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    • 33. 发明授权
    • Method for controlling manufacture of a sheet material
    • 控制片材制造的方法
    • US07360348B2
    • 2008-04-22
    • US10725417
    • 2003-12-03
    • Yoshiyuki IshiiHiroyuki Nishida
    • Yoshiyuki IshiiHiroyuki Nishida
    • B65B1/30
    • B65B57/14B65B25/14
    • A sorting and conveying line provided at an X-ray film cutting and collection operation includes a defective sheet gate, a collection gate and a sample gate for sorting X-ray film sheets, which have been cut to a predetermined size at a cutting section, while the X-ray film sheets are conveyed. Film detection sensors are disposed at entrance and exit sides of each of the defective sheet gate, the collection gate and the sample gate, and each film detection sensor detects the X-ray film sheet at times when the X-ray film sheet should be conveyed and sorted. Based on the results of detection, a determination is made as to whether or not there is any failure in control on a number of produced X-ray film sheets, and the like, as well as conveyance and sorting operations. This allows smooth and quick handling in the event of a failure.
    • 在X射线胶片切割收集操作中提供的分拣和传送线包括在切割部分切割成预定尺寸的X射线胶片片的分类不良的纸张门,收集门和样品门, 同时输送X射线胶片。 薄膜检测传感器设置在每个有缺陷的薄板门,采集门和样品门的入口侧和出口侧,并且每个薄膜检测传感器在X射线薄膜片应被传送的时候检测X射线胶片 并排序。 基于检测结果,确定是否对生产的X射线胶片的数量等进行控制以及运送和分拣操作。 这可以在发生故障时平稳而快速地处理。
    • 36. 发明授权
    • Objective lens, combination of objective lenses, and method for adjusting optical system using objective lens
    • 物镜,物镜的组合以及使用物镜调整光学系统的方法
    • US06831792B2
    • 2004-12-14
    • US10389879
    • 2003-03-18
    • Hiroyuki Nishida
    • Hiroyuki Nishida
    • G02B2102
    • G02B27/0025
    • The reference objective lens includes an objective lens and an index member provided with an index that indicates a reference position. The index member is disposed on the front-side focal position of the objective lens or in its vicinity. Upon the reference objective lens thus configured being mounted on an apparatus having an image sensor, an image of the index that indicates a reference position is captured with the image sensor, and a position of the index in the captured image is calculated out and stored. Then, upon a predetermined optical system being mounted on the apparatus having the image sensor in place of the reference objective lens, aberrations of the optical system are measured, and the optical system is adjusted so that aberrations at a position that corresponds to the stored position satisfy a predetermined condition.
    • 参考物镜包括物镜和具有指示参考位置的索引的折射构件。 折射构件设置在物镜的前侧焦点位置或其附近。 当这样配置的参考物镜安装在具有图像传感器的装置上时,用图像传感器捕获指示参考位置的索引的图像,并且计算并存储捕获图像中的索引的位置。 然后,在预定的光学系统安装在具有图像传感器的装置代替参考物镜的情况下,测量光学系统的像差,并且调整光学系统,使得在与存储位置对应的位置处的像差 满足预定条件。
    • 37. 发明授权
    • Microscopic optical system
    • 显微镜系统
    • US06493138B2
    • 2002-12-10
    • US09793891
    • 2001-02-28
    • Hiroyuki Nishida
    • Hiroyuki Nishida
    • G03B1306
    • G02B21/16
    • A microscopic optical system which is used in an ultraviolet range of short wavelengths and has good off-axis performance, such as chromatic aberration of magnification. The optical system has an objective optical system for forming an intermediate image of a specimen and a relay optical system for imaging the intermediate image again. The relay optical system has a first lens group and a second lens group, and at least one convex lens of at lease one of the first and second lens groups is formed from quartz.
    • 一种微波光学系统,其用于短波长的紫外范围并且具有良好的离轴性能,例如倍率色像差。 光学系统具有用于形成样本的中间图像的物镜光学系统和用于再次对中间图像成像的中继光学系统。 中继光学系统具有第一透镜组和第二透镜组,并且至少一个第一和第二透镜组中的一个的凸透镜由石英形成。
    • 38. 发明授权
    • Ultraviolet microscope optical system and optical filter used in the same optical system
    • 紫外显微镜光学系统和光学滤波器用于同一光学系统
    • US06339498B1
    • 2002-01-15
    • US09557649
    • 2000-04-26
    • Hiroyuki NishidaShingo Kashima
    • Hiroyuki NishidaShingo Kashima
    • G02B522
    • G02B21/16
    • An ultraviolet microscope optical system includes a light source emitting light in a region of wavelengths shorter than 300 nm; an illumination optical system; an objective lens system; an imaging optical system; and a photographing device. The ultraviolet microscope optical system further includes a wavelength selective device, which satisfies the following condition: (To·&dgr;)/(Tm·&Dgr;)>2 where To is a transmittance at the center of a selected wavelength region, &dgr; is a half width at full maximum expressed in nanometers, Tm is an average transmittance in the region of wavelengths longer than 300 nm, and &Dgr; is a sensitive wavelength region of the photographing device, expressed in nanometers, in the region of wavelengths longer than 300 nm.
    • 紫外线显微镜光学系统包括发射波长短于300nm的区域的光的光源; 照明光学系统; 物镜系统; 成像光学系统; 和拍摄装置。 紫外线显微镜光学系统还包括波长选择装置,其满足以下条件:其中,To为选定波长区域中心的透射率,delta为以纳米表示的全最大半值宽度,Tm为平均透射率 波长长于300nm的区域,并且DELTA是在长于300nm的波长区域中以纳米表示的拍摄装置的敏感波长区域。
    • 39. 发明授权
    • Automatic focus detection device for microscopes
    • 显微镜自动对焦检测装置
    • US5710662A
    • 1998-01-20
    • US580369
    • 1995-12-28
    • Hiroyuki Nishida
    • Hiroyuki Nishida
    • G02B7/28G02B7/36G02B21/00G02B21/24G01J1/20G01J1/36G02B21/26
    • G02B21/244
    • An automatic focus detection device for microscopes includes an optical system for forming an image of a sample; an image sensor for photoelectrically converting an optical image derived from the optical system; a device for storing image data such that an electric signal obtained from the image sensor is converted from analog to digital form and for processing the image data to compute contrast values; a device for comparing the contrast values; a device for moving an objective lens or a stage for the sample; and a device for storing the position of the objective lens or the stage. In this case, an image contrast at a present position is compared with a contrast at the position where an objective lens or the sample is moved along the optical axis by a predetermined distance, a distance required for movement of the objective lens or the stage is determined from this comparison, and if the distance of movement and a contrast change by the comparison are below constant values, a corresponding position will be decided as the position of the focal plane.
    • 用于显微镜的自动聚焦检测装置包括用于形成样品图像的光学系统; 用于对从光学系统导出的光学图像进行光电转换的图像传感器; 用于存储图像数据的装置,使得从图像传感器获得的电信号从模拟形式转换并用于处理图像数据以计算对比度值; 用于比较对比度值的装置; 用于移动物镜或样品台的装置; 以及用于存储物镜或台的位置的装置。 在这种情况下,将当前位置处的图像对比度与在物镜或样本沿着光轴移动预定距离的位置处的对比度进行比较,物镜或舞台的移动所需的距离为 通过该比较确定,并且如果通过比较的移动距离和对比度变化低于常数值,则将相应的位置确定为焦平面的位置。