读取的存储器件处于一个状态时,该负载装置提供第一电压电平,并且当正被读取的存储器件被提供时提供第二电压电平 在第二状态下,与另一负载装置串联布置的参考装置,用于检测跨越负载装置的电压的感测装置,并且当第一负载装置两端的电压大于第二电压两端的电压时,提供第一输出信号 当所述第一负载装置两端的电压小于所述第二电压装置两端的电压时,所述装置和所述第二输出端。 该阵列还包括用于对存储器件和相关联的负载器件进行去耦的装置,并在对参考器件进行编程的同时施加等效于负载器件中的一个电压的精确电压,从而将第二负载器件上的电压与此相比较 参考设备编程时的精确电压。